Proceedings The Ieee International Workshop On Defect And Fault Tolerance In Vlsi Systems November 13 15 1995 Lafayette Louisiana
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| Author | : IEEE Computer Society |
| Publisher | : |
| Total Pages | : 326 |
| Release | : 1995 |
| Genre | : Computers |
| ISBN | : 9780818671074 |
An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright by Book News, Inc., Portland, OR.
| Author | : Sandeep Kumar Shukla |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 364 |
| Release | : 2006-02-17 |
| Genre | : Computers |
| ISBN | : 1402080689 |
One of the grand challenges in the nano-scopic computing era is guarantees of robustness. Robust computing system design is confronted with quantum physical, probabilistic, and even biological phenomena, and guaranteeing high reliability is much more difficult than ever before. Scaling devices down to the level of single electron operation will bring forth new challenges due to probabilistic effects and uncertainty in guaranteeing 'zero-one' based computing. Minuscule devices imply billions of devices on a single chip, which may help mitigate the challenge of uncertainty by replication and redundancy. However, such device densities will create a design and validation nightmare with the shear scale. The questions that confront computer engineers regarding the current status of nanocomputing material and the reliability of systems built from such miniscule devices, are difficult to articulate and answer. We have found a lack of resources in the confines of a single volume that at least partially attempts to answer these questions. We believe that this volume contains a large amount of research material as well as new ideas that will be very useful for some one starting research in the arena of nanocomputing, not at the device level, but the problems one would face at system level design and validation when nanoscopic physicality will be present at the device level.
| Author | : |
| Publisher | : |
| Total Pages | : 220 |
| Release | : 2001 |
| Genre | : Computer architecture |
| ISBN | : |
"The SLIP workshop is a forum for the exchange of ideas at the interface between interconnect technology and physical design ... This year, in recognition of the highly diverse backgrounds and motivations of the attendees, SLIP 2001 has been organized around three mini-tutorials: a review of wire distribution models, a look under the hood of a variety of system level interconnect modeling programs, and back end of line yield modeling. These tutorials set the scene for the paper sessions that follow."--Forward.
| Author | : |
| Publisher | : |
| Total Pages | : 346 |
| Release | : 1997 |
| Genre | : Integrated circuits |
| ISBN | : |
| Author | : British Library. Document Supply Centre |
| Publisher | : |
| Total Pages | : 890 |
| Release | : 1998 |
| Genre | : Conference proceedings |
| ISBN | : |
| Author | : Sandeep Kumar Shukla |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 364 |
| Release | : 2004-06-30 |
| Genre | : Computers |
| ISBN | : 1402080670 |
One of the grand challenges in the nano-scopic computing era is guarantees of robustness. Robust computing system design is confronted with quantum physical, probabilistic, and even biological phenomena, and guaranteeing high reliability is much more difficult than ever before. Scaling devices down to the level of single electron operation will bring forth new challenges due to probabilistic effects and uncertainty in guaranteeing 'zero-one' based computing. Minuscule devices imply billions of devices on a single chip, which may help mitigate the challenge of uncertainty by replication and redundancy. However, such device densities will create a design and validation nightmare with the shear scale. The questions that confront computer engineers regarding the current status of nanocomputing material and the reliability of systems built from such miniscule devices, are difficult to articulate and answer. We have found a lack of resources in the confines of a single volume that at least partially attempts to answer these questions. We believe that this volume contains a large amount of research material as well as new ideas that will be very useful for some one starting research in the arena of nanocomputing, not at the device level, but the problems one would face at system level design and validation when nanoscopic physicality will be present at the device level.
| Author | : Mostafa I Abd-el-barr |
| Publisher | : World Scientific |
| Total Pages | : 463 |
| Release | : 2006-12-15 |
| Genre | : Computers |
| ISBN | : 190897978X |
Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a
| Author | : David A. Patterson |
| Publisher | : Morgan Kaufmann |
| Total Pages | : 700 |
| Release | : 2017-05-12 |
| Genre | : Computers |
| ISBN | : 0128122765 |
The new RISC-V Edition of Computer Organization and Design features the RISC-V open source instruction set architecture, the first open source architecture designed to be used in modern computing environments such as cloud computing, mobile devices, and other embedded systems. With the post-PC era now upon us, Computer Organization and Design moves forward to explore this generational change with examples, exercises, and material highlighting the emergence of mobile computing and the Cloud. Updated content featuring tablet computers, Cloud infrastructure, and the x86 (cloud computing) and ARM (mobile computing devices) architectures is included. An online companion Web site provides advanced content for further study, appendices, glossary, references, and recommended reading. - Features RISC-V, the first such architecture designed to be used in modern computing environments, such as cloud computing, mobile devices, and other embedded systems - Includes relevant examples, exercises, and material highlighting the emergence of mobile computing and the cloud
| Author | : Ahmed Amine Jerraya |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 521 |
| Release | : 2003-09-30 |
| Genre | : Computers |
| ISBN | : 1402075286 |
This title covers all software-related aspects of SoC design, from embedded and application-domain specific operating systems to system architecture for future SoC. It will give embedded software designers invaluable insights into the constraints imposed by the use of embedded software in an SoC context.
| Author | : R.S. Williams |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 367 |
| Release | : 2013-03-09 |
| Genre | : Technology & Engineering |
| ISBN | : 9401595763 |
energy production, environmental management, transportation, communication, computation, and education. As the twenty-first century unfolds, nanotechnology's impact on the health, wealth, and security of the world's people is expected to be at least as significant as the combined influences in this century of antibiotics, the integrated circuit, and human-made polymers. Dr. Neal Lane, Advisor to the President for Science and Technology and former National Science Foundation (NSF) director, stated at a Congressional hearing in April 1998, "If I were asked for an area of science and engineering that will most likely produce the breakthroughs of tomorrow, I would point to nanoscale science and engineering. " Recognizing this potential, the White House Office of Science and Technology Policy (OSTP) and the Office of Management and Budget (OMB) have issued a joint memorandum to Federal agency heads that identifies nanotechnology as a research priority area for Federal investment in fiscal year 2001. This report charts "Nanotechnology Research Directions," as developed by the Interagency W orking Group on Nano Science, Engineering, and Technology (IWGN) of the National Science and Technology Council (NSTC). The report incorporates the views of leading experts from government, academia, and the private sector. It reflects the consensus reached at an IWGN-sponsored workshop held on January 27-29, 1999, and detailed in contributions submitted thereafter by members of the V. S. science and engineering community. (See Appendix A for a list of contributors.
