The Physics Of Metrology
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| Author | : Alex Hebra |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 392 |
| Release | : 2010-04-06 |
| Genre | : Technology & Engineering |
| ISBN | : 3211783814 |
Conceived as a reference manual for practicing engineers, instrument designers, service technicians and engineering students. The related fields of physics, mechanics and mathematics are frequently incorporated to enhance the understanding of the subject matter. Historical anecdotes as far back as Hellenistic times to modern scientists help illustrate in an entertaining manner ideas ranging from impractical inventions in history to those that have changed our lives.
| Author | : P. Tavella |
| Publisher | : IOS Press |
| Total Pages | : 528 |
| Release | : 2018-01-03 |
| Genre | : Science |
| ISBN | : 1614998183 |
Metrology is a constantly evolving field, and one which has developed in many ways in the last four decades. This book presents the proceedings of the Enrico Fermi Summer School on the topic of Metrology, held in Varenna, Italy, from 26 June to 6 July 2017. This was the 6th Enrico Fermi summer school devoted to metrology, the first having been held in 1976. The 2017 program addressed two major new directions for metrology: the work done in preparation for a possible re-definition of four of the base units of the SI in 2018, and the impact of the application of metrology to issues addressing quality of life – such as global climate change and clinical and food analysis – on science, citizens and society. The lectures were grouped into three modules: metrology for quality of life; fundamentals of metrology; and physical metrology and fundamental constants, and topics covered included food supply and safety; biomarkers; monitoring climate and air quality; new IS units; measurement uncertainty; fundamental constants; electrical metrology; optical frequency standards; and photometry and light metrology. The book provides an overview of the topics and changes relevant to metrology today, and will be of interest to both academics and all those whose work involves any of the various aspects of this field.
| Author | : Oded Kafri |
| Publisher | : Wiley-Interscience |
| Total Pages | : 216 |
| Release | : 1990 |
| Genre | : Science |
| ISBN | : |
This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
| Author | : Ernst O. Göbel |
| Publisher | : John Wiley & Sons |
| Total Pages | : 243 |
| Release | : 2015-09-21 |
| Genre | : Science |
| ISBN | : 3527412654 |
The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.
| Author | : Valery A. Slaev |
| Publisher | : Walter de Gruyter GmbH & Co KG |
| Total Pages | : 556 |
| Release | : 2019-12-02 |
| Genre | : Science |
| ISBN | : 3110652501 |
Metrology is the science of measurements. As such, it deals with the problem of obtaining knowledge of physical reality through its quantifiable properties. The problems of measurement and of measurement accuracy are central to all natural and technical sciences. Now in its second edition, this monograph conveys the fundamental theory of measurement and provides some algorithms for result testing and validation.
| Author | : Michael Grabe |
| Publisher | : Morgan & Claypool |
| Total Pages | : 82 |
| Release | : 2018-10-31 |
| Genre | : Science |
| ISBN | : 9781643270982 |
Truth and Traceability in Physics and Metrology discusses a new error concept that dispenses with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors are treated as what they are, namely unknown constants. Furthermore, the ideas considered point to a methodology to steadily localize the true values of the measures and, consequently, traceability.
| Author | : Franco Pavese |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 499 |
| Release | : 2008-12-16 |
| Genre | : Mathematics |
| ISBN | : 0817648046 |
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
| Author | : A. Di Giuseppe |
| Publisher | : IOS Press |
| Total Pages | : 567 |
| Release | : 2013-10-21 |
| Genre | : Science |
| ISBN | : 1614993262 |
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
| Author | : Waldemar Nawrocki |
| Publisher | : Springer |
| Total Pages | : 287 |
| Release | : 2015-03-24 |
| Genre | : Technology & Engineering |
| ISBN | : 3319156691 |
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
| Author | : M.J.T. Milton |
| Publisher | : IOS Press |
| Total Pages | : 480 |
| Release | : 2021-12-22 |
| Genre | : Science |
| ISBN | : 1643682474 |
The use of standard and reliable measurements is essential in many areas of life, but nowhere is it of more crucial importance than in the world of science, and physics in particular. This book contains 20 contributions presented as part of Course 206 of the International School of Physics Enrico Fermi on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, held in Varenna, Italy, from 4 -13 July 2019. The Course was the 7th in the Enrico Fermi series devoted to metrology, and followed a milestone in the history of measurement: the adoption of new definitions for the base units of the SI. During the Course, participants reviewed the decision and discussed how the new foundation for metrology is opening new possibilities for physics, with several of the lecturers reflecting on the implications for an easier exploration of the unification of quantum mechanics and gravity. A wide range of other topics were covered, from measuring color and appearance to atomic weights and radiation, and including the application of metrological principles to the management and interpretation of very large sets of scientific data and the application of metrology to biology. The book also contains a selection of posters from the best of those presented by students at the Course. Offering a fascinating exploration of the latest thinking on the subject of metrology, this book will be of interest to researchers and practitioners from many fields.
