Forces In Scanning Probe Methods
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| Author | : Roland Wiesendanger |
| Publisher | : Cambridge University Press |
| Total Pages | : 664 |
| Release | : 1994-09-29 |
| Genre | : Science |
| ISBN | : 9780521428477 |
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
| Author | : H.-J. Güntherodt |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 639 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 9401100497 |
Proceedings of the NATO Advanced Study Institute, Schluchsee, Germany, March 7--18, 1994
| Author | : Francesco Marinello |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 513 |
| Release | : 2012-10-04 |
| Genre | : Science |
| ISBN | : 3642274943 |
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
| Author | : Bert Voigtländer |
| Publisher | : Springer |
| Total Pages | : 375 |
| Release | : 2015-02-24 |
| Genre | : Technology & Engineering |
| ISBN | : 3662452405 |
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
| Author | : M.T. Bray |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 431 |
| Release | : 2013-11-11 |
| Genre | : Technology & Engineering |
| ISBN | : 1475793227 |
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
| Author | : Paul Verkade |
| Publisher | : John Wiley & Sons |
| Total Pages | : 245 |
| Release | : 2019-11-04 |
| Genre | : Science |
| ISBN | : 1119086450 |
Brings a fresh point of view to the current state of correlative imaging and the future of the field This book provides contributions from international experts on correlative imaging, describing their vision of future developments in the field based on where it is today. Starting with a brief historical overview of how the field evolved, it presents the latest developments in microscopy that facilitate the correlative workflow. It also discusses the need for an ideal correlative probe, applications in proteomic and elemental analysis, interpretation methods, and how correlative imaging can incorporate force microscopy, soft x-ray tomography, and volume electron microscopy techniques. Work on placing individual molecules within cells is also featured. Correlative Imaging: Focusing on the Future offers in-depth chapters on: correlative imaging from an LM perspective; the importance of sample processing for correlative imaging; correlative light and volume EM; correlation with scanning probe microscopies; and integrated microscopy. It looks at: cryo-correlative microscopy; correlative cryo soft X-ray imaging; and array tomography. Hydrated-state correlative imaging in vacuo, correlating data from different imaging modalities, and big data in correlative imaging are also considered. Brings a fresh view to one of the hottest topics within the imaging community: the correlative imaging field Discusses current research and offers expert thoughts on the field’s future developments Presented by internationally-recognized editors and contributors with extensive experience in research and applications Of interest to scientists working in the fields of imaging, structural biology, cell biology, developmental biology, neurobiology, cancer biology, infection and immunity, biomaterials and biomedicine Part of the Wiley–Royal Microscopical Society series Correlative Imaging: Focusing on the Future will appeal to those working in the expanding field of the biosciences, correlative microscopy and related microscopic areas. It will also benefit graduate students working in microscopy, as well as anyone working in the microscopy imaging field in biomedical research.
| Author | : Roland Wiesendanger |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 359 |
| Release | : 2013-03-08 |
| Genre | : Science |
| ISBN | : 3642793665 |
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.
| Author | : Janice P. L. Kenney |
| Publisher | : Cambridge University Press |
| Total Pages | : 429 |
| Release | : 2019-07-18 |
| Genre | : Nature |
| ISBN | : 1107070333 |
A comprehensive handbook outlining state-of-the-art analytical techniques used in geomicrobiology, for advanced students, researchers and professional scientists.
| Author | : Sascha Sadewasser |
| Publisher | : Springer |
| Total Pages | : 530 |
| Release | : 2018-03-09 |
| Genre | : Science |
| ISBN | : 3319756877 |
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
| Author | : Bert Voigtländer |
| Publisher | : Springer |
| Total Pages | : 329 |
| Release | : 2019-05-23 |
| Genre | : Science |
| ISBN | : 303013654X |
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
