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| Author | : British Standards Institute Staff |
| Publisher | : |
| Total Pages | : 32 |
| Release | : 2006-05 |
| Genre | : |
| ISBN | : 9780580483394 |
Chemical analysis and testing, Microanalysis, Quantitative analysis, Spectroscopy, Electron beams, Electron microscopes, Instrumental methods of analysis, X-rays
| Author | : British Standards Institute Staff |
| Publisher | : |
| Total Pages | : 34 |
| Release | : 1911-10-31 |
| Genre | : |
| ISBN | : 9780580739156 |
Chemical analysis and testing, Microanalysis, Quantitative analysis, Spectroscopy, Electron beams, Electron microscopes, Instrumental methods of analysis, X-rays
| Author | : Abraham Boekestein |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 271 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 3709166799 |
This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of research in Europe were duly represented, but a definite trend is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the method with by far the widest range of applications, followed by TEM with EELS and then AES. There are also interesting suggestions for the further development of new appa ratus with new fields of application. Applications are heavily biased towards materials science (thin films in microelectronics and semicon ductors), ceramics and metallurgy, followed by analysis of biological and mineral samples.
| Author | : Joseph Goldstein |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 375 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 1461518253 |
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.
| Author | : Glyn Love |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 376 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 3709175062 |
This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.
| Author | : K.F.J. Heinrich |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 412 |
| Release | : 1991-06-30 |
| Genre | : Science |
| ISBN | : 0306438240 |
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
| Author | : American Society for Testing and Materials |
| Publisher | : |
| Total Pages | : 9 |
| Release | : 2013 |
| Genre | : |
| ISBN | : |
| Author | : D Williams |
| Publisher | : CRC Press |
| Total Pages | : 546 |
| Release | : 2000-01-01 |
| Genre | : Science |
| ISBN | : 9780750306850 |
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
| Author | : Claude Lechene |
| Publisher | : Elsevier |
| Total Pages | : 695 |
| Release | : 2012-12-02 |
| Genre | : Nature |
| ISBN | : 0323143342 |
Microbeam Analysis in Biology contains the proceedings of a workshop on Biological X-Ray Microanalysis by Electron Beam Excitation, held in Boston, Massachusetts on August 25-26, 1977. This book focuses on the principles, techniques, and biological use of electron probe microanalysis, energy-loss spectroscopy, and ion probe microanalysis. This text reflects the emphasis of the workshop on presenting the principles of analysis, the optimization of operating conditions, the description of successful techniques for sample preparation and quantitation, the illustration of problems and pitfalls, and the direction of microbeam analysis in biology.
| Author | : S. J. B. Reed |
| Publisher | : Cambridge University Press |
| Total Pages | : 232 |
| Release | : 2005-08-25 |
| Genre | : Science |
| ISBN | : 113944638X |
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
