The Development Of X Ray Analysis
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| Author | : Andreas Maier |
| Publisher | : Springer |
| Total Pages | : 263 |
| Release | : 2018-08-02 |
| Genre | : Computers |
| ISBN | : 3319965204 |
This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
| Author | : Mario Birkholz |
| Publisher | : John Wiley & Sons |
| Total Pages | : 378 |
| Release | : 2006-05-12 |
| Genre | : Technology & Engineering |
| ISBN | : 3527607048 |
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
| Author | : Andrei Benediktovich |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 325 |
| Release | : 2013-09-07 |
| Genre | : Technology & Engineering |
| ISBN | : 3642381774 |
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
| Author | : Adam Tornhill |
| Publisher | : Pragmatic Bookshelf |
| Total Pages | : 356 |
| Release | : 2018-03-08 |
| Genre | : Computers |
| ISBN | : 1680505807 |
Are you working on a codebase where cost overruns, death marches, and heroic fights with legacy code monsters are the norm? Battle these adversaries with novel ways to identify and prioritize technical debt, based on behavioral data from how developers work with code. And that's just for starters. Because good code involves social design, as well as technical design, you can find surprising dependencies between people and code to resolve coordination bottlenecks among teams. Best of all, the techniques build on behavioral data that you already have: your version-control system. Join the fight for better code! Use statistics and data science to uncover both problematic code and the behavioral patterns of the developers who build your software. This combination gives you insights you can't get from the code alone. Use these insights to prioritize refactoring needs, measure their effect, find implicit dependencies between different modules, and automatically create knowledge maps of your system based on actual code contributions. In a radical, much-needed change from common practice, guide organizational decisions with objective data by measuring how well your development teams align with the software architecture. Discover a comprehensive set of practical analysis techniques based on version-control data, where each point is illustrated with a case study from a real-world codebase. Because the techniques are language neutral, you can apply them to your own code no matter what programming language you use. Guide organizational decisions with objective data by measuring how well your development teams align with the software architecture. Apply research findings from social psychology to software development, ensuring you get the tools you need to coach your organization towards better code. If you're an experienced programmer, software architect, or technical manager, you'll get a new perspective that will change how you work with code. What You Need: You don't have to install anything to follow along in the book. TThe case studies in the book use well-known open source projects hosted on GitHub. You'll use CodeScene, a free software analysis tool for open source projects, for the case studies. We also discuss alternative tooling options where they exist.
| Author | : Burkhard Beckhoff |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 897 |
| Release | : 2007-05-18 |
| Genre | : Science |
| ISBN | : 3540367225 |
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
| Author | : Peter Luger |
| Publisher | : Walter de Gruyter |
| Total Pages | : 370 |
| Release | : 2014-04-01 |
| Genre | : Science |
| ISBN | : 3110370611 |
An excellent book for professional crystallographers! In 2012 the crystallographic community celebrated 100 years of X-ray diffraction in honour of the pioneering experiment in 1912 by Max von Laue, Friedrich and Knipping. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. This completely revised edition is a guide for practical work in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Emphasis is placed on understanding results and avoiding pitfalls. Essential reading for researchers from the student to the professional level interested in understanding the structure of molecules.
| Author | : Gubicza, Jen? |
| Publisher | : IGI Global |
| Total Pages | : 359 |
| Release | : 2014-03-31 |
| Genre | : Technology & Engineering |
| ISBN | : 1466658533 |
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
| Author | : E.P. Bertin |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1098 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 1461344166 |
Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.
| Author | : Bettyann Kevles |
| Publisher | : Rutgers University Press |
| Total Pages | : 412 |
| Release | : 1997 |
| Genre | : Medical |
| ISBN | : 9780813523583 |
By the late 1960s, the computer and television were linked to produce medical images that were as startling as Roentgen's original X-rays. Computerized tomography (CT) and magnetic reasonance imaging (MRI) made it possible to picture soft tissues invisible to ordinary X-rays. Ultrasound allowed expectant parents to see their unborn children. Positron emission tomography (PET) enabled neuroscientists to map the brain. In this lively history of medical imaging, the first to cover the full scope of the field from X-rays to MRI-assisted surgery, Bettyann Kevles explores the consequences of these developments for medicine and society. Through lucid prose, vivid anecdotes, and more than seventy striking illustrations, she shows how medical imaging has transformed the practice of medicine - from pediatrics to dentistry, neurosurgery to geriatrics, gynecology to oncology. Beyond medicine, Kevles describes how X-rays and the newer technologies have become part of the texture of modern life and culture. They helped undermine Victorian sexual sensibilities, gave courts new forensic tools, provided plots for novels and movies, and offered artists from Picasso to Warhol new ways to depict the human form.
| Author | : Rolf Behling |
| Publisher | : CRC Press |
| Total Pages | : 413 |
| Release | : 2021-04-18 |
| Genre | : Technology & Engineering |
| ISBN | : 1000376133 |
Gives an up-to-date summary of X-ray source design for applications in modern diagnostic medical imaging. Lays a sound groundwork for education and advanced training in the physics of X-ray production and X-ray interactions with matter. Includes a historical overview of X-ray tube and generator development, including key achievements leading up to the current technological and economic state of the field.
