Auger Electron Spectroscopy Study Of Surface Segregation In Copper Aluminum Alloys
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Author | : John Ferrante |
Publisher | : |
Total Pages | : 28 |
Release | : 1970 |
Genre | : Aluminum-copper alloys |
ISBN | : |
Surface segregation of aluminum has been observed in copper-aluminum alloys by use of LEED and Auger electron spectroscopy studies. The alloys were solid solutions of aluminum in copper having compositions of 1, 5, and 10 atomic percent aluminum. All samples were single crystals oriented in the (111) direction. Surface concentrations five times that in the bulk were observed. LEED and characteristic loss data gave confirming evidence of surface composition changes. Surface concentration increased with temperature on heating to 700 [degree] C.
Author | : John Ferrante |
Publisher | : |
Total Pages | : 28 |
Release | : 1973 |
Genre | : Auger effect |
ISBN | : |
Auger electron spectroscopy was used to examine surface segregation in the binary alloys copper-1 at. % indium, copper-2 at. % tin and iron-6.55 at. % silicon. The copper-tin and copper-indium alloys were single crystals oriented with the /111/ direction normal to the surface. An iron-6.5 at. % silicon alloy was studied (a single crystal oriented in the /100/ direction for study of a (100) surface). It was found that surface segregation occurred following sputtering in all cases. Only the iron-silicon single crystal alloy exhibited equilibrium segregation (i.e., reversibility of surface concentration with temperature) for which at present we have no explanation. McLean's analysis for equilibrium segregation at grain boundaries did not apply to the present results, despite the successful application to dilute copper-aluminum alloys. The relation of solute atomic size and solubility to surface segregation is discussed. Estimates of the depth of segregation in the copper-tin alloy indicate that it is of the order of a monolayer surface film.
Author | : Donald T. Hawkins |
Publisher | : Springer Science & Business Media |
Total Pages | : 305 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1468413872 |
Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.
Author | : |
Publisher | : |
Total Pages | : 818 |
Release | : 1973 |
Genre | : Aeronautics |
ISBN | : |
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author | : Joseph R. Stephens |
Publisher | : |
Total Pages | : 892 |
Release | : 1970 |
Genre | : Microstructure |
ISBN | : |
An investigation was conducted to determine the effect of temperature and composition on alloy softening in group VIA metals Cr, Mo, and W alloyed with Re. Results showed that alloy softening was similar in all three alloy systems occurring at homologous temperatures less than 0.16 and at Re concentrations less than 16 atom percent. Rhenium content required to produce a hardness minimum diminished rapidly in all three systems with increasing test temperature. The similarities in hardness behavior in these three alloy systems suggesat common softening mechanism which may arise from lowering the Peierls stress.
Author | : |
Publisher | : |
Total Pages | : 480 |
Release | : 1973 |
Genre | : |
ISBN | : |
Author | : Philip F. Kane |
Publisher | : Springer Science & Business Media |
Total Pages | : 675 |
Release | : 2013-11-27 |
Genre | : Technology & Engineering |
ISBN | : 1461344905 |
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Author | : Milenko Braunovic |
Publisher | : CRC Press |
Total Pages | : 672 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 0849391083 |
Various factors affect the performance of electrical contacts, including tribological, mechanical, electrical, and materials aspects. Although these behaviors have been studied for many years, they are not widely used or understood in practice. Combining approaches used across the globe, Electrical Contacts: Fundamentals, Applications, and Technology integrates advances in research and development in the tribological, material, and analytical aspects of electrical contacts with new data on electrical current transfer at the micro- and nanoscales. Taking an application-oriented approach, the authors illustrate how material characteristics, tribological behavior, and loading impact the degradation of contacts, formation of intermetallics, and overall reliability and performance. Coverage is divided broadly into three sections, with the first focused on mechanics, tribology, materials, current and heat transfer, and basic reliability issues of electrical contacts. The next section explores applications, such as power connections, electronic connections, and sliding contacts, while the final section presents the diagnostic and monitoring techniques used to investigate and measure phenomena occurring at electrical contact interfaces. Numerous references to current literature reflect the fact that this book is the most comprehensive survey in the field. Explore an impressive collection of data, theory, and practical applications in Electrical Contacts: Fundamentals, Applications, and Technology, a critical tool for anyone investigating or designing electrical equipment with improved performance and reliability in mind.
Author | : United States. National Bureau of Standards |
Publisher | : |
Total Pages | : 404 |
Release | : 1987 |
Genre | : |
ISBN | : |
Author | : National Institute of Standards and Technology (U.S.) |
Publisher | : |
Total Pages | : 406 |
Release | : 1988 |
Genre | : |
ISBN | : |