Materials And Processes Of Electron Devices
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Author | : Max Knoll |
Publisher | : Springer Science & Business Media |
Total Pages | : 504 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 3642459366 |
This bookis intended to be of assistance to the physicist or engineer concerned with designing and building electron devices such as high-vacuum transmitter- or amplifier tubes, gas- or vapor-filled rectifiers, thyratrons, X-ray or luminescent tubes, glow or incandescent lamps, Geiger- or ionization counters, vacuum photo cells, photoconductive cells, selenium-, germanium- or silicon rectifiers or trans istors. For this purpose, extensive information is required concerning the compo sition, behavior and handling of materials as well as a thorough knowledge of high-vacuum technique necessary for processing electron devices after their assembly. The text covers the preparation and working of materials used in these devices; the finishing methods for vacuum tubes (especially degassing, pumping and getter procedures); and different production steps of solid state devices. This book contains about 2300 references indicated in the text by the author's name and reference number. At the end of each chapter the references themselves are listed alphabetically by the author's name and with the title sometimes abbreviated. In accordance with the purpose of the book, "first" publications are quoted only when they contain up-to-date-knowledge of the subject in question. Patents are treated as references. The quotation of a patent gives only a hint of the technical details described there. Mentioning, or not mentioning, a patent does not imply a statement concerning its importance or validity or warning against imitation. Expired patents are named in addition to ones still valid.
Author | : National Research Council (U.S.). Ad Hoc Committee on Materials and Processes for Electron Devices |
Publisher | : |
Total Pages | : 260 |
Release | : 1972 |
Genre | : Technology & Engineering |
ISBN | : |
Author | : |
Publisher | : ASTM International |
Total Pages | : 283 |
Release | : 1961 |
Genre | : |
ISBN | : |
Author | : Milton Ohring |
Publisher | : Academic Press |
Total Pages | : 759 |
Release | : 2014-10-14 |
Genre | : Technology & Engineering |
ISBN | : 0080575528 |
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author | : W. Murray Bullis |
Publisher | : |
Total Pages | : 60 |
Release | : 1973 |
Genre | : Semiconductors |
ISBN | : |
Author | : United States. National Bureau of Standards |
Publisher | : |
Total Pages | : 58 |
Release | : 1973 |
Genre | : Semiconductors |
ISBN | : |
Author | : Osamu Ueda |
Publisher | : Springer Science & Business Media |
Total Pages | : 618 |
Release | : 2012-09-22 |
Genre | : Science |
ISBN | : 1461443377 |
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Author | : Federico Capasso |
Publisher | : Springer Science & Business Media |
Total Pages | : 416 |
Release | : 2013-03-07 |
Genre | : Technology & Engineering |
ISBN | : 3642747515 |
The ability to engineer the bandstructure and the wavefunction over length scales previously inaccessible to technology using artificially structured materials and nanolithography has led to a new class of electron semiconductor devices whose operation is controlled by quantum effects. These structures not only represent exciting tools for investigating new quantum phenomena in semiconductors, but also offer exciting opportunities for applications. This book gives the first comprehensive treatment of the physics of quantum electron devices. This interdisciplinary field, at the junction between material science, physics and technology, has witnessed an explosive growth in recent years. This volume presents a detailed coverage of the physics of the underlying phenomena, and their device and circuit applications, together with fabrication and growth technology.
Author | : |
Publisher | : |
Total Pages | : 60 |
Release | : 1973-03 |
Genre | : Physical instruments |
ISBN | : |
Author | : Joachim N. Burghartz |
Publisher | : John Wiley & Sons |
Total Pages | : 637 |
Release | : 2013-03-19 |
Genre | : Technology & Engineering |
ISBN | : 1118517539 |
Winner, 2013 PROSE Award, Engineering and Technology Concise, high quality and comparative overview of state-of-the-art electron device development, manufacturing technologies and applications Guide to State-of-the-Art Electron Devices marks the 60th anniversary of the IRE electron devices committee and the 35th anniversary of the IEEE Electron Devices Society, as such it defines the state-of-the-art of electron devices, as well as future directions across the entire field. Spans full range of electron device types such as photovoltaic devices, semiconductor manufacturing and VLSI technology and circuits, covered by IEEE Electron and Devices Society Contributed by internationally respected members of the electron devices community A timely desk reference with fully-integrated colour and a unique lay-out with sidebars to highlight the key terms Discusses the historical developments and speculates on future trends to give a more rounded picture of the topics covered A valuable resource R&D managers; engineers in the semiconductor industry; applied scientists; circuit designers; Masters students in power electronics; and members of the IEEE Electron Device Society.