Compact Plasma And Focused Ion Beams
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Author | : Sudeep Bhattacharjee |
Publisher | : Taylor & Francis |
Total Pages | : 390 |
Release | : 2013-12-12 |
Genre | : Science |
ISBN | : 1466557923 |
Recent research has brought the application of microwaves from the classical fields of heating, communication, and generation of plasma discharges into the generation of compact plasmas that can be used for applications such as FIB and small plasma thrusters. However, these new applications bring with them a new set of challenges. With coverage ran
Author | : Lucille A. Giannuzzi |
Publisher | : Springer Science & Business Media |
Total Pages | : 362 |
Release | : 2006-05-18 |
Genre | : Science |
ISBN | : 038723313X |
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Author | : |
Publisher | : |
Total Pages | : 1470 |
Release | : 1989 |
Genre | : Power resources |
ISBN | : |
Author | : Michael K. Miller |
Publisher | : Springer Science & Business Media |
Total Pages | : 247 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461542812 |
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Author | : National Research Council |
Publisher | : National Academies Press |
Total Pages | : 177 |
Release | : 2003-05-11 |
Genre | : Science |
ISBN | : 030908637X |
Recent scientific and technical advances have made it possible to create matter in the laboratory under conditions relevant to astrophysical systems such as supernovae and black holes. These advances will also benefit inertial confinement fusion research and the nation's nuclear weapon's program. The report describes the major research facilities on which such high energy density conditions can be achieved and lists a number of key scientific questions about high energy density physics that can be addressed by this research. Several recommendations are presented that would facilitate the development of a comprehensive strategy for realizing these research opportunities.
Author | : Jon Orloff |
Publisher | : Springer Science & Business Media |
Total Pages | : 304 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461507650 |
In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.
Author | : |
Publisher | : |
Total Pages | : 300 |
Release | : 1995 |
Genre | : Aeronautics |
ISBN | : |
Author | : Jon Orloff |
Publisher | : CRC Press |
Total Pages | : 666 |
Release | : 2017-12-19 |
Genre | : Science |
ISBN | : 1420045555 |
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Author | : Zengliang Yu |
Publisher | : Springer |
Total Pages | : 0 |
Release | : 2014-11-05 |
Genre | : Science |
ISBN | : 9781489999214 |
Introduction to Ion Bean Biotechnology presents an comprehensive primer on radiation-induced mutations and implantation of charged particles altering biological development. As such, its one of the most intriging and leading tools in bioengineering cells. IIBB cover the physics of ions particles, the biological effects of ion implantations in cells, and the subsequent use in bacteria, in viruses, and in plants. IIBB covers important areas: Inducing genetic mutations on the molecular level Inducing cells to catalyze targeted gene transfer Ion beam technology is a new area, still very young IIBB will be essentinal reading for any student, reseacher, or industry professional seeking to understand and master the mechanisms of such mutations.
Author | : Michael Nastasi |
Publisher | : Cambridge University Press |
Total Pages | : 572 |
Release | : 1996-03-29 |
Genre | : Science |
ISBN | : 052137376X |
Comprehensive guide to an important materials science technique for students and researchers.