The Laue Method

The Laue Method
Author: J.L. Amoros
Publisher: Elsevier
Total Pages: 389
Release: 2012-12-02
Genre: Science
ISBN: 0323140769

The Laue Method demonstrates why and how the Laue method provides an easy vehicle for identification of crystalline species. The more important aspects of classical crystal theory and projection methods (such as the stereographic, gnomonic and stereognomonic projections) are discussed. The subject matter of this book falls into two parts. After a brief historical introduction that considers early interpretation of Laue photographs and Laue's theory of diffraction by crystals, the first part provides, at an elementary level, a simple and compact treatment of the Laue method and the background needed to make use of it. The stereographic projection, gnomonic projection, stereognomonic projection, and crystallochemical analysis are covered here. The chapters that follow examine the Laue method on a higher level, paying particular attention to the polychromatic component, the cross ratio and its application in crystallography, and the indexing of Laue photographs. The reader is also introduced to the optics of the Laue method and the application of Laue photographs to the study of diffuse scattering. The book concludes with a very simple new interpretation of the Laue method. This book should appeal to both students and specialists who study crystals.

X-Ray Diffraction

X-Ray Diffraction
Author: B. E. Warren
Publisher: Courier Corporation
Total Pages: 402
Release: 2012-05-23
Genre: Science
ISBN: 0486141616

Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.

Principles of Protein X-ray Crystallography

Principles of Protein X-ray Crystallography
Author: Jan Drenth
Publisher: Springer Science & Business Media
Total Pages: 355
Release: 2013-03-09
Genre: Science
ISBN: 1475730926

New textbooks at all levels of chemistry appear with great regularity. Some fields such as basic biochemistry, organic reaction mechanisms, and chemical thermodynamics are well represented by many excellent texts, and new or revised editions are published sufficiently often to keep up with progress in research. However, some areas of chemistry, especially many of those taught at the graduate level, suffer from a real lack of up to-date textbooks. The most serious needs occur in fields that are rapidly changing. Textbooks in these subjects usually have to be written by scientists actually involved in the research that is advancing the field. It is not often easy to persuade such individuals to set time aside to help spread the knowledge they have accumulated. Our goal, in this series, is to pinpoint areas of chemistry where recent progress has outpaced what is covered in any available textbooks, and then seek out and persuade experts in these fields to produce relatively concise but instructive intro ductions to their fields. These should serve the needs of one-semester or one-quarter graduate courses in chemistry and biochemistry. In some cases, the availability of texts in active research areas should help stimulate the creation of new courses. Charles R. Cantor v Preface to the Second Edition Since the publication of the previous edition in 1994, X-ray crystallography of proteins has advanced by improvements in existing techniques and by addition of new techniques.

X-Ray Diffraction for Materials Research

X-Ray Diffraction for Materials Research
Author: Myeongkyu Lee
Publisher: CRC Press
Total Pages: 302
Release: 2017-03-16
Genre: Science
ISBN: 1315361973

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Orientation Of Single Crystals By Back-reflection Laue Pattern Simulation

Orientation Of Single Crystals By Back-reflection Laue Pattern Simulation
Author: Ernesto Dieguez
Publisher: World Scientific
Total Pages: 179
Release: 1999-03-04
Genre: Technology & Engineering
ISBN: 9814498181

Laue-grams are the easiest X-ray diffraction patterns that can be obtained and are very useful for orienting single crystals and finding out the symmetry of a projection. Despite the simplicity of the experimental equipment, the orientation work is a costly and time consuming process. It would be a great advantage to be able to simulate any kind of Laue-gram and to identify an unknown crystal orientation, including anisotropic ones.This book presents the complete numerical algorithms for simulation of X-ray back-reflection Laue-grams by evaluating the main factors that affect the intensities of the Laue-gram spots. To demonstrate the potential of the computational procedures developed, an example of every crystal system is shown. A PC diskette is included with this book, to be used for simulation and indexing of any back-reflection Laue pattern.

Structure Determination by X-Ray Crystallography

Structure Determination by X-Ray Crystallography
Author: M. F. C. Ladd
Publisher: Springer Science & Business Media
Total Pages: 404
Release: 2012-12-06
Genre: Science
ISBN: 1461579333

Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.

Modern Physical Metallurgy and Materials Engineering

Modern Physical Metallurgy and Materials Engineering
Author: R. E. Smallman
Publisher: Butterworth-Heinemann
Total Pages: 456
Release: 1999-12-08
Genre: Technology & Engineering
ISBN: 9780750645645

The sixth edition of Modern Physical Metallurgy provides a comprehensive overview of the structure of matter, the physical properties of materials and their mechanical behaviour and some of the most recent advances in physical metallurgy.

Elements of X-Ray Diffraction

Elements of X-Ray Diffraction
Author: Bernard D. Cullity
Publisher: Pearson
Total Pages: 656
Release: 2013-11-01
Genre: X-ray crystallography
ISBN: 9781292040547

Designed for Junior/Senior undergraduate courses. This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader

X-Ray Diffraction by Polycrystalline Materials

X-Ray Diffraction by Polycrystalline Materials
Author: René Guinebretière
Publisher: John Wiley & Sons
Total Pages: 290
Release: 2013-03-01
Genre: Technology & Engineering
ISBN: 1118613953

This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.