Vlsi Design And Test For Systems Dependability
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| Author | : Shojiro Asai |
| Publisher | : Springer |
| Total Pages | : 792 |
| Release | : 2018-07-20 |
| Genre | : Technology & Engineering |
| ISBN | : 4431565949 |
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
| Author | : Raimund Ubar |
| Publisher | : IGI Global |
| Total Pages | : 550 |
| Release | : 2011-01-01 |
| Genre | : Computers |
| ISBN | : 1609602145 |
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
| Author | : Masakazu Aono |
| Publisher | : Springer Nature |
| Total Pages | : 270 |
| Release | : 2020-03-02 |
| Genre | : Science |
| ISBN | : 303034875X |
Written by the inventors and leading experts of this new field, the book results from the International Symposium on “Atomic Switch: Invention, Practical use and Future Prospects” which took place in Tsukuba, Japan on March 27th - 28th, 2017. The book chapters cover the different trends from the science and technology of atomic switches to their applications like brain-type information processing, artificial intelligence (AI) and completely novel functional electronic nanodevices. The current practical uses of the atomic switch are also described. As compared with the conventional semiconductor transistor switch, the atomic switch is more compact (~1/10) with much lower power consumption (~1/10) and scarcely influenced by strong electromagnetic noise and radiation including cosmic rays in space (~1/100). As such, this book is of interest to researchers, scholars and students willing to explore new materials, to refine the nanofabrication methods and to explore new and efficient device architectures.
| Author | : Bernd Finkbeiner |
| Publisher | : Springer Nature |
| Total Pages | : 531 |
| Release | : 2022-01-13 |
| Genre | : Computers |
| ISBN | : 3030945839 |
This book constitutes the proceedings of the 23rd International Conference on Verification, Model Checking, and Abstract Interpretation, VMCAI 2022, which took place in Philadelphia, PA, USA, in January 2022. The 22 papers presented in this volume were carefully reviewed from 48 submissions. VMCAI provides a forum for researchers working on verification, model checking, and abstract interpretation and facilitates interaction, cross-fertilization, and advancement of hybrid methods that combine these and related areas.
| Author | : Mellal, Mohamed Arezki |
| Publisher | : IGI Global |
| Total Pages | : 293 |
| Release | : 2019-12-27 |
| Genre | : Computers |
| ISBN | : 1799817202 |
Technology in today’s world has continued to develop into multifaceted structures. The performance of computers, specifically, has significantly increased leading to various and complex problems regarding the dependability of these systems. Recently, solutions for these issues have been based on soft computing methods; however, there lacks a considerable amount of research on the applications of these techniques within system dependability. Soft Computing Methods for System Dependability is a collection of innovative research on the applications of these processing techniques for solving problems within the dependability of computer system performance. This book will feature comparative experiences shared by researchers regarding the development of these technological solutions. While highlighting topics including evolutionary computing, chaos theory, and artificial neural networks, this book is ideally designed for researchers, data scientists, computing engineers, industrialists, students, and academicians in the field of computer science.
| Author | : Mario Tokoro |
| Publisher | : CRC Press |
| Total Pages | : 189 |
| Release | : 2012-10-12 |
| Genre | : Computers |
| ISBN | : 1466577525 |
This book describes how to achieve dependability in information systems. The author first proposes viewing systems as open systems instead of closed systems and presents Open Systems Dependability as a property for a system that has the ability to provide optimal services, minimize damage when stoppages occur, resume services quickly, and achieve a
| Author | : Andrzej Hlawiczka |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 468 |
| Release | : 1996-09-18 |
| Genre | : Computers |
| ISBN | : 9783540617723 |
This book constitutes the refereed proceedings of the Second European Dependable Computing Conference, EDCC-2, held in Taormina, Italy, in October 1996. The book presents 26 revised full papers selected from a total of 66 submissions based on the reviews of 146 referees. The papers are organized in sections on distributed fault tolerance, fault injection, modelling and evaluation, fault-tolerant design, basic hardware models, testing, verification, replication and distribution, and system level diagnosis.
| Author | : Marco Ottavi |
| Publisher | : Springer |
| Total Pages | : 294 |
| Release | : 2017-08-28 |
| Genre | : Technology & Engineering |
| ISBN | : 3319544225 |
This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
| Author | : Michael Nicolaidis |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 152 |
| Release | : 2013-03-09 |
| Genre | : Technology & Engineering |
| ISBN | : 1475760698 |
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
| Author | : Anup Kumar Das |
| Publisher | : Springer |
| Total Pages | : 158 |
| Release | : 2018-01-03 |
| Genre | : Technology & Engineering |
| ISBN | : 3319693743 |
This book discusses analysis, design and optimization techniques for streaming multiprocessor systems, while satisfying a given area, performance, and energy budget. The authors describe design flows for both application-specific and general purpose streaming systems. Coverage also includes the use of machine learning for thermal optimization at run-time, when an application is being executed. The design flow described in this book extends to thermal and energy optimization with multiple applications running sequentially and concurrently.
