Size Effects In Thin Films
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| Author | : C.R. Tellier |
| Publisher | : Elsevier |
| Total Pages | : 321 |
| Release | : 2016-04-20 |
| Genre | : Technology & Engineering |
| ISBN | : 1483289761 |
A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
| Author | : Christoph Peters |
| Publisher | : KIT Scientific Publishing |
| Total Pages | : 174 |
| Release | : 2009 |
| Genre | : Technology (General) |
| ISBN | : 3866443366 |
Due to their high energy conversion efficiencies and low emissions, Solid Oxide Fuel Cells (SOFCs) show promise as a replacement for combustion-based electrical generators at all sizes. Further increase of SOFC efficiency can be achieved by microstructural optimization of the oxygen-ion conducting electrolyte and the mixed ionic-electronic conducting cathode. By application of nanoscaled thin films, the exceptionally high efficiency allows the realization of mobile SOFCs.
| Author | : G.P. Zhigal'skii |
| Publisher | : CRC Press |
| Total Pages | : 234 |
| Release | : 2003-07-10 |
| Genre | : Technology & Engineering |
| ISBN | : 9781420024074 |
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
| Author | : Seungbum Hong |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 294 |
| Release | : 2013-11-27 |
| Genre | : Technology & Engineering |
| ISBN | : 1441990445 |
This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.
| Author | : L. B. Freund |
| Publisher | : Cambridge University Press |
| Total Pages | : 772 |
| Release | : 2004-01-08 |
| Genre | : Technology & Engineering |
| ISBN | : 9781139449823 |
Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
| Author | : Devendra Gupta |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 552 |
| Release | : 2013-01-15 |
| Genre | : Science |
| ISBN | : 9780080947082 |
This new game book for understanding atoms at play aims to document diffusion processes and various other properties operative in advanced technological materials. Diffusion in functional organic chemicals, polymers, granular materials, complex oxides, metallic glasses, and quasi-crystals among other advanced materials is a highly interactive and synergic phenomenon. A large variety of atomic arrangements are possible. Each arrangement affects the performance of these advanced, polycrystalline multiphase materials used in photonics, MEMS, electronics, and other applications of current and developing interest. This book is written by pioneers in industry and academia for engineers, chemists, and physicists in industry and academia at the forefront of today's challenges in nanotechnology, surface science, materials science, and semiconductors.
| Author | : Shuichi Miyazaki |
| Publisher | : Cambridge University Press |
| Total Pages | : 487 |
| Release | : 2009-09-03 |
| Genre | : Technology & Engineering |
| ISBN | : 1139481045 |
This book, the first dedicated to this exciting and rapidly growing field, enables readers to understand and prepare high-quality, high-performance TiNi shape memory alloys (SMAs). It covers the properties, preparation and characterization of TiNi SMAs, with particular focus on the latest technologies and applications in MEMS and biological devices. Basic techniques and theory are covered to introduce new-comers to the subject, whilst various sub-topics, such as film deposition, characterization, post treatment, and applying thin films to practical situations, appeal to more informed readers. Each chapter is written by expert authors, providing an overview of each topic and summarizing all the latest developments, making this an ideal reference for practitioners and researchers alike.
| Author | : Shriram Ramanathan |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 344 |
| Release | : 2009-12-03 |
| Genre | : Technology & Engineering |
| ISBN | : 1441906649 |
Thin Film Metal-Oxides provides a representative account of the fundamental structure-property relations in oxide thin films. Functional properties of thin film oxides are discussed in the context of applications in emerging electronics and renewable energy technologies. Readers will find a detailed description of deposition and characterization of metal oxide thin films, theoretical treatment of select properties and their functional performance in solid state devices, from leading researchers. Scientists and engineers involved with oxide semiconductors, electronic materials and alternative energy will find Thin Film Metal-Oxides a useful reference.
| Author | : Q. P. Sun |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 289 |
| Release | : 2006-09-19 |
| Genre | : Technology & Engineering |
| ISBN | : 1402049463 |
This volume is a collection of twenty five written contributions by distinguished invited speakers from seven countries to the IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-scales. Size effects on material and structural behaviors are of great interest to physicists, material scientists, and engineers who need to understand and model the mechanical behavior of solids especially at micron- and nano-scales.
| Author | : Matthew Pelliccione |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 206 |
| Release | : 2008-01-29 |
| Genre | : Technology & Engineering |
| ISBN | : 0387751092 |
The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes.
