Optical Microscopy For The Materials Science
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Author | : A Clarke |
Publisher | : Elsevier |
Total Pages | : 455 |
Release | : 2002-10-29 |
Genre | : Science |
ISBN | : 1855737507 |
This comprehensive reference work provides an overview of, and practical guide to, the various computer-aided microscopical techniques used in materials science today. After introducing the reader to the basic concepts of optics, the interactions between light and matter, and image processing, the book goes on to discuss in depth both 2D reflection microscopy and confocal laser scanning microscopy. The application of these techniques to the characterisation of materials is abundantly illustrated by hundreds of photographs and illustrations, and through specific case studies. There is also discussion of other modern optical imaging techniques and of non-optical ones such as x-ray micrography. This reference text is essential both for beginners looking for an introduction to the subject as well as advanced materials researchers in the fields where optical microscopy is used. - Major reference work on the application of microscopy techniques to materials science research - Includes over 420 photographs and illustrations - Provides detailed coverage of the major light microscopical techniques including optical reflection microscopy and confocal laser scanning microscopy as well as novel techniques such raman microscopy, tomography and microtomography
Author | : U Valdre |
Publisher | : Elsevier |
Total Pages | : 785 |
Release | : 2012-12-02 |
Genre | : Science |
ISBN | : 0323142567 |
Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.
Author | : Raymond Haynes |
Publisher | : Springer Science & Business Media |
Total Pages | : 138 |
Release | : 2013-06-29 |
Genre | : Science |
ISBN | : 147576085X |
Since Sorby published his observations on the structures of steels in 1863, the optical microscope has become one of the most widely used and versatile instruments for examining the structures of engineering materials. Moreover, to examine the diverse range of materials encountered, it must be used in both the reflected-light and transmitted-light forms, and with polarized light. It is complementary to, but not superseded by, the wide range of electron-optical instruments that are now used. Despite its extensive use, it has been described as the most misused, abused, and misunderstood of scientific instruments, for it will produce an image of a sort no matter how badly it is used. To use it effectively, even in its simplest applications, a knowledge of the simple theory of the microscope is necessary, for the theory shows and explains how it should be used. Thus my aim has been to give a simple and, where possible, quantitative account of both the theory and the use of the microscope, including the various special techniques for which it can be used. But, no matter how effectively the microscope is used, if the specimen is inadequately prepared the results of examination will be of doubtful value.
Author | : Brian S. Hayes |
Publisher | : ASM International |
Total Pages | : 274 |
Release | : 2010-01-01 |
Genre | : Technology & Engineering |
ISBN | : 161503143X |
Optical microscopy is one of the most valuable--but under utilized--tools for analyzing fiber reinforced polymer matrix composites. This hands-on instructional book covers everything: sample preparation, microscopic techniques, and applications. The power of optical microscopy to study the microstructure of these heterogeneous, anisotropic materials is illustrated with over 180 full color images.
Author | : Jerome Mertz |
Publisher | : Cambridge University Press |
Total Pages | : 475 |
Release | : 2019-08 |
Genre | : Medical |
ISBN | : 1108428304 |
Presents a fully updated, self-contained textbook covering the core theory and practice of both classical and modern optical microscopy techniques.
Author | : Yang Leng |
Publisher | : John Wiley & Sons |
Total Pages | : 384 |
Release | : 2009-03-04 |
Genre | : Technology & Engineering |
ISBN | : 0470822996 |
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author | : A Clarke |
Publisher | : Woodhead Publishing |
Total Pages | : 464 |
Release | : 2002-10-29 |
Genre | : Science |
ISBN | : 9781855735873 |
Annotation CONTENTS Part 1 Basic principles: Interaction of EM radiation with materials; Digital imaging and processing. Part 2 2D Optical reflection and confocal laser scanning microscopy: 2D Optical reflection microscopy; 3D Confocal Laser Scanning. Part 3 Other microscopical techniques: Complementary optical and EM imaging techniques; Other microscopy techniques.
Author | : Douglas B. Murphy |
Publisher | : |
Total Pages | : 538 |
Release | : 2013 |
Genre | : |
ISBN | : |
Author | : Anatoly V. Zayats |
Publisher | : Artech House |
Total Pages | : 379 |
Release | : 2009 |
Genre | : Science |
ISBN | : 1596932848 |
"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.
Author | : Leonard Ernest Samuels |
Publisher | : ASM International |
Total Pages | : 520 |
Release | : |
Genre | : Technology & Engineering |
ISBN | : 9781615032174 |
Containing over 1,200 representative micrographs and the information and explanatory text that makes them really useful, including composition, condition, etchant, magnification, and more than 100 graphs and tables, this 'how to' book not only gives everyday working examples, but also discusses the relationship between the constitution, metallurgy, and microstructure of various carbon steel products. Contents: Nomenclature of Phases and Constituents; Phase Transformations; Low-Carbon Irons and Steels; Annealing and Normalizing; Spheroidization and Graphitization; Austenitization; Transformation of Austenite; Tempering of Martensite; Welding; Surface Oxidation, Decarburation and Oxidation Scaling; Glossary of Terms; EtchingMethods; ConversionTables; Index.