Modelling of Interface Carrier Transport for Device Simulation

Modelling of Interface Carrier Transport for Device Simulation
Author: Dietmar Schroeder
Publisher: Springer Science & Business Media
Total Pages: 234
Release: 2013-03-09
Genre: Technology & Engineering
ISBN: 3709166446

This book contains a comprehensive review of the physics, modelling and simulation of electron transport at interfaces in semiconductor devices. It combines a review of existing interface charge transport models with original developments, and introduces a unified representation of charge transport at semiconductor interfaces.

Advanced Device Modeling and Simulation

Advanced Device Modeling and Simulation
Author: Tibor Grasser
Publisher: World Scientific
Total Pages: 220
Release: 2003
Genre: Technology & Engineering
ISBN: 9789812386076

Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as far as possible results in extremely small devices which can no longer be described using simple analytical models. This book covers various aspects of advanced device modeling and simulation. As such it presents extensive reviews and original research by outstanding scientists. The bulk of the book is concerned with the theory of classical and quantum-mechanical transport modeling, based on macroscopic, spherical harmonics and Monte Carlo methods.

Introduction to Semiconductor Device Modelling

Introduction to Semiconductor Device Modelling
Author: Christopher M. Snowden
Publisher: World Scientific
Total Pages: 242
Release: 1998
Genre: Science
ISBN: 9789810236939

This book deals mainly with physical device models which are developed from the carrier transport physics and device geometry considerations. The text concentrates on silicon and gallium arsenide devices and includes models of silicon bipolar junction transistors, junction field effect transistors (JFETs), MESFETs, silicon and GaAs MESFETs, transferred electron devices, pn junction diodes and Schottky varactor diodes. The modelling techniques of more recent devices such as the heterojunction bipolar transistors (HBT) and the high electron mobility transistors are discussed. This book contains details of models for both equilibrium and non-equilibrium transport conditions. The modelling Technique of Small-scale devices is discussed and techniques applicable to submicron-dimensioned devices are included. A section on modern quantum transport analysis techniques is included. Details of essential numerical schemes are given and a variety of device models are used to illustrate the application of these techniques in various fields.

Hierarchical Device Simulation

Hierarchical Device Simulation
Author: Christoph Jungemann
Publisher: Springer Science & Business Media
Total Pages: 278
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 3709160863

This monograph is the first on physics-based simulations of novel strained Si and SiGe devices. It provides an in-depth description of the full-band monte-carlo method for SiGe and discusses the common theoretical background of the drift-diffusion, hydrodynamic and Monte-Carlo models and their synergy.

Analysis and Simulation of Heterostructure Devices

Analysis and Simulation of Heterostructure Devices
Author: Vassil Palankovski
Publisher: Springer Science & Business Media
Total Pages: 309
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 3709105609

The topic of this monograph is the physical modeling of heterostructure devices. A detailed discussion of physical models and parameters for compound semiconductors is presented including the relevant aspects of modern submicron heterostructure devices. More than 25 simulation examples for different types of Si(Ge)-based, GaAs-based, InP-based, and GaN-based heterostructure bipolar transistors (HBTs) and high electron mobility transistors (HEMTs) are given in comparison with experimental data from state-of-the-art devices.

Simulation of Semiconductor Processes and Devices 2004

Simulation of Semiconductor Processes and Devices 2004
Author: Gerhard Wachutka
Publisher: Springer Science & Business Media
Total Pages: 387
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 3709106249

This volume contains the proceedings of the 10th edition of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2004), held in Munich, Germany, on September 2-4, 2004. The conference program included 7 invited plenary lectures and 82 contributed papers for oral or poster presentation, which were carefully selected out of a total of 151 abstracts submitted from 14 countries around the world. Like the previous meetings, SISPAD 2004 provided a world-wide forum for the presentation and discussion of recent advances and developments in the theoretical description, physical modeling and numerical simulation and analysis of semiconductor fabrication processes, device operation and system performance. The variety of topics covered by the conference contributions reflects the physical effects and technological problems encountered in consequence of the progressively shrinking device dimensions and the ever-growing complexity in device technology.

Modeling, Simulation, and Optimization of Integrated Circuits

Modeling, Simulation, and Optimization of Integrated Circuits
Author: K. Antreich
Publisher: Birkhäuser
Total Pages: 356
Release: 2012-12-06
Genre: Mathematics
ISBN: 3034880650

The third Conference on Mathematical Models and Numerical Simulation in Electronic Industry brought together researchers in mathematics, electrical engineering and scientists working in industry. The contributions to this volume try to bridge the gap between basic and applied mathematics, research in electrical engineering and the needs of industry.

Handbook of Optoelectronic Device Modeling and Simulation

Handbook of Optoelectronic Device Modeling and Simulation
Author: Joachim Piprek
Publisher: CRC Press
Total Pages: 835
Release: 2017-10-10
Genre: Science
ISBN: 149874947X

• Provides a comprehensive survey of fundamental concepts and methods for optoelectronic device modeling and simulation. • Gives a broad overview of concepts with concise explanations illustrated by real results. • Compares different levels of modeling, from simple analytical models to complex numerical models. • Discusses practical methods of model validation. • Includes an overview of numerical techniques.

Introduction to Functional Nanomaterials

Introduction to Functional Nanomaterials
Author: M. Anusuya
Publisher: CRC Press
Total Pages: 427
Release: 2024-11-27
Genre: Science
ISBN: 104012108X

This book provides a comprehensive review of nanomaterials, including essential foundational examples of nanosensors, smart nanomaterials, nanopolymers, and nanotubes. Chapters cover their synthesis and characteristics, production methods, and applications, with specific sections exploring nanoelectronics and electro-optic nanotechnology, nanostructures, and nanodevices. This book is a valuable resource for interdisciplinary researchers who want to learn more about the synthesis of nanomaterials and how they are used in different types of energy storage devices, including supercapacitors, batteries, fuel cells solar cells in addition to electrical, chemical, and biomedical engineering. Key Features: Comprehensive overview of how nanomaterials can be utilised in a variety of interdisciplinary applications Explores the fundamental theories, alongside their electrochemical mechanisms and computation Discusses recent developments in electrode designing based on nanomaterials, separators, and the fabrication of advanced devices and their performances

Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11

Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11
Author: Electrochemical society. Meeting
Publisher: The Electrochemical Society
Total Pages: 950
Release: 2011
Genre: Science
ISBN: 1566778654

This issue of ECS Transactions contains the peer-reviewed full length papers of the International Symposium on Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics held May 1-6, 2011 in Montreal as a part of the 219th Meeting of The Electrochemical Society. The papers address a very diverse range of topics. In addition to the deposition and characterization of the dielectrics, more specific topics addressed by the papers include applications, device characterization and reliability, interface states, interface traps, defects, transistor and gate oxide studies, and modeling.