Principles Of Semiconductor Network Testing
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| Author | : Amir Afshar |
| Publisher | : Elsevier |
| Total Pages | : 229 |
| Release | : 1996-04-22 |
| Genre | : Science |
| ISBN | : 0080539564 |
Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. - Introduces a novel component-testing philosophy for semiconductor test, product and design engineers - Best new source of information for experienced semiconductor engineers as well as entry-level personnel - Eight chapters about semiconductor testing
| Author | : M. Bushnell |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 712 |
| Release | : 2004-12-15 |
| Genre | : Technology & Engineering |
| ISBN | : 0792379918 |
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
| Author | : Dave Lohbeck |
| Publisher | : Elsevier |
| Total Pages | : 169 |
| Release | : 1998-09-30 |
| Genre | : Law |
| ISBN | : 008050082X |
This book is essential reading for electronic consumer-product manufacturers doing business in the European marketplace. Compliance with directives and procedures can be a complex and confusing process, resulting in wasted money and effort. With the help of the CE Marking Handbook, engineers and managers can more easily identify which rules apply to them and pinpoint what they need to do to comply. Dave Lohbeck was formerly the Manager for Seminars and Training at TUV Rhineland, the largest German testing and certification agency. He has worked for many years as an engineer, including nine years in the field of European safety and EMC compliance.A once complicated topic is made clear as the author addresses the confusion surrounding CE Marking. Lohbeck offers guidance on both legal and design issues. This book includes a step-by-step design guide aimed at both novice and experienced exporters. With its help, engineers and managers can easily identify which rules apply to their products and pinpoint what they need to do to comply. The information presented here is backed up with facts and examples. Many have been misled, unfortunately, but this book presents the real meaning of CE Marking.Shows design engineers how to comply with CE requirements for product conformityExplains legal and technical issues concisely and logicallyPresents and illuminates US and EU differences
| Author | : Michael Olorunfunmi Kolawole |
| Publisher | : CRC Press |
| Total Pages | : 288 |
| Release | : 2017-07-12 |
| Genre | : Technology & Engineering |
| ISBN | : 1482210118 |
An undeniably rich and thorough guide to satellite communication engineering, Satellite Communication Engineering, Second Edition presents the fundamentals of information communications systems in a simple and succinct way. This book considers both the engineering aspects of satellite systems as well as the practical issues in the broad field of information transmission. Implementing concepts developed on an intuitive, physical basis and utilizing a combination of applications and performance curves, this book starts off with a progressive foundation in satellite technology, and then moves on to more complex concepts with ease. What’s New in the Second Edition: The second edition covers satellite and Earth station design; global positioning systems; antenna tracking; links and communications systems; error detection and correction; data security; regulations and procedures for system modeling; integration; testing; and reliability and performance evaluation. Provides readers with the systems building blocks of satellite transponders and Earth stations, as well as the systems engineering design procedure Includes the tools needed to calculate basic orbit characteristics such as period, dwell time, coverage area, propagation losses; antenna system features such as size, beamwidth, aperture-frequency product, gain, tracking control; and system requirements such as power, availability, reliability, and performance Presents problem sets and starred sections containing basic mathematical development Details recent developments enabling digital information transmission and delivery via satellite Satellite Communication Engineering, Second Edition serves as a textbook for students and a resource for space agencies and relevant industries.
| Author | : Laung-Terng Wang |
| Publisher | : Elsevier |
| Total Pages | : 809 |
| Release | : 2006-08-14 |
| Genre | : Technology & Engineering |
| ISBN | : 0080474799 |
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
| Author | : Anatoly Belous |
| Publisher | : Springer Nature |
| Total Pages | : 961 |
| Release | : 2019-11-13 |
| Genre | : Technology & Engineering |
| ISBN | : 3030254097 |
This book describes for readers the entire, interconnected complex of theoretical and practical aspects of designing and organizing the production of various electronic devices, the general and main distinguishing feature of which is the high speed of processing and transmitting of digital signals. The authors discuss all the main stages of design - from the upper system level of the hierarchy (telecommunications system, 5G mobile communications) to the lower level of basic semiconductor elements, printed circuit boards. Since the developers of these devices in practice deal with distorted digital signals that are transmitted against a background of interference, the authors not only explain the physical nature of such effects, but also offer specific solutions as to how to avoid such parasitic effects, even at the design stage of high-speed devices.
| Author | : |
| Publisher | : |
| Total Pages | : 1128 |
| Release | : 1995 |
| Genre | : Bibliographical literature |
| ISBN | : |
| Author | : Jin, Hai |
| Publisher | : IGI Global |
| Total Pages | : 556 |
| Release | : 2010-02-28 |
| Genre | : Computers |
| ISBN | : 1615207023 |
"This book showcases the work many devoted wireless sensor network researchers all over world, and exhibits the up-to-date developments of WSNs from various perspectives"--Provided by publisher.
| Author | : |
| Publisher | : |
| Total Pages | : 2166 |
| Release | : 1996 |
| Genre | : American literature |
| ISBN | : |
| Author | : Dieter K. Schroder |
| Publisher | : John Wiley & Sons |
| Total Pages | : 800 |
| Release | : 2015-06-29 |
| Genre | : Technology & Engineering |
| ISBN | : 0471739065 |
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
