Standardized Functional Verification
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Author | : Alan Wiemann |
Publisher | : Springer Science & Business Media |
Total Pages | : 289 |
Release | : 2007-10-23 |
Genre | : Technology & Engineering |
ISBN | : 0387717331 |
The Integrated Circuit (IC) industry has gone without a standardized verification approach for decades. This book defines a uniform, standardizable methodology for verifying the logical behavior of an integrated circuit, whether an I/O controller, a microprocessor, or a complete digital system. This book will help Engineers and managers responsible for IC development to bring a single, standards-based methodology to their R & D efforts, cutting costs and improving results.
Author | : Bruce Wile |
Publisher | : Elsevier |
Total Pages | : 702 |
Release | : 2005-05-26 |
Genre | : Computers |
ISBN | : 0080476643 |
One of the biggest challenges in chip and system design is determining whether the hardware works correctly. That is the job of functional verification engineers and they are the audience for this comprehensive text from three top industry professionals.As designs increase in complexity, so has the value of verification engineers within the hardware design team. In fact, the need for skilled verification engineers has grown dramatically--functional verification now consumes between 40 and 70% of a project's labor, and about half its cost. Currently there are very few books on verification for engineers, and none that cover the subject as comprehensively as this text. A key strength of this book is that it describes the entire verification cycle and details each stage. The organization of the book follows the cycle, demonstrating how functional verification engages all aspects of the overall design effort and how individual cycle stages relate to the larger design process. Throughout the text, the authors leverage their 35 plus years experience in functional verification, providing examples and case studies, and focusing on the skills, methods, and tools needed to complete each verification task. - Comprehensive overview of the complete verification cycle - Combines industry experience with a strong emphasis on functional verification fundamentals - Includes real-world case studies
Author | : Pierre Bourdet |
Publisher | : Springer Science & Business Media |
Total Pages | : 330 |
Release | : 2013-06-29 |
Genre | : Technology & Engineering |
ISBN | : 9401716919 |
This book focuses in particular on Geometrical Product Specification and Verification which is an integrated tolerancing view and metrology proposed for ISO/TC213. Common geometrical bases for a language allowing to describe both functional specification and inspection procedures are provided. An extended view of the uncertainty concept is also given. Geometric Product Specification and Verification: Functionality Integration is an excellent resource to anyone interested in computer aided tolerancing, as well as CAD/CAM/CAQ. It can also be used as a good starting point for advanced research activity and is a good reference for industrial issues. A global view of geometrical product specification, models for tolerance representation, tolerance analysis, tolerance synthesis, tolerance in manufacturing, tolerance management, tolerance inspection, tolerancing standards, industrial applications and CAT systems are also included.
Author | : Xue-Ren Wu |
Publisher | : Springer Nature |
Total Pages | : 665 |
Release | : 2022-07-04 |
Genre | : Science |
ISBN | : 981168961X |
This book provides a systematic and standardized approach based on the authors’ over 30 years of research experience with weight function methods, as well as the relevant literature. Fracture mechanics has become an indispensable tool for the design and safe operation of damage-tolerant structures in many important technical areas. The stress intensity factor—the characterizing parameter of the crack tip field—is the foundation of fracture mechanics analysis. The weight function method is a powerful technique for determining stress intensity factors and crack opening displacements for complex load conditions, with remarkable computational efficiency and high accuracy. The book presents the theoretical background of the weight function methods, together with a wealth of analytical weight functions and stress intensity factors for two- and three-dimensional crack geometries; many of these have been incorporated into national, international standards and industrial codes of practice. The accuracy of the results is rigorously verified, and various sample applications are provided. Accordingly, the book offers an ideal reference source for graduate students, researchers, and engineers whose work involves fracture and fatigue of materials and structures, who need not only stress intensity factors themselves but also efficient and reliable tools for obtaining them.
Author | : Brian Bailey |
Publisher | : Intl. Engineering Consortiu |
Total Pages | : 472 |
Release | : 2005-01-30 |
Genre | : Computers |
ISBN | : 9781931695312 |
Addressing the need for full and accurate functional information during the design process, this guide offers a comprehensive overview of functional verification from the points of view of leading experts at work in the electronic-design industry.
