In Line Characterization Techniques For Performance And Yield Enhancement In Microelectronic Manufacturing Ii
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Author | : Sergio Ajuria |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 258 |
Release | : 1998 |
Genre | : Computers |
ISBN | : |
A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.
Author | : Damon DeBusk |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 186 |
Release | : 1997-01-01 |
Genre | : Integrated circuits |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 266 |
Release | : 1998 |
Genre | : Integrated circuits |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 266 |
Release | : 2001 |
Genre | : Integrated circuits |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 360 |
Release | : 1999 |
Genre | : Integrated circuits |
ISBN | : |
Author | : Bernd O. Kolbesen (Chemiker.) |
Publisher | : The Electrochemical Society |
Total Pages | : 568 |
Release | : 1999 |
Genre | : Technology & Engineering |
ISBN | : 9781566772396 |
Author | : Gudrun Kissinger |
Publisher | : Society of Photo Optical |
Total Pages | : 242 |
Release | : 2001 |
Genre | : Technology & Engineering |
ISBN | : 9780819441072 |
Author | : Sergio Ajuria |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 352 |
Release | : 1999 |
Genre | : Science |
ISBN | : |
These conference proceedings consist of 47 papers addressing a variety of issues concerning in-line methods and monitors for process and yield improvement.
Author | : |
Publisher | : |
Total Pages | : 166 |
Release | : 2002 |
Genre | : Engineering |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 218 |
Release | : 1997 |
Genre | : Integrated circuits |
ISBN | : |