Thin Films Stresses And Mechanical Properties X Volume 795
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Author | : Sean G. Corcoran |
Publisher | : |
Total Pages | : 616 |
Release | : 2004 |
Genre | : Thin films |
ISBN | : |
This work contains experimental, theoretical, and modeling research papers from a December 2003 symposium on the mechanical behavior of thin films, touching on topics in stress evolution, modeling stresses and film instability, deformation and adhesion, film fracture and fatigue, processing and structure, indentation testing, mechanical properties, properties and performance, and multilayers and nanolaminates. Some specific topics include fracture patterns in thin films and multilayers, thin film herringbone buckling patterns, the effect of oxygen on adhesion of thin copper films to silicon nitride, and the effects of stress amplitude on the fatigue of polysilicon. Annotation : 2004 Book News, Inc., Portland, OR (booknews.com)
Author | : Sean G. Corcoran |
Publisher | : Cambridge University Press |
Total Pages | : 606 |
Release | : 2014-06-05 |
Genre | : Technology & Engineering |
ISBN | : 9781107409316 |
Understanding the mechanical behavior of thin films is crucial for a wide variety of technologies. This behavior can critically influence the design, performance and reliability of thin-film structures used in every area of thin-film technology. However, the performance of these devices is often limited by the mechanical properties of both the films and the structures to which they are attached. The concepts, models and techniques developed for bulk materials often do not apply to small dimensions, and the mechanisms controlling behavior are not well defined. This book, first published in 2004, brings together an international group of researchers and students from industry, academia and national laboratories to address the mechanical behavior of thin films. Of particular interest are those studies that cut across length scales such as atomistic-to-nanometer or nanometer-to-submicron scale. Topics include: stress evolution; modeling stresses and film instability; deformation and adhesion; film fracture and fatigue; processing and structure; indentation testing; mechanical properties; properties and performance; and multilayers and nanolaminates.
Author | : Materials Research Society. Meeting |
Publisher | : |
Total Pages | : 480 |
Release | : 2005 |
Genre | : Thin films |
ISBN | : |
Author | : Yoshio Nishi |
Publisher | : CRC Press |
Total Pages | : 3276 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 1351829823 |
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Author | : |
Publisher | : |
Total Pages | : 480 |
Release | : 2005 |
Genre | : Thin films |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 616 |
Release | : 2004-04-09 |
Genre | : Technology & Engineering |
ISBN | : |
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2004, offers scientific and technological information on ferroelectric thin films from an international mix of academia, industry and government organizations.
Author | : Materials Research Society. Fall Meeting |
Publisher | : |
Total Pages | : 442 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : |
Papers from a December 2003 symposium review and discuss the science and technology of nanostructured materials and nanocomposites, with special emphasis placed on the relationships between their fabrication, structure, strength, and ductility. Major themes are nanoscience and nanoengineering of bulk and composite materials, thick coatings, and thin films with enhanced mechanical properties for structural and functional applications. The book will be of interest to researchers and graduate students in nanostructured materials science, and for engineers involved in the production and processing of nanocrystalline materials and nanocomposites for structural and functional applications. Annotation : 2004 Book News, Inc., Portland, OR (booknews.com).
Author | : G. S. Nolas |
Publisher | : |
Total Pages | : 498 |
Release | : 2004-03-17 |
Genre | : Science |
ISBN | : |
The measure of a thermoelectric material is given by the material's figure of merit. For over three decades the best thermoelectric materials had a ZT = 1. Recently, however, there are reports of new methods of materials synthesis that result in improvements beyond this performance. In addition, rapid characterization, as well as faster theoretical modeling of thermoelectric materials, has resulted in a more rapid evaluation of new materials. This book offers a look at these results and provides a benchmark for the current state in the field of thermoelectric materials research and development. The focus is on new and innovative directions that will lead to the next generation thermoelectric materials for small-scale refrigeration and power generation applications. The book emphasizes the multidisciplinary nature of the research needed to advance the science and technology of the field. Both theoretical and experimental studies are featured. Topics include: low-dimensional systems and nanocomposites; devices; oxides; skutterudites; complex bulk materials and measurements; novel approaches; and thermoelectric materials and technology.
Author | : |
Publisher | : |
Total Pages | : 746 |
Release | : 2004 |
Genre | : Ferroelectric thin films |
ISBN | : |
Author | : David A. LaVan |
Publisher | : |
Total Pages | : 512 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : |
This volume, a continuation of the MEMS, NEMS, and molecular machines symposium of the 2002 MRS Fall Meeting, is devoted to the investigation of materials and device behavior at the micro-, nano-, and molecular scale as well as interdisciplinary work futhering the design and development of micro-, nano-, and molecular devices. New materials and fabrication techniques are introduced, and ongoing issues such as reliability, surface effects, processing and packaging, biocompatibility, and stability are discussed. Projects coupling micro-and nanoscale approaches to solve ongoing issues in the development of small-scale systems are featured. Topics include: nanotechnology; alternative fabrication techniques; micro- and nanofluidics; applied micro- and nanotechnology; mechanical properties; biotechnology and nanotechnology; alternative materials and metrology; and surface engineering and tribology.