Ion Beams In Materials Processing And Analysis
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| Author | : Bernd Schmidt |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 425 |
| Release | : 2012-12-13 |
| Genre | : Technology & Engineering |
| ISBN | : 3211993568 |
A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.
| Author | : R. Curtis Bird |
| Publisher | : Elsevier |
| Total Pages | : 743 |
| Release | : 1989-11-28 |
| Genre | : Technology & Engineering |
| ISBN | : 0080916899 |
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.
| Author | : Isao Yamada |
| Publisher | : CRC Press |
| Total Pages | : 260 |
| Release | : 2015-08-20 |
| Genre | : Science |
| ISBN | : 1498711766 |
Materials Processing by Cluster Ion Beams: History, Technology, and Applications discusses the contemporary physics, materials science, surface engineering issues, and nanotechnology capabilities of cluster beam processing. Written by the originator of the gas cluster ion beam (GCIB) concept, this book:Offers an overview of ion beam technologies, f
| Author | : |
| Publisher | : |
| Total Pages | : 106 |
| Release | : 2007 |
| Genre | : Focused ion beams |
| ISBN | : 9781558999404 |
| Author | : Lucille A. Giannuzzi |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 362 |
| Release | : 2006-05-18 |
| Genre | : Science |
| ISBN | : 038723313X |
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
| Author | : Y. Wang |
| Publisher | : Materials Research Society |
| Total Pages | : |
| Release | : 2010-03-01 |
| Genre | : Technology & Engineering |
| ISBN | : 9781605112176 |
The Handbook of Modern Ion Beam Materials Analysis, 2nd Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis. It provides an excellent introduction to the fundamentals and lab practices of ion beam analysis and is also useful as a teaching text for undergraduate senior or first-year graduate students This text is a comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis. In addition, the DVD includes bonus info - both the Ion Beam Analysis Nuclear Data Library (IBANDL) and GUPIX Subroutines (CSA and YLS) for X-ray Database.
| Author | : Y. Wu |
| Publisher | : |
| Total Pages | : 106 |
| Release | : 2006 |
| Genre | : Focused ion beams |
| ISBN | : |
| Author | : Joseph R. Tesmer |
| Publisher | : |
| Total Pages | : 728 |
| Release | : 1995 |
| Genre | : Science |
| ISBN | : |
The Handbook of Modern Ion Beam Materials Analysis is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. The book's 13 chapters cover discussions and examples, while 18 appendices provide extensive compilations of relevant data. Numerous techniques are discussed, including elastic recoil detection and activation analysis. Material in the book pushes the boundaries of ion-beam analysis to higher energies. The detection of light elements is emphasized, and background materials in the areas of energy loss, nuclear theory, instrumentation, analysis pitfalls and radiation safety are also provided for a better understanding of the principles basic to the techniques.
| Author | : Horst Schmidt-Böcking |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 210 |
| Release | : 2013-06-29 |
| Genre | : Technology & Engineering |
| ISBN | : 3662027941 |
Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.
| Author | : F. A. Smidt |
| Publisher | : William Andrew |
| Total Pages | : 262 |
| Release | : 1983 |
| Genre | : Science |
| ISBN | : |
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
