Functional Dielectrics For Electronics
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| Author | : Yuriy Poplavko |
| Publisher | : Woodhead Publishing |
| Total Pages | : 314 |
| Release | : 2020-01-29 |
| Genre | : Technology & Engineering |
| ISBN | : 0128188367 |
Functional Dielectrics for Electronics: Fundamentals of Conversion Properties presents an overview of the nature of electrical polarization, dielectric nonlinearity, electrical charge transfer mechanisms, thermal properties, the nature of high permittivity, low-loss thermostability and other functional dielectrics. The book describes the intrinsic mechanisms of electrical polarization and the energy transformations in non-centrosymmetric crystals that are responsible for converting thermal, mechanical, optical and other impacts into electrical signals. In addition, the book reviews the main physical processes that provide electrical, mechanoelectrical, thermoelectrical and other conversion phenomena in polar crystals. Detailed descriptions are given to electrical manifestations of polar-sensitivity in the crystals, the interaction of polarization with conductivity, the anomalies in thermal expansion coefficient and main peculiarities of heat transfer in polar-sensitive crystals. - Provides readers with a fundamental understanding of polar dielectric materials and their physical processes - Includes different models of polar sensitivity and experimental confirmation of these models - Discusses thermal expansion, heat transfer, dielectric nonlinearity and other important aspects for electronics applications
| Author | : Yuriy Poplavko |
| Publisher | : Woodhead Publishing |
| Total Pages | : 312 |
| Release | : 2020-02-03 |
| Genre | : Technology & Engineering |
| ISBN | : 0128188359 |
Functional Dielectrics for Electronics: Fundamentals of Conversion Properties presents an overview of the nature of electrical polarization, dielectric nonlinearity, electrical charge transfer mechanisms, thermal properties, the nature of high permittivity, low-loss thermostability and other functional dielectrics. The book describes the intrinsic mechanisms of electrical polarization and the energy transformations in non-centrosymmetric crystals that are responsible for converting thermal, mechanical, optical and other impacts into electrical signals. In addition, the book reviews the main physical processes that provide electrical, mechanoelectrical, thermoelectrical and other conversion phenomena in polar crystals. Detailed descriptions are given to electrical manifestations of polar-sensitivity in the crystals, the interaction of polarization with conductivity, the anomalies in thermal expansion coefficient and main peculiarities of heat transfer in polar-sensitive crystals.
| Author | : Yuriy Poplavko |
| Publisher | : Woodhead Publishing |
| Total Pages | : 377 |
| Release | : 2021-07-06 |
| Genre | : Technology & Engineering |
| ISBN | : 0128236442 |
Dielectric Spectroscopy of Electronic Materials: Applied Physics of Dielectrics incorporates the results of four decades of research and applications of dielectric spectroscopy for solids, mostly for the investigation of materials used in electronics. The book differs from others by more detailed analysis of the features of dielectric spectra conditioned by specific mechanisms of electrical polarization and conductivity. Some original methods are presented in the simulation of frequency distributions (relaxers and oscillators), with methods proposed for various ferroelectrics frequency-temperature dielectric spectra. Also described are original methods for ferroelectrics on microwaves investigation, including the features of thin films study. The book is not burdened by complex mathematical proofs and should help readers quickly understand how to apply dielectric spectroscopy methods to their own research problems. More advanced readers may also find this book valuable as a review of the key concepts and latest advances on the topics presented. - Introduces critical material characterization techniques by an expert with more than 40 years of experience in dielectric spectroscopy - Reviews advances in dielectric spectroscopy methods to enable advances such as the miniaturization of electronics at the nanoscale - Provides an overview of polarization mechanisms utilizing different models (i.e., oscillator and relaxation)
| Author | : Shyam P Muraka |
| Publisher | : Elsevier |
| Total Pages | : 459 |
| Release | : 2003-10-13 |
| Genre | : Science |
| ISBN | : 0080521959 |
Semiconductor technologies are moving at such a fast pace that new materials are needed in all types of application. Manipulating the materials and their properties at atomic dimensions has become a must. This book presents the case of interlayer dielectrics materials whilst considering these challenges. Interlayer Dielectrics for Semiconductor Technologies cover the science, properties and applications of dielectrics, their preparation, patterning, reliability and characterisation, followed by the discussion of different materials including those with high dielctric constants and those useful for waveguide applications in optical communications on the chip and the package.* Brings together for the FIRST time the science and technology of interlayer deilectrics materials, in one volume* written by renowned experts in the field* Provides an up-to-date starting point in this young research field.
