The Interferometry of Reversed and Non-reversed Spectra
Author | : Carl Barus |
Publisher | : |
Total Pages | : 136 |
Release | : 1919 |
Genre | : Interference (Light) |
ISBN | : |
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Author | : Carl Barus |
Publisher | : |
Total Pages | : 136 |
Release | : 1919 |
Genre | : Interference (Light) |
ISBN | : |
Author | : Carl Barus |
Publisher | : |
Total Pages | : 132 |
Release | : 1919 |
Genre | : Interference (Light) |
ISBN | : |
Author | : Barakat |
Publisher | : CRC Press |
Total Pages | : 196 |
Release | : 1990-01-01 |
Genre | : Technology & Engineering |
ISBN | : 9780852741009 |
Interferometry of Fibrous Materials shows how interferometric methods can be used in optical, synthetic, and natural fiber analysis. This practical volume features a large number of both color and black and white interferograms to enhance understanding of how interferometry is used to determine a fibre's optical properties.
Author | : Deyan Draganov |
Publisher | : SEG Books |
Total Pages | : 641 |
Release | : 2008 |
Genre | : Nature |
ISBN | : 1560801506 |
Including more than 70 papers, this invaluable source for researchers and students contains an editors' introduction with extensive references and chapters on seismic interferometry without equations, highlights of the history of seismic interferometry from 1968 until 2003, and offers a detailed overview of the rapid developments since 2004.
Author | : Carl Barus |
Publisher | : |
Total Pages | : 120 |
Release | : 1914 |
Genre | : Interference (Light) |
ISBN | : |
Author | : Daniel Linnemann |
Publisher | : Springer |
Total Pages | : 171 |
Release | : 2018-07-28 |
Genre | : Science |
ISBN | : 3319960083 |
Quantum mechanics entails effects like superpositions and entanglement, which have no classical counterparts. From a technological standpoint these counterintuitive quantum aspects can be viewed as an unexploited resource that can be harnessed to support various tasks, e.g. in the domains of computation, communication, and metrology. In many applications, however, the potential of nonclassical states cannot practically be exploited due to detection inefficiencies. The authors address this limitation by experimentally realizing a novel detection scheme in which entangling interactions are time reversed. In this way, nonclassical many-particle states are disentangled, allowing them to be detected in a robust and technically feasible manner. In the context of quantum metrology, these nonlinear readout techniques extend the class of entangled probe states that can be leveraged for sensing applications without being limited by finite detector resolution. The authors present an active atom interferometer, where both the entangled state preparation and disentangling readout involve parametric amplification. This “SU(1,1)” interferometer is implemented with the help of spinor Bose–Einstein condensates, where amplification is implemented by atomic collisions leading to spin exchange.
Author | : Carl Barus |
Publisher | : |
Total Pages | : 156 |
Release | : 1917 |
Genre | : Interference (Light) |
ISBN | : |
Author | : Carl Barus |
Publisher | : |
Total Pages | : 236 |
Release | : 1919 |
Genre | : Interference (Light) |
ISBN | : |
Author | : Carl Barus |
Publisher | : |
Total Pages | : 318 |
Release | : 1916 |
Genre | : Interference (Light) |
ISBN | : |
Author | : Toru Yoshizawa |
Publisher | : CRC Press |
Total Pages | : 919 |
Release | : 2017-07-28 |
Genre | : Technology & Engineering |
ISBN | : 1466573619 |
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.