Ultra Low Voltage Nano Scale Memories
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Author | : Kiyoo Itoh |
Publisher | : Springer Science & Business Media |
Total Pages | : 351 |
Release | : 2007-09-04 |
Genre | : Technology & Engineering |
ISBN | : 0387688536 |
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.
Author | : Masashi Horiguchi |
Publisher | : Springer Science & Business Media |
Total Pages | : 221 |
Release | : 2011-01-11 |
Genre | : Technology & Engineering |
ISBN | : 1441979581 |
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Author | : Kevin Zhang |
Publisher | : Springer Science & Business Media |
Total Pages | : 390 |
Release | : 2009-04-21 |
Genre | : Technology & Engineering |
ISBN | : 0387884971 |
Kevin Zhang Advancement of semiconductor technology has driven the rapid growth of very large scale integrated (VLSI) systems for increasingly broad applications, incl- ing high-end and mobile computing, consumer electronics such as 3D gaming, multi-function or smart phone, and various set-top players and ubiquitous sensor and medical devices. To meet the increasing demand for higher performance and lower power consumption in many different system applications, it is often required to have a large amount of on-die or embedded memory to support the need of data bandwidth in a system. The varieties of embedded memory in a given system have alsobecome increasingly more complex, ranging fromstatictodynamic and volatile to nonvolatile. Among embedded memories, six-transistor (6T)-based static random access memory (SRAM) continues to play a pivotal role in nearly all VLSI systems due to its superior speed and full compatibility with logic process technology. But as the technology scaling continues, SRAM design is facing severe challenge in mainta- ing suf?cient cell stability margin under relentless area scaling. Meanwhile, rapid expansion in mobile application, including new emerging application in sensor and medical devices, requires far more aggressive voltage scaling to meet very str- gent power constraint. Many innovative circuit topologies and techniques have been extensively explored in recent years to address these challenges.
Author | : Itoh |
Publisher | : |
Total Pages | : 357 |
Release | : 2009-06-01 |
Genre | : |
ISBN | : 9788184892499 |
Author | : Jan Rabaey |
Publisher | : Springer Science & Business Media |
Total Pages | : 371 |
Release | : 2009-04-21 |
Genre | : Technology & Engineering |
ISBN | : 0387717137 |
This book contains all the topics of importance to the low power designer. It first lays the foundation and then goes on to detail the design process. The book also discusses such special topics as power management and modal design, ultra low power, and low power design methodology and flows. In addition, coverage includes projections of the future and case studies.
Author | : Charles Chiang |
Publisher | : Springer Science & Business Media |
Total Pages | : 277 |
Release | : 2007-06-15 |
Genre | : Technology & Engineering |
ISBN | : 1402051883 |
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
Author | : Takayuki Kawahara |
Publisher | : Springer Science & Business Media |
Total Pages | : 214 |
Release | : 2012-05 |
Genre | : Computers |
ISBN | : 1461408113 |
This volume describes computing innovation using non-volatile memory for a sustainable world. The text presents methods of design and implementation for non-volatile memory, allowing devices to be turned off normally when not in use, yet operate with full performance when needed.
Author | : Gan Fuxi |
Publisher | : CRC Press |
Total Pages | : 730 |
Release | : 2015-02-09 |
Genre | : Science |
ISBN | : 9814613207 |
In the big data era, data storage is one of the cores in the whole information chain, which includes production, transfer, sharing, and finally processing. Over the years, the growth of data volume has been explosive. Today, various storage services need memories with higher density and capacity. Moreover, information storage in the big data applic
Author | : Ranjit Gharpurey |
Publisher | : Springer Science & Business Media |
Total Pages | : 207 |
Release | : 2008-03-06 |
Genre | : Technology & Engineering |
ISBN | : 0387692789 |
This book is a compilation of chapters on various aspects of Ultra Wideband. The book includes chapters on Ultra Wideband transceiver implementations, pulse-based systems and one on the implementation for the WiMedia/MBOFDM approach. Another chapter discusses the implementation of the physical layer baseband, including the ADC and post-ADC processing required in the UWB system. Future advances such as multiantenna UWB solutions are also discussed.
Author | : Amara Amara |
Publisher | : Springer Science & Business Media |
Total Pages | : 215 |
Release | : 2009-01-16 |
Genre | : Technology & Engineering |
ISBN | : 1402093411 |
Until the 1990s, the reduction of the minimum feature sizes used to fabricate in- grated circuits, called “scaling”, has highlighted serious advantages as integration density, speed, power consumption, functionality and cost. Direct consequence was the decrease of cost-per-function, so the electronic productivity has largely progressed in this period. Another usually cited trend is the evolution of the in- gration density as expressed by the well-know Moore’s Law in 1975: the number of devices per chip doubles every 2 years. This evolution has allowed improving signi?cantly the circuit complexity, offering a great computing power in the case of microprocessor, for example. However, since few years, signi?cant issues appeared such as the increase of the circuit heating, device complexity, variability and dif?culties to improve the integration density. These new trends generate an important growth in development and production costs. Though is it, since 40 years, the evolution of the microelectronics always f- lowed the Moore’s law and each dif?culty has found a solution.