Nanometer Scale Defect Detection Using Polarized Light
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| Author | : Pierre-Richard Dahoo |
| Publisher | : John Wiley & Sons |
| Total Pages | : 316 |
| Release | : 2016-08-22 |
| Genre | : Technology & Engineering |
| ISBN | : 1848219369 |
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
| Author | : Pierre-Richard Dahoo |
| Publisher | : John Wiley & Sons |
| Total Pages | : 321 |
| Release | : 2016-08-16 |
| Genre | : Technology & Engineering |
| ISBN | : 1119329655 |
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
| Author | : Pierre-Richard Dahoo |
| Publisher | : John Wiley & Sons |
| Total Pages | : 288 |
| Release | : 2021-03-05 |
| Genre | : Science |
| ISBN | : 1119818966 |
Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power. This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and MasterÂs students.
| Author | : Pierre-Richard Dahoo |
| Publisher | : John Wiley & Sons |
| Total Pages | : 256 |
| Release | : 2021-03-16 |
| Genre | : Technology & Engineering |
| ISBN | : 1786306409 |
To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Masters students.
| Author | : |
| Publisher | : |
| Total Pages | : 426 |
| Release | : 2004 |
| Genre | : Contamination control |
| ISBN | : |
| Author | : Eric Brian McDaniel |
| Publisher | : |
| Total Pages | : 336 |
| Release | : 1997 |
| Genre | : |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 290 |
| Release | : 2005 |
| Genre | : Detectors |
| ISBN | : |
| Author | : Yongsheng Gao |
| Publisher | : Trans Tech Publications Ltd |
| Total Pages | : 800 |
| Release | : 2005-10-15 |
| Genre | : Technology & Engineering |
| ISBN | : 3038130222 |
The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, Measurement Technology and Intelligent Instruments, this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US.
| Author | : |
| Publisher | : |
| Total Pages | : 6 |
| Release | : 1991 |
| Genre | : |
| ISBN | : |
We have constructed a scanning near-field optical microscope. For this we developed subwavelength micropipette light sources containing photostable crystal tips. We have also developed a technique for pulling and metal coating for single mode optical fibers to give nanometer silica tips emitting polarized laser light. Clear images have been obtained of polymeric porous membranes with nanometer pore sizes of comparable quality to that of scanning electron microscopy, but without the need for a vacuum. This method is aimed at both transmission and fluorescence nanoscopy. We believe that at least one of these will be operational in the coming year. We have also made significant progress on the next stage: Scanning, Tunneling, Exciton Microscopy. This is based on direct energy transfer between the tip and the particular molecule or fluorophore in the sample. We expect this stage to be operational in the third year of the project. Preliminary near-field optical scans indicate our resolution is already in the nanometer range. 3 figs. (MHB).
| Author | : R. Rosei |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 138 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 9401157243 |
An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis. The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.
