Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Energy Efficient and Reliable Embedded Nanoscale SRAM Design
Author: Bhupendra Singh Reniwal
Publisher:
Total Pages: 0
Release: 2023
Genre: Computers
ISBN: 9781003213451

"This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate, graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering"--

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Energy Efficient and Reliable Embedded Nanoscale SRAM Design
Author: Bhupendra Singh Reniwal
Publisher: CRC Press
Total Pages: 213
Release: 2023-11-30
Genre: Technology & Engineering
ISBN: 1000985156

This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.

Energy-Efficient Fault-Tolerant Systems

Energy-Efficient Fault-Tolerant Systems
Author: Jimson Mathew
Publisher: Springer Science & Business Media
Total Pages: 347
Release: 2013-09-07
Genre: Technology & Engineering
ISBN: 1461441935

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms

Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms
Author: William Fornaciari
Publisher: Springer
Total Pages: 320
Release: 2018-10-23
Genre: Technology & Engineering
ISBN: 3319919628

This book describes the state-of-the art of industrial and academic research in the architectural design of heterogeneous, multi/many-core processors. The authors describe methods and tools to enable next-generation embedded and high-performance heterogeneous processors to confront cost-effectively the inevitable variations by providing Dependable-Performance: correct functionality and timing guarantees throughout the expected lifetime of a platform under thermal, power, and energy constraints. Various aspects of the reliability problem are discussed, at both the circuit and architecture level, the intelligent selection of knobs and monitors in multicore platforms, and systematic design methodologies. The authors demonstrate how new techniques have been applied in real case studies from different applications domain and report on results and conclusions of those experiments. Enables readers to develop performance-dependable heterogeneous multi/many-core architectures Describes system software designs that support high performance dependability requirements Discusses and analyzes low level methodologies to tradeoff conflicting metrics, i.e. power, performance, reliability and thermal management Includes new application design guidelines to improve performance dependability

Low-Power Variation-Tolerant Design in Nanometer Silicon

Low-Power Variation-Tolerant Design in Nanometer Silicon
Author: Swarup Bhunia
Publisher: Springer Science & Business Media
Total Pages: 444
Release: 2010-11-10
Genre: Technology & Engineering
ISBN: 1441974180

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

Computer Memory and Data Storage

Computer Memory and Data Storage
Author: Azam Seyedi
Publisher: BoD – Books on Demand
Total Pages: 86
Release: 2024-01-10
Genre: Computers
ISBN: 1803555882

Computer Memory and Data Storage presents a comprehensive exploration of the intricacies of memory design, delving into the challenges and advanced techniques involved in optimizing power consumption, performance, reliability, and data integrity. The chapters provide a complete understanding of modern memory technologies, ranging from radiation-hardened memory for space applications to diverse memory designs and their trade-offs.

Robust SRAM Designs and Analysis

Robust SRAM Designs and Analysis
Author: Jawar Singh
Publisher: Springer Science & Business Media
Total Pages: 176
Release: 2012-08-01
Genre: Technology & Engineering
ISBN: 1461408180

This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.

Low Power and Reliable SRAM Memory Cell and Array Design

Low Power and Reliable SRAM Memory Cell and Array Design
Author: Koichiro Ishibashi
Publisher: Springer Science & Business Media
Total Pages: 154
Release: 2011-08-18
Genre: Technology & Engineering
ISBN: 3642195687

Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advanced CMOS technology. To study LSI design, SRAM cell design is the best materials subject because issues about variability, leakage and reliability have to be taken into account for the design.

Nanoscale Devices

Nanoscale Devices
Author: Brajesh Kumar Kaushik
Publisher: CRC Press
Total Pages: 414
Release: 2018-11-16
Genre: Science
ISBN: 1351670212

The primary aim of this book is to discuss various aspects of nanoscale device design and their applications including transport mechanism, modeling, and circuit applications. . Provides a platform for modeling and analysis of state-of-the-art devices in nanoscale regime, reviews issues related to optimizing the sub-nanometer device performance and addresses simulation aspect and/or fabrication process of devices Also, includes design problems at the end of each chapter

Embedded Memory Design for Multi-Core and Systems on Chip

Embedded Memory Design for Multi-Core and Systems on Chip
Author: Baker Mohammad
Publisher: Springer Science & Business Media
Total Pages: 104
Release: 2013-10-22
Genre: Technology & Engineering
ISBN: 1461488818

This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.