Scanning Tunneling Microscopy I

Scanning Tunneling Microscopy I
Author: Hans-Joachim Güntherodt
Publisher: Springer Science & Business Media
Total Pages: 288
Release: 2013-03-13
Genre: Science
ISBN: 3642792553

Since the first edition of "Scanning 'funneling Microscopy I" has been pub lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur rent, which flows on application of a bias voltage, to sense the atomic and elec tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach.

Introduction to Scanning Tunneling Microscopy Third Edition

Introduction to Scanning Tunneling Microscopy Third Edition
Author: C. Julian Chen
Publisher: Oxford University Press
Total Pages: 523
Release: 2021-03-04
Genre: Technology & Engineering
ISBN: 0192598562

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.

Scanning Tunneling Microscopy I

Scanning Tunneling Microscopy I
Author: Hans-Joachim Güntherodt
Publisher: Springer Science & Business Media
Total Pages: 252
Release: 2012-12-06
Genre: Science
ISBN: 3642973434

Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment. In this volume the reader will find a detailed description of the technique itself and of its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original work will help to make accessible the vast body of knowledge already accumulated in this field.

Introduction to Scanning Tunneling Microscopy

Introduction to Scanning Tunneling Microscopy
Author: C. Julian Chen
Publisher: Oxford University Press
Total Pages: 472
Release: 1993-05-20
Genre: Science
ISBN: 0198023561

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Scanning Tunneling Microscopy in Surface Science, Nanoscience, and Catalysis

Scanning Tunneling Microscopy in Surface Science, Nanoscience, and Catalysis
Author: Michael Bowker
Publisher: John Wiley & Sons
Total Pages: 258
Release: 2009-11-11
Genre: Science
ISBN: 9783527628834

Here, top international authors in the field of STM and surface science present first-class contributions on this hot topic, bringing the reader up to date with the latest developments in this rapidly advancing field. The focus is on the nanoscale, particularly in relation to catalysis, involving developments in our understanding of the nature of the surfaces of oxides and nanoparticulate materials, as well as adsorption, and includes in-situ studies of catalysis on such model materials. Of high interest to practitioners of surface science, nanoscience, STM and catalysis.

Scanning Tunneling Microscopy and Its Application

Scanning Tunneling Microscopy and Its Application
Author: Chunli Bai
Publisher: Springer Science & Business Media
Total Pages: 392
Release: 2000-08-10
Genre: Medical
ISBN: 9783540657156

This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and methods, the book provides detailed accounts of STM applications. It examines limitations of the present-day investigations and provides insight into further trends. "I strongly recommend that Professor Bai's book be a part of any library that serves surface scientists, biochemists, biophysicists, material scientists, and students of any science or engineering field...There is no doubt that this is one of the better (most thoughtful) texts." Journal of the American Chemical Society (Review of 1/e)

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy
Author: H. Neddermeyer
Publisher: Springer Science & Business Media
Total Pages: 275
Release: 2012-12-06
Genre: Science
ISBN: 9401118124

The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.

Scanning Tunneling Microscopy and Related Methods

Scanning Tunneling Microscopy and Related Methods
Author: R.J. Behm
Publisher: Springer Science & Business Media
Total Pages: 516
Release: 2013-03-09
Genre: Science
ISBN: 9401578710

Proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy, Erice, Italy, April 17-29, 1989

Low Temperature Scanning Tunneling Microscopy Studies of Single Molecules Adsorbed on Thin Insulating Films

Low Temperature Scanning Tunneling Microscopy Studies of Single Molecules Adsorbed on Thin Insulating Films
Author:
Publisher:
Total Pages: 120
Release: 2008
Genre:
ISBN:

The present work is concentrated on the study of two isomers of an organic molecule -methylterrylene- adsorbed on a thin insulating _lm (a NaCl bi or tri-layer) deposited on a metallic substrate -Cu(111)-, by Scanning Tunneling Microscopy and Spectroscopy (STM and STS). Most STM studies of adsorbed atoms and molecules up to now have been performed on metallic or semiconducting surfaces. In this situation, the object is strongly electronically coupled to the substrate. The atomic or molecular levels are then shifted and broadened in energy, with the consequence that some of the intrinsic properties of the object are lost, to a more or less large extend. It has been shown recently that interposing between this object and the substrate an insulating leads to an efficient decoupling which allows to recover some of these properties. This decoupling effect of the insulating layer is at the center of the work reported here. Experiments where the molecules are directly adsorbed on the metal are compared with experiments where the molecule is decoupled from the Cu(111) surface by a NaCl bi-layer. The interpretation of these experimental results is supported and extended by current and image calculations with the Elastic Scattering Quantum Chemistry method where the structure of the Metal-insulating layer-molecule-metal junction is described at the atomic level. In the framework of molecular electronics, where the objective is to design and use molecules as electronic devices, understanding and controlling the coupling of a molecule to its environment is a central issue.