Third Symposium on Frequency Standards and Metrology
Author | : Centre national de la recherche scientifique (France) |
Publisher | : Editions de Physique |
Total Pages | : 562 |
Release | : 1981 |
Genre | : Atomic frequency standards |
ISBN | : |
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Author | : Centre national de la recherche scientifique (France) |
Publisher | : Editions de Physique |
Total Pages | : 562 |
Release | : 1981 |
Genre | : Atomic frequency standards |
ISBN | : |
Author | : Lute Maleki |
Publisher | : World Scientific |
Total Pages | : 597 |
Release | : 2009 |
Genre | : Science |
ISBN | : 981283821X |
The Symposium on Frequency Standards and Metrology is an event held approximately every seven years, and is regarded as the premier conference in the field of advanced clocks and oscillators together with their applications in science and metrology. This series began with the first meeting at Universiteacute; Laval, Quebec Canada in 1971, and the last one was held in 2001 at the University of St. Andrews, Scotland. The 7th Symposium on Frequency Standards and Metrology is scheduled for October 5ndash;11, 2008 at the Asilomar Conference Grounds in Pacific Grove, California, USA. The Symposium is intended as a forum for bringing together international scientists and technologists engaged in the development of precise frequency standards and clocks, the study of their underlying physics, and their applications in metrology and tests of fundamental laws. The symposium has been traditionally held in a venue that promotes exchange of information on emerging ideas and latest achievements in the field, with a single-session approach which includes oral presentations by invitation, poster session(s) and keynote talks from internationally-recognized speakers. The program also includes social and other events aimed at promoting the exchange of technical and scientific information.
Author | : Terry J. Quinn |
Publisher | : IOS Press |
Total Pages | : 886 |
Release | : 2001 |
Genre | : Science |
ISBN | : 9781586031671 |
Over the last decade of the 20th century, many improvements took place in the field of metrology and fundamental constants. These developments and improvements are discussed in this book. The old caesium SI second definition has found a new realization with the fountain approach, replacing the classical thermal atomic beam. The use of cold atom techniques, slowed down and cooled, has opened a number of unexpected avenues for metrology and fundamental constants, one of these possibilities being the atom interferometry. Another development was the demonstration of the possiblility of performing a direct frequency division in the visible, using short femtosecond pulses. Many other developments are also discussed.
Author | : Fritz Riehle |
Publisher | : John Wiley & Sons |
Total Pages | : 540 |
Release | : 2006-03-06 |
Genre | : Science |
ISBN | : 3527605959 |
Of all measurement units, frequency is the one that may be determined with the highest degree of accuracy. It equally allows precise measurements of other physical and technical quantities, whenever they can be measured in terms of frequency. This volume covers the central methods and techniques relevant for frequency standards developed in physics, electronics, quantum electronics, and statistics. After a review of the basic principles, the book looks at the realisation of commonly used components. It then continues with the description and characterisation of important frequency standards from atomic clocks, to frequency stabilised lasers. The whole is rounded of with a discussion of topical applications in engineering, telecommunications, and metrology.
Author | : M. Barone |
Publisher | : World Scientific |
Total Pages | : 520 |
Release | : 2000 |
Genre | : Science |
ISBN | : 9789812792846 |
This text introduces needed theoretical instruments and offers an up-to-date discussion on fundamental physics as well as the experimental tools used and developed for the construction and exploitation of gravitational wave antennae (resonant bars, ground-based and space interferometric detectors). In addition, problems in the fields of optics, signal processing, control and feedback in active mechanical filtering are deeply analyzed, with reference to solutions adopted in the main detectors.
Author | : Andre N. Luiten |
Publisher | : Springer Science & Business Media |
Total Pages | : 396 |
Release | : 2003-07-01 |
Genre | : Science |
ISBN | : 3540449914 |
This text on precision frequency measurement and its key enabling techniques includes reviews written by some of the most experienced researchers in their respective fields. This text should prove useful to researchers just entering the field of frequency metrology and standards, or equally well to the experienced practitioner.
Author | : United States. National Bureau of Standards |
Publisher | : |
Total Pages | : 788 |
Release | : 1978 |
Genre | : Government publications |
ISBN | : |
Author | : Mike Golio |
Publisher | : CRC Press |
Total Pages | : 2193 |
Release | : 2018-10-08 |
Genre | : Technology & Engineering |
ISBN | : 1439833230 |
By 1990 the wireless revolution had begun. In late 2000, Mike Golio gave the world a significant tool to use in this revolution: The RF and Microwave Handbook. Since then, wireless technology spread across the globe with unprecedented speed, fueled by 3G and 4G mobile technology and the proliferation of wireless LANs. Updated to reflect this tremendous growth, the second edition of this widely embraced, bestselling handbook divides its coverage conveniently into a set of three books, each focused on a particular aspect of the technology. Six new chapters cover WiMAX, broadband cable, bit error ratio (BER) testing, high-power PAs (power amplifiers), heterojunction bipolar transistors (HBTs), as well as an overview of microwave engineering. Over 100 contributors, with diverse backgrounds in academic, industrial, government, manufacturing, design, and research reflect the breadth and depth of the field. This eclectic mix of contributors ensures that the coverage balances fundamental technical issues with the important business and marketing constraints that define commercial RF and microwave engineering. Focused chapters filled with formulas, charts, graphs, diagrams, and tables make the information easy to locate and apply to practical cases. The new format, three tightly focused volumes, provides not only increased information but also ease of use. You can find the information you need quickly, without wading through material you don’t immediately need, giving you access to the caliber of data you have come to expect in a much more user-friendly format.