The Beginnings Of Electron Microscopy Part 2
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Author | : Peter W. Hawkes |
Publisher | : Academic Press |
Total Pages | : 546 |
Release | : 2022-04-26 |
Genre | : Technology & Engineering |
ISBN | : 0323989209 |
The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in Advances in Imaging and Electron Physics series
Author | : Peter W. Hawkes |
Publisher | : Academic Press |
Total Pages | : 654 |
Release | : 2013-11-06 |
Genre | : Science |
ISBN | : 1483284654 |
The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.
Author | : Peter W. Hawkes |
Publisher | : Academic Press |
Total Pages | : 452 |
Release | : 2021-10-13 |
Genre | : Technology & Engineering |
ISBN | : 0323915086 |
The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in "Advances in Imaging and Electron Physics" series
Author | : James Pawley |
Publisher | : Springer Science & Business Media |
Total Pages | : 323 |
Release | : 2007-12-03 |
Genre | : Science |
ISBN | : 0387729720 |
Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. Although this imaging technique has undergone tremendous developments, it is still poorly represented in the literature, limited to journal articles and chapters in books. This comprehensive volume is dedicated to the theory and practical applications of FESEM in biological samples. It provides a comprehensive explanation of instrumentation, applications, and protocols, and is intended to teach the reader how to operate such microscopes to obtain the best quality images.
Author | : C. Barry Carter |
Publisher | : Springer |
Total Pages | : 543 |
Release | : 2016-08-24 |
Genre | : Technology & Engineering |
ISBN | : 3319266519 |
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
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Release | : 1976 |
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Publisher | : Academic Press |
Total Pages | : 562 |
Release | : 2008-10-22 |
Genre | : Science |
ISBN | : 008088816X |
This volume demonstrates how cellular and associated electron microscopy contributes to knowledge about biological structural information, primarily at the nanometer level. It presents how EM approaches complement both conventional structural biology (at the high end, angstrom level of resolution) and digital light microscopy (at the low end, 100-200 nanometers). Basic techniques in transmission and scanning electron microscopy Detailed chapters on how to use electron microscopy when dealing with specific cellular structures, such as the nucleus, cell membrane, and cytoskeleton Discussion on electron microscopy of viruses and virus-cell interactions
Author | : David B. Williams |
Publisher | : Springer Science & Business Media |
Total Pages | : 708 |
Release | : 2013-03-09 |
Genre | : Science |
ISBN | : 1475725191 |
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Author | : William J. Croft |
Publisher | : World Scientific |
Total Pages | : 153 |
Release | : 2006 |
Genre | : Science |
ISBN | : 9812774904 |
This is a brief history of the development of microscopy, from the use of beads and water droplets in ancient Greece, through the simple magnifying glass, to the modern compound microscope. The technology and optical theory are developed in a straightforward manner, and this leads to a description and explanation of the most modern technologies in electron microscopy, and scanning electron microscopy as well as the new scanning probe microscopies. A series of very interesting applications of the various microscopic techniques are described. The most recent pioneering techniques in near field and confocal optical microscope technologies are described and evaluated for their future importance.
Author | : Ray Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 224 |
Release | : 2011-02-11 |
Genre | : Technology & Engineering |
ISBN | : 9780387258003 |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.