Scattering and Image Analysis of Conducting Rough Surfaces
| Author | : Carlton Eric Nance |
| Publisher | : |
| Total Pages | : 416 |
| Release | : 1992 |
| Genre | : Image processing |
| ISBN | : |
Scattering And Image Analysis Of Conducting Rough Surfaces
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Radar Scattering and Imaging of Rough Surfaces
| Author | : Kun-Shan Chen |
| Publisher | : CRC Press |
| Total Pages | : 323 |
| Release | : 2020-11-19 |
| Genre | : Technology & Engineering |
| ISBN | : 1351011561 |
Radar scattering and imaging of rough surfaces is an active interdisciplinary area of research with many practical applications in fields such as mineral and resource exploration, ocean and physical oceanography, military and national defense, planetary exploration, city planning and land use, environmental science, and many more. By focusing on the most advanced analytical and numerical modeling and describing both forward and inverse modeling, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB® connects the scattering process to imaging techniques by vivid examples through numerical and experimental demonstrations and provides computer codes and practical uses. This book is unique in its simultaneous treatment of radar scattering and imaging. Key Features Bridges physical modeling with simulation for resolving radar imaging problems (the first comprehensive work to do so) Provides excellent basic and advanced information for microwave remote-sensing professionals in various fields of science and engineering Covers most advanced analytical and numerical modeling for both backscattering and bistatic scattering Includes MATLAB® codes useful not only for academics but also for radar engineers and scientists to develop tools applicable in different areas of earth studies Covering both the theoretical and the practical, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB® is an invaluable resource for professionals and students using remote sensing to study and explain the Earth and its processes. University and research institutes, electrical and radar engineers, remote-sensing image users, application software developers, students, and academics alike will benefit from this book. The author, Kun-Shan Chen, is an internationally known and respected engineer and scientist and an expert in the field of electromagnetic modeling.
Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry
| Author | : Adrian K. Fung |
| Publisher | : Artech House |
| Total Pages | : 323 |
| Release | : 2015-06-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1630810010 |
This resource explains and demonstrates the backscattering properties of multiscale rough surfaces, and illustrates their application to establish the geophysical model function (GMF) needed in wind scatterometry. This book also explains how the mechanisms of backscattering change with frequency and the incident angle on a multiscale surface and how to recognize single scale versus multiscale surfaces – very useful information for those wanting to use backscattering models more efficiently.
Microwave Scattering and Emission Models for Users
| Author | : Adrian K. Fung |
| Publisher | : Artech House |
| Total Pages | : 445 |
| Release | : 2010 |
| Genre | : Science |
| ISBN | : 1608070379 |
Today, microwave remote sensing has evolved into a valuable and economical tool for a variety of applications. It is used in a wide range of areas, from geological sensing, geographical mapping, and weather monitoring, to GPS positioning, aircraft traffic, and mapping of oil pollution over the sea surface. This unique resource provides microwave remote sensing professionals with practical scattering and emission data models that represent the interaction between electromagnetic waves and a scene on the Earth surface in the microwave region. The book helps engineers understand and apply these models to their specific work in the field. CD-ROM Included! Contains Mathematica code for all the scattering and emission models presented the book, so practitioners can easily use the models for their own applications.
Fundamental Studies in Scattering from Rough Surfaces
| Author | : Gary S. Brown |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 1982 |
| Genre | : Electromagnetic waves |
| ISBN | : |
This report presents interim results of a study to account for multiple scattering in the theoretical modeling of scattering from rough surfaces. Based on the magnetic field integral equation for the current induced on a perfectly conducting rough surface, a k-space integral equation for the stochastic transform of the current is derived and discussed. The mean and variance of the scattered field is shown to be directly obtainable from the stochastic transform of the current. Limiting cases of a gently undulating surface and a surface which is uniformly rough, i.e., a pseudo white noise surface, are considered in detail. An approximate approach is presented for determining the mean or coherent scattered field is produced by a uniformly rough surface and the resulting solution clearly shows the important effects of multiple scattering. For the class of surfaces for which decorrelation does not imply statistical independence, it is found that the incoherent power scattered by such surfaces comprises two parts. The first part is the conventional diffuse term while the second part is specular in that it exists only at the specular scattering angle. For a gently undulating exponentially distributed surface, the incoherent specular power is found to exceed the coherent scattered power when the Rayleigh parameter is larger than unity.
Optical Scattering
| Author | : John C. Stover |
| Publisher | : SPIE-International Society for Optical Engineering |
| Total Pages | : 0 |
| Release | : 2012 |
| Genre | : Light |
| ISBN | : 9780819492517 |
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Scientific and Technical Aerospace Reports
| Author | : |
| Publisher | : |
| Total Pages | : 602 |
| Release | : 1995 |
| Genre | : Aeronautics |
| ISBN | : |
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Light Scattering and Nanoscale Surface Roughness
| Author | : Alexei A. Maradudin |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 513 |
| Release | : 2010-05-10 |
| Genre | : Science |
| ISBN | : 0387356592 |
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Theory of Wave Scattering From Random Rough Surfaces,
| Author | : J. A. Ogilvy |
| Publisher | : CRC Press |
| Total Pages | : 300 |
| Release | : 1991 |
| Genre | : Art |
| ISBN | : |
A review of theories developed for the study of acoustic, elastic and electromagnetic wave scattering from randomly rough surfaces, and a comprehensive summary of the latest techniques. Different theories are illustrated by experimental data.With applications in radar, sonar, ultrasonics and optics this book will be invaluable to graduate students, researchers and engineers.
