Transient Radiation Effects on Electronics (TREE) Handbook Formerly Design Handbook for TREE, Chapters 1-6

Transient Radiation Effects on Electronics (TREE) Handbook Formerly Design Handbook for TREE, Chapters 1-6
Author:
Publisher:
Total Pages: 507
Release: 1995
Genre:
ISBN:

The objectives of the Transient Radiation Effects on Electronics (TREE) Handbook are to (1) provide information about radiation effects on semiconductor devices and materials, (2) provide guidelines for microelectronic radiation hardening technology, and (3) serve as a reference for radiation hardness assurance and microelectronic radiation testing. The radiation environments addressed in this handbook include those produced by nuclear weapons effects (NWE) and natural space. The NWE environment includes x rays, gamma rays, and neutrons. The natural space environment includes photons and electrons trapped in the Van Allen belt, and neutrons, heavy ions, and cosmic rays found in space.

Transient-radiation Effects on Electronics Handbook

Transient-radiation Effects on Electronics Handbook
Author: Richard K. Thatcher
Publisher:
Total Pages: 380
Release: 1967
Genre:
ISBN:

It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.

TREE Simulation Facilities: Transient Radiation Effects on Electronics. Edition 1. Revision 1

TREE Simulation Facilities: Transient Radiation Effects on Electronics. Edition 1. Revision 1
Author: Raymond W. Klingensmith
Publisher:
Total Pages: 788
Release: 1973
Genre:
ISBN:

It is the purpose of this document to provide persons working in the area of transient radiation effects on electronics (TREE) with a reference document which characterizes on a technical basis TREE Simulation Facilities. Pulse reactors, flash X-rays, and LINACs are each characterized on an individual basis. The material is arranged to provide the TREE experimenter with the facility information he would need to know in order to run an experiment at one of the facilities.

TRANSIENT RADIATION EFFECTS ON ELECTRONICS. PART 1. KUKLA TRANSIENT RADIATION TESTS.

TRANSIENT RADIATION EFFECTS ON ELECTRONICS. PART 1. KUKLA TRANSIENT RADIATION TESTS.
Author:
Publisher:
Total Pages: 228
Release: 1961
Genre:
ISBN:

Contents: Kukla dosimetry Transient effects in dielectrics and capacitors Transient radiation induced spark gap breakdown in air Transient radiation induced firing of 5643 thyratron Transient effects in semiconductor diodes Analysis of circuit and piece part test requirements for transient radiation effects testing The kukla prompt critical facility.

Radiation Tolerant Electronics, Volume II

Radiation Tolerant Electronics, Volume II
Author: Paul LeRoux
Publisher: Mdpi AG
Total Pages: 0
Release: 2023-01-16
Genre: Technology & Engineering
ISBN: 9783036564456

Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade. After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects.

NUREG/CR.

NUREG/CR.
Author: U.S. Nuclear Regulatory Commission
Publisher:
Total Pages: 48
Release: 1977
Genre: Nuclear energy
ISBN: