Surface Characterization Techniques
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| Author | : Rawesh Kumar |
| Publisher | : Walter de Gruyter GmbH & Co KG |
| Total Pages | : 207 |
| Release | : 2022-03-07 |
| Genre | : Technology & Engineering |
| ISBN | : 3110656485 |
This book covers 10 surface characterization techniques divided into three sections. The first section covers the theoretical background, instrumentation and their salient features and a general understanding behind the results. The second section delves into deeper discussion of every terminology and concept. The third section is composed of 5 sets of examples from different research papers for every technique.
| Author | : John O'Connor |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 626 |
| Release | : 2003-04-23 |
| Genre | : Science |
| ISBN | : 9783540413301 |
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
| Author | : Andrew J. Milling |
| Publisher | : CRC Press |
| Total Pages | : 432 |
| Release | : 1999-08-03 |
| Genre | : Science |
| ISBN | : 9780824773366 |
"Outlines the scientific basis and experimental methods for a broad sample of surface analysis techniques, drawing heavily from established principles of physical and analytical chemistry. Sketches a simple low-cost method of tracking particles in three dimensions."
| Author | : Sam Zhang |
| Publisher | : CRC Press |
| Total Pages | : 344 |
| Release | : 2008-12-22 |
| Genre | : Science |
| ISBN | : 1420042955 |
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
| Author | : Yang Leng |
| Publisher | : John Wiley & Sons |
| Total Pages | : 384 |
| Release | : 2009-03-04 |
| Genre | : Technology & Engineering |
| ISBN | : 0470822996 |
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
| Author | : Philip F. Kane |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 675 |
| Release | : 2013-11-27 |
| Genre | : Technology & Engineering |
| ISBN | : 1461344905 |
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
| Author | : Gerhard Huebschen |
| Publisher | : Woodhead Publishing |
| Total Pages | : 322 |
| Release | : 2016-03-23 |
| Genre | : Technology & Engineering |
| ISBN | : 008100057X |
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
| Author | : E.F. Vansant |
| Publisher | : Elsevier |
| Total Pages | : 573 |
| Release | : 1995-04-25 |
| Genre | : Science |
| ISBN | : 0080528953 |
Oxide surface materials are widely used in many applications, in particular where chemically modified oxide surfaces are involved. Indeed, in disciplines such as separation, catalysis, bioengineering, electronics, ceramics, etc., modified oxide surfaces are very important. In all cases, the knowledge of their chemical and surface characteristics is of great importance for the understanding and eventual improvement of their performances. This book reviews the latest techniques and procedures in the characterization and chemical modification of the silica surface, presenting a unified and state-of-the-art approach to the relevant analysis techniques and modification procedures, covering 1000 references integrated into one clear concept.
| Author | : |
| Publisher | : Elsevier |
| Total Pages | : 437 |
| Release | : 2000-10-23 |
| Genre | : Technology & Engineering |
| ISBN | : 0080531385 |
The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth. In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37, Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary nature of the real space and diffraction techniques is fully displayed.Key Features* An accessible description of quantitative characterization of random rough surfaces and growth/etch fronts* A detailed description of the principles, experimentation, and limitations of advanced real-space imaging techniques (such as atomic force microscopy) and diffraction techniques (such as light scattering, X-ray diffraction, and electron diffraction)* Characterization of a variety of rough surfaces (e.g., self-affine, mounded, anisotropic, and two-level surfaces) accompanied by quantitative examples to illustrate the essence of the principles* An insightful description of how rough surfaces are formed* Presentation of the most recent examples of the applications of rough surfaces in various areas
| Author | : Osvaldo de Oliveira Jr |
| Publisher | : William Andrew |
| Total Pages | : 224 |
| Release | : 2017-03-18 |
| Genre | : Technology & Engineering |
| ISBN | : 0323497799 |
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. - Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs - Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used - Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered - Serves as an important, go-to reference for materials scientists and engineers
