Fundamentals Of Powder Diffraction And Structural Characterization Of Materials
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Author | : Vitalij Pecharsky |
Publisher | : Springer Science & Business Media |
Total Pages | : 751 |
Release | : 2008-11-24 |
Genre | : Science |
ISBN | : 0387095799 |
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author | : Vitalij Pecharsky |
Publisher | : Springer Science & Business Media |
Total Pages | : 751 |
Release | : 2008-11-26 |
Genre | : Science |
ISBN | : 0387095780 |
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author | : Vitalij Pecharsky |
Publisher | : Springer Science & Business Media |
Total Pages | : 752 |
Release | : 2003-05-31 |
Genre | : Technology & Engineering |
ISBN | : 9781402073656 |
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Author | : Myeongkyu Lee |
Publisher | : CRC Press |
Total Pages | : 302 |
Release | : 2017-03-16 |
Genre | : Science |
ISBN | : 1315361973 |
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author | : William I. F. David |
Publisher | : OUP Oxford |
Total Pages | : 358 |
Release | : 2002 |
Genre | : Language Arts & Disciplines |
ISBN | : 0198500912 |
Our understanding of the properties of materials, from drugs and proteins to catalysts and ceramics, is almost always based on structural information. This book describes the new developments in the realm of powder diffraction which make it possible for scientists to obtain such information even from polycrystalline materials. Written and edited by experts active in the field, and covering both the fundamental and applied aspects of structure solution from powder diffraction data, this book guides both novices and experienced practitioners alike through the maze of possibilities.
Author | : V.K. Percharsky |
Publisher | : |
Total Pages | : 713 |
Release | : 2005 |
Genre | : |
ISBN | : |
Author | : Yoshio Waseda |
Publisher | : Springer Science & Business Media |
Total Pages | : 320 |
Release | : 2011-03-18 |
Genre | : Technology & Engineering |
ISBN | : 3642166350 |
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author | : Sam Zhang |
Publisher | : CRC Press |
Total Pages | : 344 |
Release | : 2008-12-22 |
Genre | : Science |
ISBN | : 1420042955 |
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
Author | : Marc De Graef |
Publisher | : Cambridge University Press |
Total Pages | : 773 |
Release | : 2012-10-08 |
Genre | : Technology & Engineering |
ISBN | : 1139560476 |
This highly readable, popular textbook for upper undergraduates and graduates comprehensively covers the fundamentals of crystallography and symmetry, applying these concepts to a large range of materials. New to this edition are more streamlined coverage of crystallography, additional coverage of magnetic point group symmetry and updated material on extraterrestrial minerals and rocks. New exercises at the end of chapters, plus over 500 additional exercises available online, allow students to check their understanding of key concepts and put into practice what they have learnt. Over 400 illustrations within the text help students visualise crystal structures and more abstract mathematical objects, supporting more difficult topics like point group symmetries. Historical and biographical sections add colour and interest by giving an insight into those who have contributed significantly to the field. Supplementary online material includes password-protected solutions, over 100 crystal structure data files, and Powerpoints of figures from the book.
Author | : |
Publisher | : DIANE Publishing |
Total Pages | : 18 |
Release | : 1995 |
Genre | : |
ISBN | : 9781422318324 |