Epitaxial Growth And Optoelectronic Characterization Of Cubic Silicon Carbide Deposited Using Chemical Vapor Deposition On Porous Silicon
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Author | : Frederick Paul Vaccaro |
Publisher | : |
Total Pages | : 406 |
Release | : 1999 |
Genre | : |
ISBN | : |
ABSTRACT: Cubic silicon carbide is a promising material for applications in high-power, high-frequency, high-temperature, and high-speed electronic devices. Fourier Transform Infrared Spectroscopy (FTIR), Secondary Ion Mass Spectrometry (SIMS), X-Ray Diffraction (XRD) and Atomic Force Microscopy (AFM) evaluations performed on thin films grown heteroepitaxially on porous (i.e. anodized) silicon using a new chemical vapor deposition (CVD) method employing trimethylsilane confirmed that the thin films were stoichiometric, cubic silicon carbide (3C-SiC). Conclusions were drawn on the basis of comparisons with published standards as well as with results generated on reference materials. SIMS profiles revealed the growth rates at approximately 1150̊C to vary from 2.1 to 4.0 Å/min. depending upon the slight variations in the CVD process trimethylsilane gas pressure. AFM evaluations revealed that the deposition mode at short deposition times was homo-oriented island nucleation and growth but that the 3C-SiC thin films evolved into continuous terraced layers at longer deposition times. Heterojunction (pn) junction diodes, fabricated from CVD and chemical vapor converted (CVC) porous silicon specimens, displayed world record breakdown voltages as high as 140 volts and 150 volts respectively. Historically, heterojunction (pn) junction diodes fabricated from 3C-SiC thin film specimens deposited on non-anodized displayed breakdown voltages below 10 to 20 volts.
Author | : |
Publisher | : |
Total Pages | : |
Release | : 2008 |
Genre | : |
ISBN | : |
4H-silicon carbide (4H-SiC) is a wide band gap semiconductor with outstanding capabilities for high temperature, high power, and high frequency electronic device applications. Advances in its processing technology have resulted in large micropipe-free single crystals and high speed epitaxial growth on off-axis silicon face substrates. Extraordinarily high growth rates of high quality epitaxial films (>100 [Mu]m per hour) have been achieved, but only on off-axis substrates (misoriented 4° to 8° from the (0001) crystallographic plane). There is a strong incentive to procure an on-axis growth procedure, due to the excessive waste of high quality single crystal associated with wafering off-axis substrates. The purpose of this research was to develop a reliable process for homoepitaxial growth of 4H-SiC on on-axis 4H-SiC. Typically the use of on-axis SiC for epitaxial growth is undesired due to the increased probability of 3C-SiC inclusions and polycrystalline growth. However, it is believed that the presence of chlorine during reaction may reduce the presence of 3C-SiC and improve the quality of the epitaxial film. Therefore homoepitaxial SiC was deposited using methyltrichlorosilane (MTS) and ethane sources with carrier gases consisting of argon-hydrogen mixtures. Ethane was used to increase the C/Si ratio, to aid in the prevention of 3C-SiC, and to help eliminate silicon droplets deposited during epitaxial growth. Deposition occurred in a homemade, quartz, cold wall chemical vapor deposition reactor. Epitaxial films on on-axis 4H-SiC were deposited without the presence of 3C-SiC inclusions or polycrystalline SiC, as observed by defect selective etching, scanning electron microscopy and optical microscopy. Large defect free areas, [similar to]5 mm[superscript]2, with epitaxial film thicknesses of [similar to]6 [Mu]m were grown on on-axis 4H-SiC. Epitaxial films had approximately an 80%, [similar to]20 cm[superscript]-2, decrease in defect density as compared to the substrates. The growth rate was independent of face polarity and orientation of the substrate. The optimal temperature for hydrogen etching, to promote the smoothest epitaxial films for on-axis substrates (both C- and Si-polarities), is [similar to]1550 °C for 10 minutes in the presence of 2 slm hydrogen. The optimum C/Si ratio for epitaxial growth on on-axis 4H-SiC is 1; excess carbon resulted in the codeposition of graphite and cone-shaped silicon carbide defects.
