Conductive Atomic Force Microscopy

Conductive Atomic Force Microscopy
Author: Mario Lanza
Publisher: John Wiley & Sons
Total Pages: 382
Release: 2017-12-04
Genre: Science
ISBN: 3527340912

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Electrical Atomic Force Microscopy for Nanoelectronics

Electrical Atomic Force Microscopy for Nanoelectronics
Author: Umberto Celano
Publisher: Springer
Total Pages: 424
Release: 2019-08-01
Genre: Science
ISBN: 3030156125

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Atomic Force Microscopy

Atomic Force Microscopy
Author: Wesley C. Sanders
Publisher: CRC Press
Total Pages: 140
Release: 2019-10-08
Genre: Technology & Engineering
ISBN: 1000707946

This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.

Conductive Atomic Force Microscopy

Conductive Atomic Force Microscopy
Author: Mario Lanza
Publisher: John Wiley & Sons
Total Pages: 385
Release: 2017-08-07
Genre: Science
ISBN: 3527699783

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Organic Electronics II

Organic Electronics II
Author: Hagen Klauk
Publisher: John Wiley & Sons
Total Pages: 443
Release: 2012-04-09
Genre: Technology & Engineering
ISBN: 3527640223

Like its predecessor this book is devoted to the materials, manufacturing and applications aspects of organic thin-film transistors. Once again authored by the most renowned experts from this fascinating and fast-moving area of research, it offers a joint perspective both broad and in-depth on the latest developments in the areas of materials chemistry, transport physics, materials characterization, manufacturing technology, and circuit integration of organic transistors. With its many figures and detailed index, this book once again also serves as a ready reference.

Atomic Force Microscopy

Atomic Force Microscopy
Author: Peter Eaton
Publisher: Oxford University Press
Total Pages: 257
Release: 2010-03-25
Genre: Science
ISBN: 0199570450

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Lifetime Spectroscopy

Lifetime Spectroscopy
Author: Stefan Rein
Publisher: Springer Science & Business Media
Total Pages: 513
Release: 2005-11-25
Genre: Science
ISBN: 3540279229

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

Encyclopedia of Tribology

Encyclopedia of Tribology
Author: Q. Jane Wang
Publisher: Springer
Total Pages: 4139
Release: 2013-09-26
Genre: Technology & Engineering
ISBN: 9780387928982

TRIBOLOGY – the study of friction, wear and lubrication – impacts almost every aspect of our daily lives. The Springer Encyclopedia of Tribology is an authoritative and comprehensive reference covering all major aspects of the science and engineering of tribology that are relevant to researchers across all engineering industries and related scientific disciplines. This is the first major reference that brings together the science, engineering and technological aspects of tribology of this breadth and scope in a single work. Developed and written by leading experts in the field, the Springer Encyclopedia of Tribology covers the fundamentals as well as advanced applications across material types, different length and time scales, and encompassing various engineering applications and technologies. Exciting new areas such as nanotribology, tribochemistry and biotribology have also been included. As a six-volume set, the Springer Encyclopedia of Tribology comprises 1630 entries written by authoritative experts in each subject area, under the guidance of an international panel of key researchers from academia, national laboratories and industry. With alphabetically-arranged entries, concept diagrams and cross-linking features, this comprehensive work provides easy access to essential information for both researchers and practicing engineers in the fields of engineering (aerospace, automotive, biomedical, chemical, electrical, and mechanical) as well as materials science, physics, and chemistry.

Surface Analysis with STM and AFM

Surface Analysis with STM and AFM
Author: Sergei N. Magonov
Publisher: John Wiley & Sons
Total Pages: 335
Release: 2008-09-26
Genre: Technology & Engineering
ISBN: 3527615105

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

The Physics of Semiconductors

The Physics of Semiconductors
Author: Marius Grundmann
Publisher: Springer Nature
Total Pages: 905
Release: 2021-03-06
Genre: Technology & Engineering
ISBN: 3030515699

The 4th edition of this highly successful textbook features copious material for a complete upper-level undergraduate or graduate course, guiding readers to the point where they can choose a specialized topic and begin supervised research. The textbook provides an integrated approach beginning from the essential principles of solid-state and semiconductor physics to their use in various classic and modern semiconductor devices for applications in electronics and photonics. The text highlights many practical aspects of semiconductors: alloys, strain, heterostructures, nanostructures, amorphous semiconductors, and noise, which are essential aspects of modern semiconductor research but often omitted in other textbooks. This textbook also covers advanced topics, such as Bragg mirrors, resonators, polarized and magnetic semiconductors, nanowires, quantum dots, multi-junction solar cells, thin film transistors, and transparent conductive oxides. The 4th edition includes many updates and chapters on 2D materials and aspects of topology. The text derives explicit formulas for many results to facilitate a better understanding of the topics. Having evolved from a highly regarded two-semester course on the topic, The Physics of Semiconductors requires little or no prior knowledge of solid-state physics. More than 2100 references guide the reader to historic and current literature including original papers, review articles and topical books, providing a go-to point of reference for experienced researchers as well.