Structure Analysis By Electron Diffraction
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| Author | : B. K. Vainshtein |
| Publisher | : Elsevier |
| Total Pages | : 431 |
| Release | : 2013-10-22 |
| Genre | : Science |
| ISBN | : 1483164756 |
Structure Analysis by Electron Diffraction focuses on the theory and practice of studying the atomic structure of crystalline substances through electron diffraction. The publication first offers information on diffraction methods in structure analysis and the geometrical theory of electron diffraction patterns. Discussions focus on the fundamental concepts of the theory of scattering and structure analysis of crystals, structure analysis by electron diffraction, formation of spot electron diffraction patterns, electron diffraction texture patterns, and polycrystalline electron diffraction patterns. The text then ponders on intensities of reflections, including atomic scattering, temperature factor, structure amplitude, experimental measurements of intensity, and review of equations for intensities of reflections in electron diffraction patterns. The manuscript examines the Fourier methods in electron diffraction and experimental electron diffraction structure investigations. Topics include the determination of the structure of the hydrated chlorides of transition metals; structures of carbides and nitrides of certain metals and semi-conducting alloys; electron diffraction investigation of clay minerals; and possibilities inherent in structure analysis by electron diffraction. The book is a helpful source of data for readers interested in structure analysis by electron diffraction.
| Author | : Thomas E. Weirich |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 566 |
| Release | : |
| Genre | : |
| ISBN | : 9781402039188 |
| Author | : Michel A. VanHove |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 617 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 3642827217 |
Surface crystallography plays the same fundamental role in surface science which bulk crystallography has played so successfully in solid-state physics and chemistry. The atomic-scale structure is one of the most important aspects in the understanding of the behavior of surfaces in such widely diverse fields as heterogeneous catalysis, microelectronics, adhesion, lubrication, cor rosion, coatings, and solid-solid and solid-liquid interfaces. Low-Energy Electron Diffraction or LEED has become the prime tech nique used to determine atomic locations at surfaces. On one hand, LEED has yielded the most numerous and complete structural results to date (almost 200 structures), while on the other, LEED has been regarded as the "technique to beat" by a variety of other surface crystallographic methods, such as photoemission, SEXAFS, ion scattering and atomic diffraction. Although these other approaches have had impressive successes, LEED has remained the most productive technique and has shown the most versatility of application: from adsorbed rare gases, to reconstructed surfaces of sem iconductors and metals, to molecules adsorbed on metals. However, these statements should not be viewed as excessively dogmatic since all surface sensitive techniques retain untapped potentials that will undoubtedly be explored and exploited. Moreover, surface science remains a multi-technique endeavor. In particular, LEED never has been and never will be self sufficient. LEED has evolved considerably and, in fact, has reached a watershed.
| Author | : Xiaodong Zou |
| Publisher | : Oxford University Press |
| Total Pages | : 345 |
| Release | : 2011-08-18 |
| Genre | : Science |
| ISBN | : 0199580200 |
In the modern world of ever smaller devices and nanotechnology, electron crystallography emerges as the most important method capable of determining the structure of minute objects down to the size of individual atoms. Crystals of only a few millionths of a millimetre are studied. This is the first textbook explaining how this is done. Great attention is given to symmetry in crystals and how it manifests itself in electron microscopy and electron diffraction, and how this symmetry can be determined and taken advantage of in achieving improved electron microscopy images and solving crystal structures from electron diffraction patterns. Theory and practice are combined; experimental images, diffraction patterns, formulae and numerical data are discussed in parallel, giving the reader a complete understanding of what goes on inside the "black boxes" of computer programs. This up-to-date textbook contains the newest techniques in electron crystallography, including detailed descriptions and explanations of the recent remarkable successes in determining the very complex structures of zeolites and intermetallics. The controversial issue of whether there is phase information present in electron micrsocopy images or not is also resolved once and for all. The extensive appendices include computer labs which have been used at various courses at Stockholm University and international schools in electron crystallography, with applications to the textbook. Students can download image processing programs and follow these lab instructions to get a hands-on experience of electron crystallography.
| Author | : Ayahiko Ichimiya |
| Publisher | : Cambridge University Press |
| Total Pages | : 370 |
| Release | : 2004-12-13 |
| Genre | : Science |
| ISBN | : 9780521453738 |
| Author | : L.A. Feigin |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 339 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 1475766246 |
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
| Author | : Brent Fultz |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 775 |
| Release | : 2012-10-14 |
| Genre | : Science |
| ISBN | : 3642297609 |
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
| Author | : Michiyoshi Tanaka |
| Publisher | : |
| Total Pages | : 292 |
| Release | : 1985 |
| Genre | : Crystallography |
| ISBN | : |
| Author | : Ludwig Reimer |
| Publisher | : Springer |
| Total Pages | : 532 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 3662135531 |
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
| Author | : John Maxwell Cowley |
| Publisher | : Oxford University Press |
| Total Pages | : 442 |
| Release | : 1992 |
| Genre | : Science |
| ISBN | : 9780198557333 |
Volume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.
