Atomic Scale Structural And Electronic Properties Of Semiconductor Heterostructures
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Characterization of Semiconductor Heterostructures and Nanostructures
Author | : Giovanni Agostini |
Publisher | : Elsevier |
Total Pages | : 501 |
Release | : 2011-08-11 |
Genre | : Science |
ISBN | : 0080558151 |
In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. - Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures - Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field - Each chapter starts with a didactic introduction on the technique - The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors
Characterization of Semiconductor Heterostructures and Nanostructures
Author | : Maria Peressi |
Publisher | : Elsevier Inc. Chapters |
Total Pages | : 88 |
Release | : 2013-04-11 |
Genre | : Science |
ISBN | : 0128083352 |
Characterization of Semiconductor Heterostructures and Nanostructures
Author | : Giovanni Agostini |
Publisher | : Newnes |
Total Pages | : 829 |
Release | : 2013-04-11 |
Genre | : Technology & Engineering |
ISBN | : 044459549X |
Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling. The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology. Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures
Atomic-Scale Analytical Tomography
Author | : Thomas F. Kelly |
Publisher | : Cambridge University Press |
Total Pages | : |
Release | : 2022-03-24 |
Genre | : Technology & Engineering |
ISBN | : 1009254863 |
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
Characterization of Semiconductor Heterostructures and Nanostructures
Author | : Carlo Lamberti |
Publisher | : Elsevier |
Total Pages | : 512 |
Release | : 2008-08-19 |
Genre | : Architecture |
ISBN | : |
- Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures. - Most of the chapters are authored by scientists that are world wide among the top-ten in publication ranking of the specific field. - Each chapter starts with a didactic introduction on the technique. - The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures.
Proceedings of 16th World Nano Conference 2017
Author | : ConferenceSeries |
Publisher | : ConferenceSeries |
Total Pages | : 97 |
Release | : 2017-05-30 |
Genre | : Technology & Engineering |
ISBN | : |
June 05-06, 2017 Milan, Italy Key Topics : Nanoscience and Technology, Nano Medicine, Nano Electronics, Molecular Nanotechnology, Nano Toxicology, Nano Topography, Nano Fluidics, Nano Weapons, Nano Biotechnology, Nanotechnology in Water treatment, Nano Composites, Nanoscale, Advanced Nanomaterials, Nanotech for Energy and Environment, Nano Computational Modelling, Nano Materials Synthesis and Characterisation, Nanobiomaterials, Molecular Mimics, Nanotechnology Safety, Nanophotonics, Nanotechnology and Cosmetics, Nanotechnology in Tissue Engineering, Nanotechnology in Agriculture and Food Industry,
Band Structure Engineering in Semiconductor Microstructures
Author | : R.A. Abram |
Publisher | : Springer Science & Business Media |
Total Pages | : 383 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1475707703 |
This volume contains the proceedings of the NATO Advanced Research Workshop on Band Structure Engineering in Semiconductor Microstructures held at Il Ciocco, Castelvecchio Pascali in Tuscany between 10th and 15th April 1988. Research on semiconductor microstructures has expanded rapidly in recent years as a result of developments in the semiconductor growth and device fabrication technologies. The emergence of new semiconductor structures has facilitated a number of approaches to producing systems with certain features in their electronic structure which can lead to useful or interesting properties. The interest in band structure engineering has stimd ated a variety of physical investigations and nove 1 device concepts and the field now exhibits a fascinating interplay betwepn pure physics and device technology. Devices based on microstruc tures are useful vehicles for fundamental studies but also new device ideas require a thorough understanding of the basic physics. Around forty researchers gathered at I1 Ciocco in the Spring of 1988 to discuss band structure engineering in semiconductor microstructures.
Transmission Electron Microscopy Characterization of Nanomaterials
Author | : Challa S.S.R. Kumar |
Publisher | : Springer Science & Business Media |
Total Pages | : 718 |
Release | : 2013-12-09 |
Genre | : Science |
ISBN | : 3642389341 |
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.