Transient-radiation Effects on Electronics Handbook

Transient-radiation Effects on Electronics Handbook
Author: Richard K. Thatcher
Publisher:
Total Pages: 380
Release: 1967
Genre:
ISBN:

It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.

TREE

TREE
Author: Dale C. Jones
Publisher:
Total Pages: 209
Release: 1964
Genre: Electronic apparatus and appliances
ISBN:

Transient Radiation Effects on Electronics (TREE) Handbook Formerly Design Handbook for TREE, Chapters 1-6

Transient Radiation Effects on Electronics (TREE) Handbook Formerly Design Handbook for TREE, Chapters 1-6
Author:
Publisher:
Total Pages: 507
Release: 1995
Genre:
ISBN:

The objectives of the Transient Radiation Effects on Electronics (TREE) Handbook are to (1) provide information about radiation effects on semiconductor devices and materials, (2) provide guidelines for microelectronic radiation hardening technology, and (3) serve as a reference for radiation hardness assurance and microelectronic radiation testing. The radiation environments addressed in this handbook include those produced by nuclear weapons effects (NWE) and natural space. The NWE environment includes x rays, gamma rays, and neutrons. The natural space environment includes photons and electrons trapped in the Van Allen belt, and neutrons, heavy ions, and cosmic rays found in space.

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Author: Ronald D Schrimpf
Publisher: World Scientific
Total Pages: 349
Release: 2004-07-29
Genre: Technology & Engineering
ISBN: 9814482153

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Mechanisms of Transient Radiation Effects

Mechanisms of Transient Radiation Effects
Author: V. A. J. van Lint
Publisher:
Total Pages: 67
Release: 1968
Genre:
ISBN:

The objective of this report is to provide readers with an understanding of the interaction of nuclear radiation with matter in electronic components and devices and the resulting effects which could adversely affect their performance. This information will serve as a background for understanding transient radiation effects in electronics (TREE) and, if necessary, as a basis for making crude estimates of expected effects when no experimental data are available. Included are discussions of displacement, ionization and chemical effects, and a note on shielding requirements. For each type of effect, the steps leading from the primary interaction between the radiation and a target atom to the physical manifestation, i.e., changes in the macroscopic properties, are summarized. Some rules are provided for estimating the magnitudes of the effects, and these rules are illustrated by applying them to typical electronic devices.

TRANSIENT RADIATION EFFECTS ON ELECTRONIC COMPONENTS AND SEMICONDUCTOR DEVICES.

TRANSIENT RADIATION EFFECTS ON ELECTRONIC COMPONENTS AND SEMICONDUCTOR DEVICES.
Author:
Publisher:
Total Pages: 117
Release: 1963
Genre:
ISBN:

This report summarizes the information that was available before 1962 concerning the effects of nuclear-weapon-burst and simulated-burst radia tion on electronic components and semiconductor devices. This work reports only the effects observed in components that are due to gamma rays and/or neutrons of a transient radiation environment.