Theory And Practice Of Scanning Optical Microscopy
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Handbook of Biological Confocal Microscopy
| Author | : James Pawley |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 639 |
| Release | : 2013-04-17 |
| Genre | : Science |
| ISBN | : 1475753489 |
This third edition of a classic text in biological microscopy includes detailed descriptions and in-depth comparisons of parts of the microscope itself, digital aspects of data acquisition and properties of fluorescent dyes, the techniques of 3D specimen preparation and the fundamental limitations, and practical complexities of quantitative confocal fluorescence imaging. Coverage includes practical multiphoton, photodamage and phototoxicity, 3D FRET, 3D microscopy correlated with micro-MNR, CARS, second and third harmonic signals, ion imaging in 3D, scanning RAMAN, plant specimens, practical 3D microscopy and correlated optical tomography.
Advanced Optical Imaging Theory
| Author | : Min Gu |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 236 |
| Release | : 2000 |
| Genre | : Medical |
| ISBN | : 9783540662624 |
Optical microscopy and associated technologies have advanced rapidly along with laser technology. These techniques have stimulated further development of the optical imaging theory, including 3-dimensional microscopy imaging theory, the theory of imaging with ultrashort pulsed beam illumination and the aberration theory for high numerical-aperture objectives. This book introduces these new theories in modern optical microscopy, providing comparisons with classical imaging as appropriate.
A Practical Guide to Optical Microscopy
| Author | : John Girkin |
| Publisher | : CRC Press |
| Total Pages | : 260 |
| Release | : 2019-06-14 |
| Genre | : Science |
| ISBN | : 1351630369 |
Choice Recommended Title, March 2020 Optical microscopy is used in a vast range of applications ranging from materials engineering to in vivo observations and clinical diagnosis, and thanks to the latest advances in technology, there has been a rapid growth in the number of methods available. This book is aimed at providing users with a practical guide to help them select, and then use, the most suitable method for their application. It explores the principles behind the different forms of optical microscopy, without the use of complex maths, to provide an understanding to help the reader utilise a specific method and then interpret the results. Detailed physics is provided in boxed sections, which can be bypassed by the non-specialist. It is an invaluable tool for use within research groups and laboratories in the life and physical sciences, acting as a first source for practical information to guide less experienced users (or those new to a particular methodology) on the range of techniques available. Features: The first book to cover all current optical microscopy methods for practical applications Written to be understood by a non-optical expert with inserts to provide the physical science background Brings together conventional widefield and confocal microscopy, with advanced non-linear and super resolution methods, in one book To learn more about the author please visit here.
Scanning Transmission Electron Microscopy
| Author | : Stephen J. Pennycook |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 764 |
| Release | : 2011-03-24 |
| Genre | : Technology & Engineering |
| ISBN | : 1441972005 |
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Confocal Scanning Optical Microscopy and Related Imaging Systems
| Author | : Gordon S. Kino |
| Publisher | : Academic Press |
| Total Pages | : 353 |
| Release | : 1996-09-18 |
| Genre | : Science |
| ISBN | : 008052978X |
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. - Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers - Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology - Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations - Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications - Discusses the theory and design of near-field optical microscopes - Explains phase imaging in the scanning optical and interference microscopes
Introduction to Optical Microscopy
| Author | : Jerome Mertz |
| Publisher | : Cambridge University Press |
| Total Pages | : 475 |
| Release | : 2019-08 |
| Genre | : Medical |
| ISBN | : 1108428304 |
Presents a fully updated, self-contained textbook covering the core theory and practice of both classical and modern optical microscopy techniques.
Scanning Electron Microscopy and X-Ray Microanalysis
| Author | : Joseph Goldstein |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 679 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 1461332737 |
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
