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| Author | : H. Brumberger |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 470 |
| Release | : 2013-11-11 |
| Genre | : Technology & Engineering |
| ISBN | : 9401584575 |
Proceedings of the NATO Advanced Study Institute, Como, Italy, May 12--22, 1993
| Author | : Redouane Borsali |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1490 |
| Release | : 2008-07-28 |
| Genre | : Science |
| ISBN | : 140204464X |
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
| Author | : D.S. Sivia |
| Publisher | : Oxford University Press, USA |
| Total Pages | : 215 |
| Release | : 2011-01-06 |
| Genre | : Science |
| ISBN | : 0199228671 |
This book provides the basic theoretical background for X-ray and neutron scattering experiments. Since these techniques are increasingly being used by biologists and chemists, as well as physicists, the book is intended to be accessible to a broad spectrum of scientists.
| Author | : Oliver H. Seeck |
| Publisher | : CRC Press |
| Total Pages | : 438 |
| Release | : 2015-02-10 |
| Genre | : Science |
| ISBN | : 9814303607 |
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
| Author | : Norbert Stribeck |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 251 |
| Release | : 2007-05-16 |
| Genre | : Technology & Engineering |
| ISBN | : 3540698566 |
This manual is a useful ready-reference guide to the analytical power of modern X-ray scattering in the field of soft matter. The author describes simple tools that can elucidate the mechanisms of structure evolution in the studied materials, and follows this up with a step-by-step guide to more advanced methods. Data analysis based on clear, unequivocal results is rendered simple and straightforward – with a stress on careful planning of experiments and adequate recording of all required data.
| Author | : Henryk Morawiec |
| Publisher | : World Scientific |
| Total Pages | : 415 |
| Release | : 2001-05-30 |
| Genre | : Technology & Engineering |
| ISBN | : 9814491098 |
This proceedings volume contains research data from structural investigation of materials of high industrial value.
| Author | : Henryk Morawiec |
| Publisher | : World Scientific |
| Total Pages | : 415 |
| Release | : 2001 |
| Genre | : Science |
| ISBN | : 9810246137 |
This proceedings volume contains research data from structural investigation of materials of high industrial value.
| Author | : Ashok Kumar Singh |
| Publisher | : IOS Press |
| Total Pages | : 604 |
| Release | : 2005 |
| Genre | : Medical |
| ISBN | : 9781586035372 |
Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
| Author | : Henryk Morawiec |
| Publisher | : World Scientific |
| Total Pages | : 502 |
| Release | : 1995-05-11 |
| Genre | : |
| ISBN | : 9814549649 |
This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.
