TRANSIENT RADIATION EFFECTS ON ELECTRONICS. PART 1. KUKLA TRANSIENT RADIATION TESTS.

TRANSIENT RADIATION EFFECTS ON ELECTRONICS. PART 1. KUKLA TRANSIENT RADIATION TESTS.
Author:
Publisher:
Total Pages: 228
Release: 1961
Genre:
ISBN:

Contents: Kukla dosimetry Transient effects in dielectrics and capacitors Transient radiation induced spark gap breakdown in air Transient radiation induced firing of 5643 thyratron Transient effects in semiconductor diodes Analysis of circuit and piece part test requirements for transient radiation effects testing The kukla prompt critical facility.

Transient Radiation Effects on Electronics (TREE) Handbook Formerly Design Handbook for TREE, Chapters 1-6

Transient Radiation Effects on Electronics (TREE) Handbook Formerly Design Handbook for TREE, Chapters 1-6
Author:
Publisher:
Total Pages: 507
Release: 1995
Genre:
ISBN:

The objectives of the Transient Radiation Effects on Electronics (TREE) Handbook are to (1) provide information about radiation effects on semiconductor devices and materials, (2) provide guidelines for microelectronic radiation hardening technology, and (3) serve as a reference for radiation hardness assurance and microelectronic radiation testing. The radiation environments addressed in this handbook include those produced by nuclear weapons effects (NWE) and natural space. The NWE environment includes x rays, gamma rays, and neutrons. The natural space environment includes photons and electrons trapped in the Van Allen belt, and neutrons, heavy ions, and cosmic rays found in space.

Transient-radiation Effects on Electronics Handbook

Transient-radiation Effects on Electronics Handbook
Author: Richard K. Thatcher
Publisher:
Total Pages: 380
Release: 1967
Genre:
ISBN:

It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.

TRANSIENT RADIATION EFFECTS ON ELECTRONIC COMPONENTS AND SEMICONDUCTOR DEVICES.

TRANSIENT RADIATION EFFECTS ON ELECTRONIC COMPONENTS AND SEMICONDUCTOR DEVICES.
Author:
Publisher:
Total Pages: 117
Release: 1963
Genre:
ISBN:

This report summarizes the information that was available before 1962 concerning the effects of nuclear-weapon-burst and simulated-burst radia tion on electronic components and semiconductor devices. This work reports only the effects observed in components that are due to gamma rays and/or neutrons of a transient radiation environment.

Advances in Nuclear Science and Technology

Advances in Nuclear Science and Technology
Author: Paul Greebler
Publisher: Academic Press
Total Pages: 415
Release: 2014-05-12
Genre: Science
ISBN: 1483224600

Advances in Nuclear Science and Technology, Volume 3 provides an authoritative, complete, coherent, and critical review of the nuclear industry. This book presents the advances in the atomic energy field. Organized into six chapters, this volume begins with an overview of the use of pulsed neutron sources for the determination of the thermalization and diffusion properties of moderating as well as multiplying media. This text then examines the effect of nuclear radiation on electronic circuitry and its components. Other chapters consider radiation effects in various inorganic solids, with emphasis on the investigation of variations effected in the mechanical and optical crystalline properties. This book discusses as well several methods for solving various problems in reactor theory. The final chapter deals with several types of pulsed neutron sources in use and speculates on improvements that may be expected in their performance. This book is a valuable resource for design engineers and neuron physicists.