Design Of Reliable And Energy Efficient Nanoscale Integrated Systems
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Author | : Bhupendra Singh Reniwal |
Publisher | : CRC Press |
Total Pages | : 213 |
Release | : 2023-11-30 |
Genre | : Technology & Engineering |
ISBN | : 1000985156 |
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.
Author | : Masanori Hashimoto |
Publisher | : McGraw Hill Professional |
Total Pages | : 417 |
Release | : 2014-03-07 |
Genre | : Technology & Engineering |
ISBN | : 0071787771 |
Proven methods for noise-tolerant nanoscale integrated circuit design This leading-edge guide discusses the impact of power integrity from a design perspective, emphasizing phenomena and problems induced by power integrity degradation and the latest design trends, including low-power design. Power Integrity for Nanoscale Integrated Systems describes how these problems can be forecast early in the design process and the countermeasures that can be used to address them, such as the inclusion of inductance and accurate modeling for PI analysis, as well as robust circuit design. Detailed examples and a case study on the IBM POWER7+ processor illustrate real-world applications of the techniques presented in this practical resource. Coverage includes: Significance of power integrity for integrated circuits Supply and substrate noise impact on circuits Clock generation and distribution with power integrity Signal and power integrity design for I/O circuits Power integrity degradation and modeling Lumped, distributed, and 3D modeling for power integrity Chip temperature and PI impact Low-power techniques and PI impact Power integrity case study using the IBM POWER7+ processor chip Carbon nanotube interconnects for power delivery
Author | : Mohsen Raji |
Publisher | : Springer Nature |
Total Pages | : 113 |
Release | : 2022-11-16 |
Genre | : Technology & Engineering |
ISBN | : 3031153456 |
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Author | : Marco Ottavi |
Publisher | : Springer |
Total Pages | : 294 |
Release | : 2017-08-28 |
Genre | : Technology & Engineering |
ISBN | : 3319544225 |
This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
Author | : Sang C. Suh |
Publisher | : Springer |
Total Pages | : 262 |
Release | : 2018-01-15 |
Genre | : Computers |
ISBN | : 331963917X |
This book provides users with cutting edge methods and technologies in the area of big data and visual analytics, as well as an insight to the big data and data analytics research conducted by world-renowned researchers in this field. The authors present comprehensive educational resources on big data and visual analytics covering state-of-the art techniques on data analytics, data and information visualization, and visual analytics. Each chapter covers specific topics related to big data and data analytics as virtual data machine, security of big data, big data applications, high performance computing cluster, and big data implementation techniques. Every chapter includes a description of an unique contribution to the area of big data and visual analytics. This book is a valuable resource for researchers and professionals working in the area of big data, data analytics, and information visualization. Advanced-level students studying computer science will also find this book helpful as a secondary textbook or reference.
Author | : Xinfei Guo |
Publisher | : Springer |
Total Pages | : 215 |
Release | : 2019-06-12 |
Genre | : Technology & Engineering |
ISBN | : 3030200515 |
This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
Author | : Brajesh Kumar Kaushik |
Publisher | : CRC Press |
Total Pages | : 414 |
Release | : 2018-11-16 |
Genre | : Science |
ISBN | : 1351670212 |
The primary aim of this book is to discuss various aspects of nanoscale device design and their applications including transport mechanism, modeling, and circuit applications. . Provides a platform for modeling and analysis of state-of-the-art devices in nanoscale regime, reviews issues related to optimizing the sub-nanometer device performance and addresses simulation aspect and/or fabrication process of devices Also, includes design problems at the end of each chapter
Author | : Ishfaq Ahmad |
Publisher | : CRC Press |
Total Pages | : 621 |
Release | : 2013-01-31 |
Genre | : Computers |
ISBN | : 1466501138 |
This book provides basic and fundamental knowledge of various aspects of energy-aware computing at the component, software, and system level. It provides a broad range of topics dealing with power-, energy-, and temperature-related research areas for individuals from industry and academia.
Author | : Phan Cong-Vinh |
Publisher | : CRC Press |
Total Pages | : 288 |
Release | : 2018-09-03 |
Genre | : Computers |
ISBN | : 1439829136 |
Despite the growing mainstream importance and unique advantages of autonomic networking-on-chip (ANoC) technology, Autonomic Networking-On-Chip: Bio-Inspired Specification, Development, and Verification is among the first books to evaluate research results on formalizing this emerging NoC paradigm, which was inspired by the human nervous system. The FIRST Book to Assess Research Results, Opportunities, & Trends in "BioChipNets" The third book in the Embedded Multi-Core Systems series from CRC Press, this is an advanced technical guide and reference composed of contributions from prominent researchers in industry and academia around the world. A response to the critical need for a global information exchange and dialogue, it is written for engineers, scientists, practitioners, and other researchers who have a basic understanding of NoC and are now ready to learn how to specify, develop, and verify ANoC using rigorous approaches. Offers Expert Insights Into Technical Topics Including: Bio-inspired NoC How to map applications onto ANoC ANoC for FPGAs and structured ASICs Methods to apply formal methods in ANoC development Ways to formalize languages that enable ANoC Methods to validate and verify techniques for ANoC Use of "self-" processes in ANoC (self-organization, configuration, healing, optimization, protection, etc.) Use of calculi for reasoning about context awareness and programming models in ANoC With illustrative figures to simplify contents and enhance understanding, this resource contains original, peer-reviewed chapters reporting on new developments and opportunities, emerging trends, and open research problems of interest to both the autonomic computing and network-on-chip communities. Coverage includes state-of-the-art ANoC architectures, protocols, technologies, and applications. This volume thoroughly explores the theory behind ANoC to illustrate strategies that enable readers to use formal ANoC methods yet still make sound judgments and allow for reasonable justifications in practice.
Author | : M. Anusuya |
Publisher | : CRC Press |
Total Pages | : 427 |
Release | : 2024-11-27 |
Genre | : Science |
ISBN | : 104012108X |
This book provides a comprehensive review of nanomaterials, including essential foundational examples of nanosensors, smart nanomaterials, nanopolymers, and nanotubes. Chapters cover their synthesis and characteristics, production methods, and applications, with specific sections exploring nanoelectronics and electro-optic nanotechnology, nanostructures, and nanodevices. This book is a valuable resource for interdisciplinary researchers who want to learn more about the synthesis of nanomaterials and how they are used in different types of energy storage devices, including supercapacitors, batteries, fuel cells solar cells in addition to electrical, chemical, and biomedical engineering. Key Features: Comprehensive overview of how nanomaterials can be utilised in a variety of interdisciplinary applications Explores the fundamental theories, alongside their electrochemical mechanisms and computation Discusses recent developments in electrode designing based on nanomaterials, separators, and the fabrication of advanced devices and their performances