Thirty-fourth International Symposium for Testing and Failure Analysis
Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 551 |
Release | : 2008-01-01 |
Genre | : Electronic apparatus and appliances |
ISBN | : 1615030913 |
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Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 551 |
Release | : 2008-01-01 |
Genre | : Electronic apparatus and appliances |
ISBN | : 1615030913 |
Author | : Sabu Thomas |
Publisher | : Elsevier |
Total Pages | : 462 |
Release | : 2022-01-26 |
Genre | : Technology & Engineering |
ISBN | : 0323998275 |
Nickel-Titanium Smart Hybrid Materials: From Micro- to Nano-structured Alloys for Emerging Applications describes advanced properties that can be adapted in NiTi-alloys. Nickel-Titanium (NiTi) systems are receiving wide demand in growing industries due to their smart, high-temperature or biocompatible behavior. These influenced behaviors are carefully described in the micro-scale and nanoscale range, with NiTi smart materials described on the basis of their shape memory effect (SME) and super-elastic (SE) properties for sensor and actuator application. This book discusses novel properties of nickel-titanium systems, helping materials scientists and engineers produce smart technologies and systems for the aeronautical, automobile, mechanical, healthcare and electronics industries. - Describes the use of nanotechnology and microtechnology in nickel-titanium-based systems - Outlines the major properties of Nickel-Titanium Nanoalloys - Assesses the major challenges of manufacturing nickel-titanium nanoalloys at an industrial scale
Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 666 |
Release | : 2017-12-01 |
Genre | : Technology & Engineering |
ISBN | : 1627081518 |
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author | : Grace M. Davidson |
Publisher | : ASM International |
Total Pages | : 310 |
Release | : 1997-01-01 |
Genre | : Technology & Engineering |
ISBN | : 1615030824 |
Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 593 |
Release | : 2018-12-01 |
Genre | : Technology & Engineering |
ISBN | : 1627080996 |
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 524 |
Release | : 2005-01-01 |
Genre | : Technology & Engineering |
ISBN | : 1615030883 |
Author | : Zhiyong Ma |
Publisher | : CRC Press |
Total Pages | : 843 |
Release | : 2017-03-27 |
Genre | : Science |
ISBN | : 135173394X |
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Author | : Tejinder Gandhi |
Publisher | : ASM International |
Total Pages | : 719 |
Release | : 2019-11-01 |
Genre | : Technology & Engineering |
ISBN | : 1627082468 |
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author | : EDFAS Desk Reference Committee |
Publisher | : ASM International |
Total Pages | : 673 |
Release | : 2011 |
Genre | : Technology & Engineering |
ISBN | : 1615037268 |
Includes bibliographical references and index.
Author | : Yan Li |
Publisher | : Springer Nature |
Total Pages | : 628 |
Release | : 2022-10-28 |
Genre | : Technology & Engineering |
ISBN | : 9811950539 |
This book provides a comprehensive reference for both academia and industry on the fundamentals, technology details, and applications of Advanced Driver-Assistance Systems (ADAS) and autonomous driving, an emerging and rapidly growing area. The book written by experts covers the most recent research results and industry progress in the following areas: ADAS system design and test methodologies, advanced materials, modern automotive technologies, artificial intelligence, reliability concerns, and failure analysis in ADAS. Numerous images, tables, and didactic schematics are included throughout. This essential book equips readers with an in-depth understanding of all aspects of ADAS, providing insights into key areas for future research and development. • Provides comprehensive coverage of the state-of-the-art in ADAS • Covers advanced materials, deep learning, quality and reliability concerns, and fault isolation and failure analysis • Discusses ADAS system design and test methodologies, novel automotive technologies • Features contributions from both academic and industry authors, for a complete view of this important technology