| Author | : Alexei Nazarov |
| Publisher | : Springer |
| Total Pages | : 464 |
| Release | : 2014-08-28 |
| Genre | : Technology & Engineering |
| ISBN | : 3319088041 |
This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this book, new approaches exploiting nanotechnologies (such as UTBB FD SOI, Fin FETs, nanowires, graphene or carbon nanotubes on dielectric) to pave a way between “More Moore” and “More than Moore” are considered, in order to create different kinds of sensors and devices which will consume less electrical power, be more portable and totally compatible with modern microelectronics products.
| Author | : Mohammed Essaid Achour |
| Publisher | : Materials Research Forum LLC |
| Total Pages | : 335 |
| Release | : 2016-12-15 |
| Genre | : Technology & Engineering |
| ISBN | : 1945291192 |
The First International Symposium on Dielectric Materials and Applications (ISyDMA’2016) was held in Kenitra (4 May, 2016) and in Rabat (May 5-6, 2016), Morocco. ISyDMA’2016 provided an international forum for reporting the most recent developments in Advanced Dielectric Materials and applications. The goal of this collection of peer reviewed papers is to provide researchers and scientists from all over the world with recent developments in dielectric materials and their innovative applications. The book will be useful for materials scientists, physicists, chemists, biologists, and electrical engineers engaged in fundamental and applied research or technical investigations of such materials.
| Author | : Juan Pablo Borja |
| Publisher | : Springer |
| Total Pages | : 109 |
| Release | : 2016-09-16 |
| Genre | : Technology & Engineering |
| ISBN | : 3319432206 |
This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.
| Author | : Milton Ohring |
| Publisher | : Academic Press |
| Total Pages | : 759 |
| Release | : 2014-10-14 |
| Genre | : Technology & Engineering |
| ISBN | : 0080575528 |
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
| Author | : Yuriy M. Poplavko |
| Publisher | : Elsevier |
| Total Pages | : 710 |
| Release | : 2018-11-23 |
| Genre | : Science |
| ISBN | : 0128152567 |
Mechanical and thermal properties are reviewed and electrical and magnetic properties are emphasized. Basics of symmetry and internal structure of crystals and the main properties of metals, dielectrics, semiconductors, and magnetic materials are discussed. The theory and modern experimental data are presented, as well as the specifications of materials that are necessary for practical application in electronics. The modern state of research in nanophysics of metals, magnetic materials, dielectrics and semiconductors is taken into account, with particular attention to the influence of structure on the physical properties of nano-materials. The book uses simplified mathematical treatment of theories, while emphasis is placed on the basic concepts of physical phenomena in electronic materials. Most chapters are devoted to the advanced scientific and technological problems of electronic materials; in addition, some new insights into theoretical facts relevant to technical devices are presented. Electronic Materials is an essential reference for newcomers to the field of electronics, providing a fundamental understanding of important basic and advanced concepts in electronic materials science. Provides important overview of the fundamentals of electronic materials properties significant for device applications along with advanced and applied concepts essential to those working in the field of electronics Takes a simplified and mathematical approach to theories essential to the understanding of electronic materials and summarizes important takeaways at the end of each chapter Interweaves modern experimental data and research in topics such as nanophysics, nanomaterials and dielectrics
| Author | : |
| Publisher | : The Electrochemical Society |
| Total Pages | : 508 |
| Release | : 2004 |
| Genre | : Dielectrics |
| ISBN | : 9781566774178 |
