Reliable Engineering Computing
| Author | : |
| Publisher | : Research Publishing Service |
| Total Pages | : 64 |
| Release | : |
| Genre | : |
| ISBN | : 9810851189 |
Reliable Engineering Computing
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Reliability Engineering for Electronic Design
| Author | : Norman. B. Fuqua |
| Publisher | : CRC Press |
| Total Pages | : 406 |
| Release | : 2020-11-26 |
| Genre | : Technology & Engineering |
| ISBN | : 1000103358 |
This book addresses the needs of electronic design engineers, reliability engineers, and their respective managers, stressing a pragmatic viewpoint rather than a vigorous mathematical presentation.
Site Reliability Engineering
| Author | : Niall Richard Murphy |
| Publisher | : "O'Reilly Media, Inc." |
| Total Pages | : 552 |
| Release | : 2016-03-23 |
| Genre | : |
| ISBN | : 1491951176 |
The overwhelming majority of a software system’s lifespan is spent in use, not in design or implementation. So, why does conventional wisdom insist that software engineers focus primarily on the design and development of large-scale computing systems? In this collection of essays and articles, key members of Google’s Site Reliability Team explain how and why their commitment to the entire lifecycle has enabled the company to successfully build, deploy, monitor, and maintain some of the largest software systems in the world. You’ll learn the principles and practices that enable Google engineers to make systems more scalable, reliable, and efficient—lessons directly applicable to your organization. This book is divided into four sections: Introduction—Learn what site reliability engineering is and why it differs from conventional IT industry practices Principles—Examine the patterns, behaviors, and areas of concern that influence the work of a site reliability engineer (SRE) Practices—Understand the theory and practice of an SRE’s day-to-day work: building and operating large distributed computing systems Management—Explore Google's best practices for training, communication, and meetings that your organization can use
Database Reliability Engineering
| Author | : Laine Campbell |
| Publisher | : "O'Reilly Media, Inc." |
| Total Pages | : 309 |
| Release | : 2017-10-26 |
| Genre | : Computers |
| ISBN | : 149192621X |
The infrastructure-as-code revolution in IT is also affecting database administration. With this practical book, developers, system administrators, and junior to mid-level DBAs will learn how the modern practice of site reliability engineering applies to the craft of database architecture and operations. Authors Laine Campbell and Charity Majors provide a framework for professionals looking to join the ranks of today’s database reliability engineers (DBRE). You’ll begin by exploring core operational concepts that DBREs need to master. Then you’ll examine a wide range of database persistence options, including how to implement key technologies to provide resilient, scalable, and performant data storage and retrieval. With a firm foundation in database reliability engineering, you’ll be ready to dive into the architecture and operations of any modern database. This book covers: Service-level requirements and risk management Building and evolving an architecture for operational visibility Infrastructure engineering and infrastructure management How to facilitate the release management process Data storage, indexing, and replication Identifying datastore characteristics and best use cases Datastore architectural components and data-driven architectures
Statistical Reliability Engineering
| Author | : Hoang Pham |
| Publisher | : Springer Nature |
| Total Pages | : 497 |
| Release | : 2021-08-13 |
| Genre | : Technology & Engineering |
| ISBN | : 3030769046 |
This book presents the state-of-the-art methodology and detailed analytical models and methods used to assess the reliability of complex systems and related applications in statistical reliability engineering. It is a textbook based mainly on the author’s recent research and publications as well as experience of over 30 years in this field. The book covers a wide range of methods and models in reliability, and their applications, including: statistical methods and model selection for machine learning; models for maintenance and software reliability; statistical reliability estimation of complex systems; and statistical reliability analysis of k out of n systems, standby systems and repairable systems. Offering numerous examples and solved problems within each chapter, this comprehensive text provides an introduction to reliability engineering graduate students, a reference for data scientists and reliability engineers, and a thorough guide for researchers and instructors in the field.
