Focused Beam Methods
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| Author | : John W. Schultz |
| Publisher | : John Schultz |
| Total Pages | : 141 |
| Release | : 2012-10-15 |
| Genre | : Technology & Engineering |
| ISBN | : 1480092851 |
Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.
| Author | : Lisa L. Haneberg |
| Publisher | : John Wiley & Sons |
| Total Pages | : 151 |
| Release | : 2010-12-03 |
| Genre | : Business & Economics |
| ISBN | : 111804102X |
In Focus Like a Laser Beam, acclaimed management consultant and business blogger Lisa Haneberg offers business leaders a new way to direct their focus that, like a laser beam, is direct, fast, and on track. The book offers leaders ways to improve energy and engagement in the workplace and redirect how people communicate at work. Focus Like a Laser Beam is filled with useful suggestions for dealing with distractions and diversions and outlines the ten practices that will help leaders focus on what’s most important. Know and feel the power of laser focus Get connected with your employees Have fun and be fun Relax to energize Turn meetings into focus sessions Invite a challenge Huddle Stop multitasking and put your focus where it belongs Do one great thing Let go of outdated goals, projects, and tasks
| Author | : Lucille A. Giannuzzi |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 362 |
| Release | : 2006-05-18 |
| Genre | : Science |
| ISBN | : 038723313X |
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
| Author | : Leo M. L. Nollet |
| Publisher | : CRC Press |
| Total Pages | : 512 |
| Release | : 2004 |
| Genre | : Food |
| ISBN | : 9780824750381 |
Presents contemporary methods of measuring optical properties, moisture, ash content, and other physical characteristics of food and evaluates techniques used to trace nutrient analytes ranging from peptides, proteins, and enzymes to aroma compounds to carbohydrates and starch.
| Author | : Renliang Xu |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 411 |
| Release | : 2006-04-11 |
| Genre | : Science |
| ISBN | : 0306471248 |
Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
| Author | : John J. Ruschau |
| Publisher | : ASTM International |
| Total Pages | : 169 |
| Release | : 1995 |
| Genre | : Fracture mechanics |
| ISBN | : 0803120036 |
Comprises ten papers discussing topics including methods for the measurement of surface crack size, multiple site cracking, and cracking under nonisothermal conditions using AC potential difference procedures; influences of crack deflection and crack splitting on DC potential calibrations; complianc
| Author | : Adrian Kitai |
| Publisher | : John Wiley & Sons |
| Total Pages | : 533 |
| Release | : 2023-10-16 |
| Genre | : Technology & Engineering |
| ISBN | : 1119891426 |
Gain an introduction to the concepts behind semiconductor materials and devices in this advanced textbook Semiconductors are the foundation of the electronics industry, and are therefore embedded in virtually all modern technology. No engineer or materials scientist can be without an understanding of this essential field. Since semiconductors are also the foundation of solar cells, they play an increasingly critical role in the transition to sustainable technology and promise, as a result, to become even more central in global technological progress. Fundamentals of Semiconductor Materials and Devices is a textbook that presents the advanced principles underlying semiconductors in an accessible and comprehensive way. Combining material from both engineering and physics, it remains grounded throughout in practical applications of semiconductors. Its approach makes it ideal for readers looking to gain a thorough understanding of this ubiquitous technology. Fundamentals of Semiconductor Materials and Devices readers will also find: Questions and exercises to stimulate learning and increase comprehension Introductory chapters detailing the fundamentals of quantum and solid state physics, as well as the foundational principles of semiconductor tech Detailed analysis of topics including flash memory, the quantum dot, two-dimensional semiconductor materials, and more Fundamentals of Semiconductor Materials and Devices is a valuable guide for students and researchers in any area of engineering, physics, or materials science.
| Author | : Giulia Matrone |
| Publisher | : MDPI |
| Total Pages | : 148 |
| Release | : 2019-10-04 |
| Genre | : Technology & Engineering |
| ISBN | : 3039211994 |
Ultrasound medical imaging stands out among the other diagnostic imaging modalities for its patient-friendliness, high temporal resolution, low cost, and absence of ionizing radiation. On the other hand, it may still suffer from limited detail level, low signal-to-noise ratio, and narrow field-of-view. In the last decade, new beamforming and image reconstruction techniques have emerged which aim at improving resolution, contrast, and clutter suppression, especially in difficult-to-image patients. Nevertheless, achieving a higher image quality is of the utmost importance in diagnostic ultrasound medical imaging, and further developments are still indispensable. From this point of view, a crucial role can be played by novel beamforming techniques as well as by non-conventional image formation techniques (e.g., advanced transmission strategies, and compounding, coded, and harmonic imaging). This Special Issue includes novel contributions on both ultrasound beamforming and image formation techniques, particularly addressed at improving B-mode image quality and related diagnostic content. This indeed represents a hot topic in the ultrasound imaging community, and further active research in this field is expected, where many challenges still persist.
| Author | : Buddy D. Ratner |
| Publisher | : Academic Press |
| Total Pages | : 1610 |
| Release | : 2012-12-31 |
| Genre | : Science |
| ISBN | : 008087780X |
The revised edition of this renowned and bestselling title is the most comprehensive single text on all aspects of biomaterials science. It provides a balanced, insightful approach to both the learning of the science and technology of biomaterials and acts as the key reference for practitioners who are involved in the applications of materials in medicine. - Over 29,000 copies sold, this is the most comprehensive coverage of principles and applications of all classes of biomaterials: "the only such text that currently covers this area comprehensively" - Materials Today - Edited by four of the best-known figures in the biomaterials field today; fully endorsed and supported by the Society for Biomaterials - Fully revised and expanded, key new topics include of tissue engineering, drug delivery systems, and new clinical applications, with new teaching and learning material throughout, case studies and a downloadable image bank
| Author | : John W. Schultz |
| Publisher | : Artech House |
| Total Pages | : 331 |
| Release | : 2023-02-28 |
| Genre | : Technology & Engineering |
| ISBN | : 1630819476 |
This book is a practical engineering guide to microwave material measurements for both laboratory and manufacturing/field environments, including nondestructive inspection (NDI) and nondestructive evaluation (NDE). The book covers proven methods for characterizing materials at microwave frequencies, including both resonant and wide-bandwidth techniques, and gives you the necessary theory and equations for implementing these methods. You’ll understand how to invert dielectric and/or magnetic material properties from free space transmission and reflection, and how to measure traveling wave attenuation. You’ll also know how to measure dielectric and/or magnetic material properties from transmission line fixtures, and learn how to use computational electromagnetic modeling with a measurement fixture. The book shows you how to build and use microwave NDE equipment for radomes and/or structural dielectric materials. This is an excellent resource for Engineers/scientists conducting or analyzing RF/Microwave/MMW material measurements for applications in electromagnetic materials, as well as those who are developing or applying microwave non-destructive evaluation (NDE) methods to their manufacturing problems.