Author | : Khaled Salah Mohamed |
Publisher | : Springer |
Total Pages | : 162 |
Release | : 2015-08-27 |
Genre | : Technology & Engineering |
ISBN | : 3319220357 |
This book describes the life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection. Various trade-offs in the design process are discussed, including those associated with many of the most common memory cores, controller IPs and system-on-chip (SoC) buses. Readers will also benefit from the author’s practical coverage of new verification methodologies. such as bug localization, UVM, and scan-chain. A SoC case study is presented to compare traditional verification with the new verification methodologies. Discusses the entire life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection; Introduce a deep introduction for Verilog for both implementation and verification point of view. Demonstrates how to use IP in applications such as memory controllers and SoC buses. Describes a new verification methodology called bug localization; Presents a novel scan-chain methodology for RTL debugging; Enables readers to employ UVM methodology in straightforward, practical terms.
Author | : Pierre Bricaud |
Publisher | : Springer Science & Business Media |
Total Pages | : 302 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461550378 |
Silicon technology now allows us to build chips consisting of tens of millions of transistors. This technology not only promises new levels of system integration onto a single chip, but also presents significant challenges to the chip designer. As a result, many ASIC developers and silicon vendors are re-examining their design methodologies, searching for ways to make effective use of the huge numbers of gates now available. These designers see current design tools and methodologies as inadequate for developing million-gate ASICs from scratch. There is considerable pressure to keep design team size and design schedules constant even as design complexities grow. Tools are not providing the productivity gains required to keep pace with the increasing gate counts available from deep submicron technology. Design reuse - the use of pre-designed and pre-verified cores - is the most promising opportunity to bridge the gap between available gate-count and designer productivity. Reuse Methodology Manual for System-On-A-Chip Designs, Second Edition outlines an effective methodology for creating reusable designs for use in a System-on-a-Chip (SoC) design methodology. Silicon and tool technologies move so quickly that no single methodology can provide a permanent solution to this highly dynamic problem. Instead, this manual is an attempt to capture and incrementally improve on current best practices in the industry, and to give a coherent, integrated view of the design process. Reuse Methodology Manual for System-On-A-Chip Designs, Second Edition will be updated on a regular basis as a result of changing technology and improved insight into the problems of design reuse and its role in producing high-quality SoC designs.
Author | : Achim Rettberg |
Publisher | : Springer |
Total Pages | : 326 |
Release | : 2009-09-19 |
Genre | : Computers |
ISBN | : 3642042848 |
This book presents the technical program of the International Embedded Systems Symposium (IESS) 2009. Timely topics, techniques and trends in embedded system design are covered by the chapters in this volume, including modelling, simulation, verification, test, scheduling, platforms and processors. Particular emphasis is paid to automotive systems and wireless sensor networks. Sets of actual case studies in the area of embedded system design are also included. Over recent years, embedded systems have gained an enormous amount of proce- ing power and functionality and now enter numerous application areas, due to the fact that many of the formerly external components can now be integrated into a single System-on-Chip. This tendency has resulted in a dramatic reduction in the size and cost of embedded systems. As a unique technology, the design of embedded systems is an essential element of many innovations. Embedded systems meet their performance goals, including real-time constraints, through a combination of special-purpose hardware and software components tailored to the system requirements. Both the development of new features and the reuse of existing intellectual property components are essential to keeping up with ever more demanding customer requirements. Furthermore, design complexities are steadily growing with an increasing number of components that have to cooperate properly. Embedded system designers have to cope with multiple goals and constraints simul- neously, including timing, power, reliability, dependability, maintenance, packaging and, last but not least, price.
Author | : Pierre Bricaud |
Publisher | : Springer Science & Business Media |
Total Pages | : 306 |
Release | : 2007-05-08 |
Genre | : Technology & Engineering |
ISBN | : 0306476401 |
This revised and updated third edition outlines a set of best practices for creating reusable designs for use in an System-on-a-Chip (SoC) design methodology. These practices are based on the authors' experience in developing reusable designs, as well as the experience of design teams in many companies around the world.
Author | : Paul Wilcox |
Publisher | : Springer Science & Business Media |
Total Pages | : 193 |
Release | : 2007-05-08 |
Genre | : Technology & Engineering |
ISBN | : 1402078765 |
Professional Verification is a guide to advanced functional verification in the nanometer era. It presents the best practices in functional verification used today and provides insights on how to solve the problems that verification teams face. Professional Verification is based on the experiences of advanced verification teams throughout the industry, along with work done at Cadence Design Systems. Professional Verification presents a complete and detailed Unified Verification Methodology based on the best practices in use today. It also addresses topics important to those doing advanced functional verification, such as assertions, functional coverage, formal verification, and reactive testbenches.