High Purity Silicon VI

High Purity Silicon VI
Author: Electrochemical Society. Meeting
Publisher: The Electrochemical Society
Total Pages: 720
Release: 2000
Genre: Science
ISBN: 9781566772846

"... papers that were presented at the Sixth Symposium on High Purity Silicon held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22-27, 2000."--Preface.

High Purity Silicon VIII

High Purity Silicon VIII
Author: Cor L. Claeys
Publisher: The Electrochemical Society
Total Pages: 454
Release: 2004
Genre: Technology & Engineering
ISBN: 9781566774185

"This Proceedings Volume includes papers that were presented at the Eighth Symposium on High Purity Silicon held in Honolulu, Hawaii at the 206th Meeting of the Electrochemical Society, October 3-8, 2004"--Pref.

High Purity Silicon 10

High Purity Silicon 10
Author: Cor L. Claeys
Publisher: The Electrochemical Society
Total Pages: 370
Release: 2008-10
Genre: Crystal growth
ISBN: 156677652X

The issue of the 10th High Purity Silicon symposium provides an overview of the latest developments in the growth, characterization, devices processing, and application of high purity silicon in either bulk or epitaxial form. The emphasis is on the control and prevention of impurity incorporation, characterization and detection of defects and impurity states in high purity and high resistivity silicon for superior device performances. Device and circuit aspects related to the application of devices fabricated on high resistivity silicon wafers will also be addressed. Special attention will be given to alternative and high-mobility substrates and their material and device aspects.

High Purity Silicon VII

High Purity Silicon VII
Author: Cor L. Claeys
Publisher: The Electrochemical Society
Total Pages: 428
Release: 2002
Genre: Science
ISBN: 9781566773447

High Purity Silicon 9

High Purity Silicon 9
Author: Cor L. Claeys
Publisher: The Electrochemical Society
Total Pages: 504
Release: 2006
Genre: Crystal growth
ISBN: 1566775043

This issue discusses the latest developments in the growth, characterization, device processing and applications of high-purity silicon in either bulk or epitaxial form. Information is given on the control and prevention of impurity incorporation, characterization and detection of defects and impurity states. Device and circuit aspects are also covered. Advanced substrates such as SOI, strained Si and germanium-on-insulator are discussed.

Handbook of Silicon Based MEMS Materials and Technologies

Handbook of Silicon Based MEMS Materials and Technologies
Author: Markku Tilli
Publisher: Elsevier
Total Pages: 1028
Release: 2020-04-17
Genre: Technology & Engineering
ISBN: 012817787X

Handbook of Silicon Based MEMS Materials and Technologies, Third Edition is a comprehensive guide to MEMS materials, technologies, and manufacturing with a particular emphasis on silicon as the most important starting material used in MEMS. The book explains the fundamentals, properties (mechanical, electrostatic, optical, etc.), materials selection, preparation, modeling, manufacturing, processing, system integration, measurement, and materials characterization techniques of MEMS structures. The third edition of this book provides an important up-to-date overview of the current and emerging technologies in MEMS making it a key reference for MEMS professionals, engineers, and researchers alike, and at the same time an essential education material for undergraduate and graduate students. - Provides comprehensive overview of leading-edge MEMS manufacturing technologies through the supply chain from silicon ingot growth to device fabrication and integration with sensor/actuator controlling circuits - Explains the properties, manufacturing, processing, measuring and modeling methods of MEMS structures - Reviews the current and future options for hermetic encapsulation and introduces how to utilize wafer level packaging and 3D integration technologies for package cost reduction and performance improvements - Geared towards practical applications presenting several modern MEMS devices including inertial sensors, microphones, pressure sensors and micromirrors

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
Author: Peter Pichler
Publisher: Springer Science & Business Media
Total Pages: 576
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 3709105978

This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.

Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)

Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)
Author: Bernd O. Kolbesen
Publisher: The Electrochemical Society
Total Pages: 479
Release: 2009-09
Genre: Semiconductors
ISBN: 1566777402

The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.