Vlsi Test Symposium Vts 2001
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VLSI Test Symposium (Vts 2001)
Author | : IEEE Computer Society |
Publisher | : |
Total Pages | : 500 |
Release | : 2001-05 |
Genre | : |
ISBN | : 9780769511238 |
19th IEEE VLSI Test Symposium
Author | : |
Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages | : 417 |
Release | : 2001 |
Genre | : Application-specific integrated circuits |
ISBN | : 9780769511238 |
IEEE VLSI Test Symposium
Author | : |
Publisher | : |
Total Pages | : 498 |
Release | : 2005 |
Genre | : Application-specific integrated circuits |
ISBN | : |
19th IEEE VLSI Test Symposium
Author | : |
Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages | : 458 |
Release | : 2001 |
Genre | : Computers |
ISBN | : 9780769511221 |
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Proceedings
Author | : VLSI Test Symposium |
Publisher | : I E E E |
Total Pages | : 472 |
Release | : 1998 |
Genre | : Computers |
ISBN | : 9780818684364 |
This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.
International Conference on Intelligent Computing and Applications
Author | : Subhransu Sekhar Dash |
Publisher | : Springer |
Total Pages | : 662 |
Release | : 2017-12-28 |
Genre | : Technology & Engineering |
ISBN | : 9811055203 |
The book is a collection of best papers presented in International Conference on Intelligent Computing and Applications (ICICA 2016) organized by Department of Computer Engineering, D.Y. Patil College of Engineering, Pune, India during 20-22 December 2016. The book presents original work, information, techniques and applications in the field of computational intelligence, power and computing technology. This volume also talks about image language processing, computer vision and pattern recognition, machine learning, data mining and computational life sciences, management of data including Big Data and analytics, distributed and mobile systems including grid and cloud infrastructure.