Author | : Dominika Teklińska |
Publisher | : |
Total Pages | : |
Release | : 2017 |
Genre | : |
ISBN | : |
Dotyczy: silikon carbide, 3C-SiC, silicon, epitaxy, epitaxial layers, CVD, węglik krzemu, krzem, epitaksja, warstwy epitaksjalne.
Author | : |
Publisher | : |
Total Pages | : 492 |
Release | : 1999 |
Genre | : Dissertations, Academic |
ISBN | : |
"Education, arts and social sciences, natural and technical sciences in the United States and Canada".
Author | : Herbert A. Will |
Publisher | : |
Total Pages | : 20 |
Release | : 1974 |
Genre | : Crystal growth |
ISBN | : |
Author | : Juraj Marek |
Publisher | : Trans Tech Publications Ltd |
Total Pages | : 116 |
Release | : 2023-05-30 |
Genre | : Science |
ISBN | : 3036413251 |
Special topic volume with invited peer-reviewed papers only
Author | : Ying Gao |
Publisher | : |
Total Pages | : 242 |
Release | : 1997 |
Genre | : |
ISBN | : |
Author | : Kalyan Raju Cherukuvada |
Publisher | : |
Total Pages | : 180 |
Release | : 2004 |
Genre | : |
ISBN | : |
Single crystalline 3C-SiC layers were grown on a porous Si seed using a single gas source, trimethylsilane. The method is environmentally friendly, utilizes a non-toxic gas, and is economical. Conversion of porous Si into SiC was also attempted using methane but the process did not lead to the formation of continuous layers. The porous Si layers were made by anodizing p-type Si (100) wafers in a mixture of hydrofluoric acid and ethanol. The SiC was grown in a UHV system that was converted into a low pressure CVD reactor and was fitted with a RF heating stage capable of heating the samples up to 1200 [superscript]oC. The formation of stoichiometric SiC was confirmed by Energy Dispersive Spectrometry (EDS) while the crystal structure was examined by X-ray diffraction. Atomic force microscopy (AFM) showed the formation of rough surfaces for thin SiC layers and large flat terraces for thick SiC layers. X-ray diffraction indicates the formation of fully relaxed single crystalline 3C-SIC (100) on Si (100) wafers. And it also suggests the presence of dominating SiC (100) crystal orientations within the layer.
Author | : John H. Goldsmith |
Publisher | : |
Total Pages | : 162 |
Release | : 2008 |
Genre | : |
ISBN | : |
Epitaxial silicon carbide (SiC) was grown using chemical vapor deposition (CVD) on silicon substrates with Aluminum Nitride (AIN) buffer layers. Subsequent films where characterized by Raman Spectroscopy, Scanning Electron microscopy, Atomic Force microscopy, and X-ray diffraction. There is a large lattice mismatch between SiC and silicon, by introducing an AIN buffer layer, which has a close lattice match to SiC, the strain on the film is reduced and hence the density of defects is reduced. Trimethylsilane, an relatively inert alternative to silane, was used as the precursor providing both the required silicon and carbon atoms.
Author | : Konstantinos Zekentes |
Publisher | : Materials Research Forum LLC |
Total Pages | : 249 |
Release | : 2018-09-20 |
Genre | : Technology & Engineering |
ISBN | : 1945291850 |
The rapidly advancing Silicon Carbide technology has a great potential in high temperature and high frequency electronics. High thermal stability and outstanding chemical inertness make SiC an excellent material for high-power, low-loss semiconductor devices. The present volume presents the state of the art of SiC device fabrication and characterization. Topics covered include: SiC surface cleaning and etching techniques; electrical characterization methods and processing of ohmic contacts to silicon carbide; analysis of contact resistivity dependence on material properties; limitations and accuracy of contact resistivity measurements; ohmic contact fabrication and test structure design; overview of different metallization schemes and processing technologies; thermal stability of ohmic contacts to SiC, their protection and compatibility with device processing; Schottky contacts to SiC; Schottky barrier formation; Schottky barrier inhomogeneity in SiC materials; technology and design of 4H-SiC Schottky and Junction Barrier Schottky diodes; Si/SiC heterojunction diodes; applications of SiC Schottky diodes in power electronics and temperature/light sensors; high power SiC unipolar and bipolar switching devices; different types of SiC devices including material and technology constraints on device performance; applications in the area of metal contacts to silicon carbide; status and prospects of SiC power devices.