Optical Inspection Of Microsystems
Download Optical Inspection Of Microsystems full books in PDF, epub, and Kindle. Read online free Optical Inspection Of Microsystems ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author | : Wolfgang Osten |
Publisher | : CRC Press |
Total Pages | : 524 |
Release | : 2018-10-03 |
Genre | : Science |
ISBN | : 1420019163 |
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.
Author | : Wolfgang Osten |
Publisher | : CRC Press |
Total Pages | : 570 |
Release | : 2019-06-21 |
Genre | : Technology & Engineering |
ISBN | : 1498779506 |
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
Author | : |
Publisher | : |
Total Pages | : 356 |
Release | : 1996 |
Genre | : Electrooptical devices |
ISBN | : |
Author | : Olivier M. Parriaux |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 422 |
Release | : 1997 |
Genre | : Technology & Engineering |
ISBN | : |
Author | : S. Martellucci |
Publisher | : Springer Science & Business Media |
Total Pages | : 406 |
Release | : 2013-06-29 |
Genre | : Science |
ISBN | : 1489914749 |
Proceedings of the 20th Course of the International School of Quantum Electronics held in Erice, Italy, November 14-24, 1996
Author | : Oliver Geschke |
Publisher | : John Wiley & Sons |
Total Pages | : 270 |
Release | : 2006-08-21 |
Genre | : Science |
ISBN | : 352760636X |
Written by an interdisciplinary team of chemists, biologists and engineers from one of the leading European centers for microsystem research, MIC in Lyngby, Denmark, this book introduces and discusses the different aspects of (bio)chemical microsystem development. Unlike other, far more voluminous and theoretical books on this topic, this is a concise, practical handbook, dealing with analytical applications, particularly in the life sciences. Topics include: * microfluidics * silicon micromachining * glass and polymer micromachining * packaging * analytical chemistry illustrated with examples taken mainly from ongoing research projects at MIC.
Author | : Attilio Frangi |
Publisher | : World Scientific |
Total Pages | : 504 |
Release | : 2008-07-29 |
Genre | : Technology & Engineering |
ISBN | : 1908979127 |
This volume takes a much needed multiphysical approach to the numerical and experimental evaluation of the mechanical properties of MEMS and NEMS. The contributed chapters present many of the most recent developments in fields ranging from microfluids and damping to structural analysis, topology optimization and nanoscale simulations. The book responds to a growing need emerging in academia and industry to merge different areas of expertise towards a unified design and analysis of MEMS and NEMS./a
Author | : Christophe Gorecki |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 200 |
Release | : 1999 |
Genre | : Science |
ISBN | : |
Author | : Natale C. Di |
Publisher | : World Scientific |
Total Pages | : 567 |
Release | : 2009 |
Genre | : Technology |
ISBN | : 9812835989 |
This book collects a number of papers presented at the 13th Italian Conference on Sensors and Microsystems. It provides a unique perspective on the research and development of sensors, microsystems and related technologies in Italy. Besides the scientific value of the papers, this book offers a unique source of data to analysts that intend to survey the Italian situation on sensors and microsystems.
Author | : Christophe Gorecki |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 190 |
Release | : 2001 |
Genre | : Business & Economics |
ISBN | : 9780819440952 |