Computing System Reliability: Models and Analysis
| Author | : Min Xie |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 298 |
| Release | : 2004-04-30 |
| Genre | : Computers |
| ISBN | : 030648496X |
Computing systems are of growing importance because of their wide use in many areas including those in safety-critical systems. This book describes the basic models and approaches to the reliability analysis of such systems. An extensive review is provided and models are categorized into different types. Some Markov models are extended to the analysis of some specific computing systems such as combined software and hardware, imperfect debugging processes, failure correlation, multi-state systems, heterogeneous subsystems, etc. One of the aims of the presentation is that based on the sound analysis and simplicity of the approaches, the use of Markov models can be better implemented in the computing system reliability.
International Conference on Reliable Systems Engineering (ICoRSE) - 2021
| Author | : Daniela Doina Cioboată |
| Publisher | : Springer Nature |
| Total Pages | : 364 |
| Release | : 2021-07-27 |
| Genre | : Technology & Engineering |
| ISBN | : 3030833682 |
This current book comprises state-of-the-art research results in the field of mechatronics and reliable systems engineering, gathering papers from almost all continents. Since the chapters represent contributions of research scholars who work in both governmental financed institutions and in the business environment, one could infer that they certainly reflect a clear picture of the developments in these cutting-edge sciences. Moreover, the contributions are not limited to mechatronics, as nowadays it has grown to embed all smart technical sciences. Medical applications based on nano-technologies – seemingly the most promising of all newly developed branches – could not be left out of this work. It is our belief that the book is useful to both students, who want to learn from the best scholars (as most of the authors hold a Ph.D. degree and are well-known professors), and to researchers in all areas of smart engineering, who will definitely find here hot topics meant to inspire them in their line of work.
Reliability and Availability Engineering
| Author | : Kishor S. Trivedi |
| Publisher | : Cambridge University Press |
| Total Pages | : 729 |
| Release | : 2017-08-03 |
| Genre | : Computers |
| ISBN | : 1107099501 |
Learn about the techniques used for evaluating the reliability and availability of engineered systems with this comprehensive guide.
Cloud Reliability Engineering
| Author | : Rathnakar Achary |
| Publisher | : CRC Press |
| Total Pages | : 353 |
| Release | : 2021-04-11 |
| Genre | : Business & Economics |
| ISBN | : 1000352072 |
Coud reliability engineering is a leading issue of cloud services. Cloud service providers guarantee computation, storage and applications through service-level agreements (SLAs) for promised levels of performance and uptime. Cloud Reliability Engineering: Technologies and Tools presents case studies examining cloud services, their challenges, and the reliability mechanisms used by cloud service providers. These case studies provide readers with techniques to harness cloud reliability and availability requirements in their own endeavors. Both conceptual and applied, the book explains reliability theory and the best practices used by cloud service companies to provide high availability. It also examines load balancing, and cloud security. Written by researchers and practitioners, the book’s chapters are a comprehensive study of cloud reliability and availability issues and solutions. Various reliability class distributions and their effects on cloud reliability are discussed. An important aspect of reliability block diagrams is used to categorize poor reliability of cloud infrastructures, where enhancement can be made to lower the failure rate of the system. This technique can be used in design and functional stages to determine poor reliability of a system and provide target improvements. Load balancing for reliability is examined as a migrating process or performed by using virtual machines. The approach employed to identify the lightly loaded destination node to which the processes/virtual machines migrate can be optimized by employing a genetic algorithm. To analyze security risk and reliability, a novel technique for minimizing the number of keys and the security system is presented. The book also provides an overview of testing methods for the cloud, and a case study discusses testing reliability, installability, and security. A comprehensive volume, Cloud Reliability Engineering: Technologies and Tools combines research, theory, and best practices used to engineer reliable cloud availability and performance.
Integrated Circuit Quality and Reliability
| Author | : Eugene R. Hnatek |
| Publisher | : |
| Total Pages | : 736 |
| Release | : 1987 |
| Genre | : Technology & Engineering |
| ISBN | : |
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
