In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II
Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 258
Release: 1998
Genre: Computers
ISBN:

A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.

In-line Methods and Monitors for Process and Yield Improvement

In-line Methods and Monitors for Process and Yield Improvement
Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 352
Release: 1999
Genre: Science
ISBN:

These conference proceedings consist of 47 papers addressing a variety of issues concerning in-line methods and monitors for process and yield improvement.