A Dark Trace
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Author | : Herman Westerink |
Publisher | : Leuven University Press |
Total Pages | : 333 |
Release | : 2009 |
Genre | : Guilt |
ISBN | : 9058677540 |
Figures of the Unconscious, No. 8Sigmund Freud, in his search for the origins of the sense of guilt in individual life and culture, regularly speaks of "reading a dark trace," thus referring to the Oedipus myth as a myth about the problem of human guilt. In Freud's view, this sense of guilt is a trace, a path, that leads deep into the individual's mental state, into childhood memories, and into the prehistory of culture and religion. Herman Westerink follows this trace and analyzes Freud's thought on the sense of guilt as a central issue in his work, from the earliest studies on the moral and "guilty" characters of the hysterics, via later complex differentiations within the concept of the sense of guilt, and finally to Freud's conception of civilization's discontents and Jewish sense of guilt. The sense of guilt is a key issue in Freudian psychoanalysis, not only in relation to other key concepts in psychoanalytic theory but also in relation to Freud's debates with other psychoanalysts, including Carl Jung and Melanie Klein.
Author | : Joseph O'Neill |
Publisher | : Vintage |
Total Pages | : 352 |
Release | : 2010-10-05 |
Genre | : History |
ISBN | : 0307742652 |
From the bestselling and PEN/Faulkner Award-winning author of Netherland, a fascinating, personal, and beautifully crafted family history. Joseph O'Neill's grandfathers--one Turkish, one Irish--were both imprisoned for suspected subversion during the Second World War. The Irish grandfather, a handsome rogue from a family of small farmers, was an active member of the IRA. O'Neill's other grandfather, a debonair hotelier from the tiny and threatened Turkish Christian minority, was interned by the British in Palestine on suspicion of being an Axis spy. With intellect, compassion, and grace, O'Neill sets the stories of these individuals against the history of the last century's most inhuman events.
Author | : Josef CZECH |
Publisher | : Springer |
Total Pages | : 631 |
Release | : 2013-12-21 |
Genre | : Science |
ISBN | : 366239653X |
Author | : Defense Documentation Center (U.S.) |
Publisher | : |
Total Pages | : 336 |
Release | : 1961 |
Genre | : Information display systems |
ISBN | : |
Author | : Thomas Andrews Hendricks |
Publisher | : |
Total Pages | : 640 |
Release | : 1937 |
Genre | : Coal |
ISBN | : |
Author | : Carle Hamilton Dane |
Publisher | : |
Total Pages | : 394 |
Release | : 1939 |
Genre | : Coal |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 392 |
Release | : 1939 |
Genre | : Geology |
ISBN | : |
Author | : Tatyana Volk |
Publisher | : Springer Science & Business Media |
Total Pages | : 258 |
Release | : 2008-09-13 |
Genre | : Technology & Engineering |
ISBN | : 3540707662 |
This book covers new research on LiNbO3 including current studies on intrinsic and extrinsic point defects and the contribution of intrinsic defects to photoinduced charge transport. Applications of this material are also discussed.
Author | : Herbert Herman |
Publisher | : Elsevier |
Total Pages | : 305 |
Release | : 2013-10-22 |
Genre | : Technology & Engineering |
ISBN | : 1483218147 |
Treatise on Materials Science and Technology, Volume 5 covers the areas of thermodynamics, radiation effects, and mechanical properties. The book presents articles on solution thermodynamics; and on a fundamental and applied approach to the study of radiation-induced color centers. The text also includes articles on the basic types of metal fatigue and on the relationship between atomic order and the mechanical properties of alloys. Professional scientists and engineers, as well as graduate students in materials science and associated fields will find the book invaluable.
Author | : Joel P. Dunsmore |
Publisher | : John Wiley & Sons |
Total Pages | : 852 |
Release | : 2020-06-29 |
Genre | : Technology & Engineering |
ISBN | : 1119477131 |
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.