Rapid Thermal And Other Short Time Processing Technologies Iii
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Author | : Dim-Lee Kwong |
Publisher | : The Electrochemical Society |
Total Pages | : 458 |
Release | : 2001 |
Genre | : Technology & Engineering |
ISBN | : 9781566773157 |
"Electronics, Dielectric Science and Technology, and High Temperature Materials Divisions."
Author | : Paul J. Timans |
Publisher | : The Electrochemical Society |
Total Pages | : 500 |
Release | : 2002 |
Genre | : Technology & Engineering |
ISBN | : 9781566773348 |
Author | : Fred Roozeboom |
Publisher | : The Electrochemical Society |
Total Pages | : 482 |
Release | : 2000 |
Genre | : Technology & Engineering |
ISBN | : 9781566772747 |
The proceedings from this May 2000 symposium illustrate the range of applications in Rapid Thermal Processing (RTP). The refereed papers cover a variety of issues, such as ultra-shallow junctions; contacts for nanoscale CMOS; gate stacks; new applications of RTP, such as for the enhanced crystalization of amorphous silicon thin films; and advances on RTP systems and process monitoring, including optimizing and controlling gas flows in an RTCVD reactor. Most presentations are supported by charts and other graphical data. c. Book News Inc.
Author | : Mehmet C. Öztürk |
Publisher | : The Electrochemical Society |
Total Pages | : 444 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : 9781566774062 |
Author | : Bernd Schmidt |
Publisher | : Springer Science & Business Media |
Total Pages | : 425 |
Release | : 2012-12-13 |
Genre | : Technology & Engineering |
ISBN | : 3211993568 |
A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.
Author | : Yoshio Nishi |
Publisher | : CRC Press |
Total Pages | : 3276 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 1351829823 |
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Author | : Electrochemical Society. Meeting |
Publisher | : The Electrochemical Society |
Total Pages | : 620 |
Release | : 2003 |
Genre | : Technology & Engineering |
ISBN | : 9781566773768 |
Author | : Michel Houssa |
Publisher | : CRC Press |
Total Pages | : 500 |
Release | : 2003-12-01 |
Genre | : Science |
ISBN | : 1000687244 |
The drive toward smaller and smaller electronic componentry has huge implications for the materials currently being used. As quantum mechanical effects begin to dominate, conventional materials will be unable to function at scales much smaller than those in current use. For this reason, new materials with higher electrical permittivity will be requ
Author | : Cor L. Claeys |
Publisher | : The Electrochemical Society |
Total Pages | : 636 |
Release | : 2001 |
Genre | : Technology & Engineering |
ISBN | : 9781566773089 |
Author | : B. J. Pawlak |
Publisher | : |
Total Pages | : 240 |
Release | : 2006-10-11 |
Genre | : Science |
ISBN | : |
This volume from the 2006 MRS Spring Meeting focuses on fundamental materials science and device research for current transistor technologies. Materials scientists come together with silicon technologists and TCAD researchers and activation technologies for integrated circuits, to discuss current achievements research directions.