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| Author | : Lawrence C. Wagner |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 256 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461549191 |
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
| Author | : Friedrich Beck |
| Publisher | : John Wiley & Sons |
| Total Pages | : 198 |
| Release | : 1998-02-04 |
| Genre | : Technology & Engineering |
| ISBN | : 9780471974017 |
Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.
| Author | : IEEE Staff |
| Publisher | : |
| Total Pages | : |
| Release | : 2016-07-18 |
| Genre | : |
| ISBN | : 9781467382601 |
IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
