Optical Characterization Of Epitaxial Semiconductor Layers
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Author | : Günther Bauer |
Publisher | : Springer Science & Business Media |
Total Pages | : 446 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 3642796788 |
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore, the spatial and temporal resolution have been pushed to such limits that real time observation of surface processes during epitaxial growth is possible with techniques like reflectance difference spectroscopy. Of course, optical spectroscopies complement techniques based on the inter action of electrons with matter, but whereas the latter usually require high or ultrahigh vacuum conditions, the former ones can be applied in different environments as well. This advantage could turn out extremely important for a rather technological point of view, i.e. for the surveillance of modern semiconductor processes. Despite the large potential of techniques based on the interaction of electromagnetic waves with surfaces and epilayers, optical techniques are apparently moving only slowly into this area of technology. One reason for this might be that some prejudices still exist regarding their sensitivity.
Author | : Electrochemical Society. High Temperature Materials Division |
Publisher | : The Electrochemical Society |
Total Pages | : 1686 |
Release | : 1997 |
Genre | : Science |
ISBN | : 9781566771788 |
Author | : Thomas B. Elliot |
Publisher | : Nova Publishers |
Total Pages | : 236 |
Release | : 2006 |
Genre | : Science |
ISBN | : 9781594549205 |
Includes within its scope, topics such as: studies of the structural, electrical, optical and acoustical properties of bulk, low-dimensional and amorphous semiconductors; and, interface properties, including the physics and chemistry of heterojunctions, metal-semiconductor and insulator-semiconductor junctions.
Author | : Antonio Cricenti |
Publisher | : World Scientific |
Total Pages | : 191 |
Release | : 2008-01-15 |
Genre | : Science |
ISBN | : 9814471607 |
This special volume contains the proceedings of the 9th Epioptics Workshop, held at the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily, from July 20 to 26, 2006. The workshop was the 9th in the Epioptics series and the 39th of the International School of Solid State Physics.The workshop was aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and at assessing the usefulness of these techniques for optimization of high-quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is dedicated to the theory of non-linear optics and to dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of scanning probe microscopy to material science and biological samples, dried and in vivo, with the use of different laser sources are also presented.
Author | : Antonio Cricenti |
Publisher | : World Scientific |
Total Pages | : 191 |
Release | : 2008 |
Genre | : Science |
ISBN | : 9812794026 |
This special volume contains the proceedings of the 9th Epioptics Workshop, held at the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily, from July 20 to 26, 2006. The workshop was the 9th in the Epioptics series and the 39th of the International School of Solid State Physics.The workshop was aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and at assessing the usefulness of these techniques for optimization of high-quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is dedicated to the theory of non-linear optics and to dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of scanning probe microscopy to material science and biological samples, dried and in vivo, with the use of different laser sources are also presented.
Author | : Viktor Evgen?evich Borisenko |
Publisher | : World Scientific |
Total Pages | : 508 |
Release | : 2001 |
Genre | : Technology & Engineering |
ISBN | : 9812810072 |
The book contains impressive results obtained in the XX-th century and discussion of next challenges of the XXI-st century in understanding of the nanoworld. The main sections of the book are: (1) Physics of Nanostructures, (2) Chemistry of Nanostructures, (3) Nanotechnology, (4) nanostructure Based Devices. Contents: Physics of Nanostructures: Polarons in Quantum Wells (A I Bibik et al.); Screening of Extra Point Charge in a Few Particle Coulomb System (N A Poklonski et al.); Electric Field Effect on Absorption Spectra of an Ensemble of Close-Packed CdSe Nanocrystals (L I Gurinovich et al.); Influence of Surface Phases on Electrical Conductivity of Silicon Surface (D A Tsukanov et al.); Chemistry of Nanostructures: Formation of Ultradisperse Bimetallic Particles by Redox Processes in Aqueous Solutions (Yu A Fedutik et al.); Fast Electrochemical Impedance Spectroscopy for Nanochemistry and Nanophysics (G A Ragoisha & A S Bondarenko); Features of Luminescent Semiconductor Nanowire Array Formation by Electrodeposition into Porous Alumina (S A Gavrilov et al.); Nanotechnology: Massively Parallel Atomic Lines on Silicon Carbide (P Soukiassian); Advancing Magnetic Force Microscopy (I Fedorov et al.); Porous Silicon as a Material for Enhancement of Electron Field Emission (A A Evtukh et al.); Nanostructure Based Devices: A New Multipeak Resonant Tunneling Diode for Signal Processing Application (A N Kholod et al.); Long Term Charge Relaxation in Silicon Single Electron Transistors (A Savin et al.); Resonant Tunneling Through an Array of Quantum Dots Coupled to Superconductors Under the Effect of Magnetic Field (A N Mina); and other papers. Readership: Undergraduates, PhD students and researchers in nanotechnology.
Author | : Victor E Borisenko |
Publisher | : World Scientific |
Total Pages | : 508 |
Release | : 2001-04-02 |
Genre | : Technology & Engineering |
ISBN | : 9814491063 |
The book contains impressive results obtained in the XX-th century and discussion of next challenges of the XXI-st century in understanding of the nanoworld. The main sections of the book are: (1) Physics of Nanostructures, (2) Chemistry of Nanostructures, (3) Nanotechnology, (4) nanostructure Based Devices.
Author | : Maria Losurdo |
Publisher | : Springer Science & Business Media |
Total Pages | : 740 |
Release | : 2013-03-12 |
Genre | : Technology & Engineering |
ISBN | : 3642339565 |
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Author | : Tingkai Li |
Publisher | : CRC Press |
Total Pages | : 588 |
Release | : 2016-04-19 |
Genre | : Science |
ISBN | : 1439815232 |
Silicon-based microelectronics has steadily improved in various performance-to-cost metrics. But after decades of processor scaling, fundamental limitations and considerable new challenges have emerged. The integration of compound semiconductors is the leading candidate to address many of these issues and to continue the relentless pursuit of more
Author | : Dieter Bimberg |
Publisher | : John Wiley & Sons |
Total Pages | : 350 |
Release | : 1999-03-17 |
Genre | : Science |
ISBN | : 9780471973881 |
Da die Nachfrage nach immer schnelleren und kleineren Halbleiterbauelementen stetig wächst, sind Quanten-Dots und -Pyramiden rasant in den Mittelpunkt der Halbleiterforschung gerückt. Dieses Buch vermittelt einen umfassenden Überblick über den aktuellen Forschungsstand auf diesem Gebiet. Behandelt werden u.a. Fragen, wie Strukturen aufgebaut, wie sie charakterisiert werden und wie sie die Leistungsfähigkeit der Bauelemente bestimmen. (11/98)