Designer's Guide to Testable Asic Devices

Designer's Guide to Testable Asic Devices
Author: Wayne M. Needham
Publisher: Springer Science & Business Media
Total Pages: 336
Release: 1991-01-10
Genre: Computers
ISBN: 9780442002213

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR

Design to Test

Design to Test
Author: John Turino
Publisher: Springer Science & Business Media
Total Pages: 334
Release: 2012-12-06
Genre: Science
ISBN: 9401160449

This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

A Designer’s Guide to Built-In Self-Test

A Designer’s Guide to Built-In Self-Test
Author: Charles E. Stroud
Publisher: Springer
Total Pages: 320
Release: 2013-03-18
Genre: Technology & Engineering
ISBN: 9781475776263

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

An Introduction to Logic Circuit Testing

An Introduction to Logic Circuit Testing
Author: Parag K. Lala
Publisher: Morgan & Claypool Publishers
Total Pages: 111
Release: 2009
Genre: Computers
ISBN: 1598293508

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

System Test and Diagnosis

System Test and Diagnosis
Author: William R. Simpson
Publisher: Springer Science & Business Media
Total Pages: 389
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461527023

System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience. The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.

Logic Testing and Design for Testability

Logic Testing and Design for Testability
Author: Hideo Fujiwara
Publisher: MIT Press (MA)
Total Pages: 298
Release: 1985-06-01
Genre: Business & Economics
ISBN: 9780262561990

Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.

Digital System Design with SystemVerilog

Digital System Design with SystemVerilog
Author: Mark Zwolinski
Publisher: Pearson Education
Total Pages: 458
Release: 2009-10-23
Genre: Technology & Engineering
ISBN: 0137046316

The Definitive, Up-to-Date Guide to Digital Design with SystemVerilog: Concepts, Techniques, and Code To design state-of-the-art digital hardware, engineers first specify functionality in a high-level Hardware Description Language (HDL)—and today’s most powerful, useful HDL is SystemVerilog, now an IEEE standard. Digital System Design with SystemVerilog is the first comprehensive introduction to both SystemVerilog and the contemporary digital hardware design techniques used with it. Building on the proven approach of his bestselling Digital System Design with VHDL, Mark Zwolinski covers everything engineers need to know to automate the entire design process with SystemVerilog—from modeling through functional simulation, synthesis, timing simulation, and verification. Zwolinski teaches through about a hundred and fifty practical examples, each with carefully detailed syntax and enough in-depth information to enable rapid hardware design and verification. All examples are available for download from the book's companion Web site, zwolinski.org. Coverage includes Using electronic design automation tools with programmable logic and ASIC technologies Essential principles of Boolean algebra and combinational logic design, with discussions of timing and hazards Core modeling techniques: combinational building blocks, buffers, decoders, encoders, multiplexers, adders, and parity checkers Sequential building blocks: latches, flip- flops, registers, counters, memory, and sequential multipliers Designing finite state machines: from ASM chart to D flip-flops, next state, and output logic Modeling interfaces and packages with SystemVerilog Designing testbenches: architecture, constrained random test generation, and assertion-based verification Describing RTL and FPGA synthesis models Understanding and implementing Design-for-Test Exploring anomalous behavior in asynchronous sequential circuits Performing Verilog-AMS and mixed-signal modeling Whatever your experience with digital design, older versions of Verilog, or VHDL, this book will help you discover SystemVerilog’s full power and use it to the fullest.

Reliability Engineering

Reliability Engineering
Author: Alessandro Birolini
Publisher: Springer Science & Business Media
Total Pages: 564
Release: 2003-08-20
Genre: Technology & Engineering
ISBN: 9783540402879

Using clear language, this book shows you how to build in, evaluate, and demonstrate reliability and availability of components, equipment, and systems. It presents the state of the art in theory and practice, and is based on the author's 30 years' experience, half in industry and half as professor of reliability engineering at the ETH, Zurich. In this extended edition, new models and considerations have been added for reliability data analysis and fault tolerant reconfigurable repairable systems including reward and frequency / duration aspects. New design rules for imperfect switching, incomplete coverage, items with more than 2 states, and phased-mission systems, as well as a Monte Carlo approach useful for rare events are given. Trends in quality management are outlined. Methods and tools are given in such a way that they can be tailored to cover different reliability requirement levels and be used to investigate safety as well. The book contains a large number of tables, figures, and examples to support the practical aspects.